| Nanoceria: factors affecting its pro-and anti-oxidant properties E Grulke, K Reed, M Beck, X Huang, A Cormack, S Seal Environmental Science: Nano 1 (5), 429-444, 2014 | 190 | 2014 |
| Dehydrogenation of defects and hot-electron degradation in GaN high-electron-mobility transistors YS Puzyrev, T Roy, M Beck, BR Tuttle, RD Schrimpf, DM Fleetwood, ... Journal of Applied Physics 109 (3), 2011 | 173 | 2011 |
| Origin of Colossal Ionic Conductivity in Oxide Multilayers:<? format?> Interface Induced Sublattice Disorder TJ Pennycook, MJ Beck, K Varga, M Varela, SJ Pennycook, ST Pantelides Physical review letters 104 (11), 115901, 2010 | 156 | 2010 |
| Key role of the wetting layer in revealing the hidden path of Ge/Si (001) Stranski-Krastanow growth onset M Brehm, F Montalenti, M Grydlik, G Vastola, H Lichtenberger, N Hrauda, ... Physical Review B—Condensed Matter and Materials Physics 80 (20), 205321, 2009 | 120 | 2009 |
| Frontiers in thermionic cathode research DM Kirkwood, SJ Gross, TJ Balk, MJ Beck, J Booske, D Busbaher, ... IEEE Transactions on Electron Devices 65 (6), 2061-2071, 2018 | 112 | 2018 |
| Role of Strain-Dependent Surface Energies in Island Formation OE Shklyaev, MJ Beck, M Asta, MJ Miksis, PW Voorhees Physical review letters 94 (17), 176102, 2005 | 104 | 2005 |
| Diffusivity control in molecule-on-metal systems using electric fields N Jiang, YY Zhang, Q Liu, ZH Cheng, ZT Deng, SX Du, HJ Gao, MJ Beck, ... Nano letters 10 (4), 1184-1188, 2010 | 85 | 2010 |
| Effects of stress on lithium transport in amorphous silicon electrodes for lithium-ion batteries J Pan, Q Zhang, J Li, MJ Beck, X Xiao, YT Cheng Nano Energy 13, 192-199, 2015 | 82 | 2015 |
| Surface energetics and structure of the Ge wetting layer on Si (100) MJ Beck, A Van de Walle, M Asta Physical Review B—Condensed Matter and Materials Physics 70 (20), 205337, 2004 | 82 | 2004 |
| Scandate cathode surface characterization: Emission testing, elemental analysis and morphological evaluation X Liu, Q Zhou, TL Maxwell, BK Vancil, MJ Beck, TJ Balk Materials Characterization 148, 188-200, 2019 | 57 | 2019 |
| The characterization of purified citrate-coated cerium oxide nanoparticles prepared via hydrothermal synthesis ML Hancock, RA Yokel, MJ Beck, JL Calahan, TW Jarrells, EJ Munson, ... Applied Surface Science 535, 147681, 2021 | 53 | 2021 |
| Formation of Ge Nanoripples on Vicinal Si (1110): From Stranski-Krastanow Seeds<? format?> to a Perfectly Faceted Wetting Layer G Chen, B Sanduijav, D Matei, G Springholz, D Scopece, MJ Beck, ... Physical review letters 108 (5), 055503, 2012 | 50 | 2012 |
| BaxScyOz on W (0 0 1),(1 1 0), and (1 1 2) in scandate cathodes: Connecting to experiment via μO and equilibrium crystal shape Q Zhou, X Liu, T Maxwell, B Vancil, TJ Balk, MJ Beck Applied Surface Science 458, 827-838, 2018 | 46 | 2018 |
| Impact of proton irradiation-induced bulk defects on gate-lag in GaN HEMTs A Kalavagunta, M Silvestri, MJ Beck, SK Dixit, RD Schrimpf, RA Reed, ... IEEE Transactions on Nuclear Science 56 (6), 3192-3195, 2009 | 45 | 2009 |
| Atomic displacement effects in single-event gate rupture MJ Beck, BR Tuttle, RD Schrimpf, DM Fleetwood, ST Pantelides IEEE Transactions on Nuclear Science 55 (6), 3025-3031, 2009 | 39 | 2009 |
| Dynamical effects in the interaction of ion beams with solids R Hatcher, M Beck, A Tackett, ST Pantelides Physical review letters 100 (10), 103201, 2008 | 38 | 2008 |
| Performance, reliability, radiation effects, and aging issues in microelectronics–From atomic-scale physics to engineering-level modeling ST Pantelides, L Tsetseris, MJ Beck, SN Rashkeev, G Hadjisavvas, ... Solid-State Electronics 54 (9), 841-848, 2010 | 35 | 2010 |
| Stability of Ge on Si (1 1 10) surfaces and the role of dimer tilting D Scopece, F Montalenti, MJ Beck Physical Review B—Condensed Matter and Materials Physics 85 (8), 085312, 2012 | 33 | 2012 |
| Toward tuning the surface functionalization of small ceria nanoparticles X Huang, B Wang, EA Grulke, MJ Beck The Journal of Chemical Physics 140 (7), 2014 | 30 | 2014 |
| The role of atomic displacements in ion-induced dielectric breakdown MJ Beck, YS Puzyrev, N Sergueev, K Varga, RD Schrimpf, DM Fleetwood, ... IEEE Transactions on Nuclear Science 56 (6), 3210-3217, 2009 | 30 | 2009 |
