| Cones formed during sputtering of InP and their use in defining AFM tip shapes MP Seah, SJ Spencer, PJ Cumpson, JE Johnstone Applied surface science 144, 151-155, 1999 | 35 | 1999 |
| A multidisciplinary approach to the identification of reference materials for engineered nanoparticle toxicology RJ Aitken, SM Hankin, C Lang Tran, K Donaldson, V Stone, P Cumpson, ... Nanotoxicology 2 (2), 71-78, 2008 | 33 | 2008 |
| Cantilever spring-constant calibration in atomic force microscopy PJ Cumpson, CA Clifford, JF Portoles, JE Johnstone, M Munz Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques …, 2008 | 29 | 2008 |
| Quantification issues in ToF‐SSIMS and AFM co‐analysis in two‐phase systems, exampled by a polymer blend IS Gilmore, MP Seah, JE Johnstone Surface and Interface Analysis: An International Journal devoted to the …, 2003 | 27 | 2003 |
| REFNANO: Reference materials for engineered nanoparticle toxicology and metrology RJ Aitken, SM Hankin, CL Tran, K Donaldson, V Stone, P Cumpson, ... IOM, Final Report on Project CB01099 30, 589-596, 2007 | 23 | 2007 |
| Sputter‐induced cone and filament formation on InP and AFM tip shape determination MP Seah, SJ Spencer, PJ Cumpson, JE Johnstone Surface and Interface Analysis: An International Journal devoted to the …, 2000 | 15 | 2000 |
| Depth resolution in sputter depth profiling–characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS MP Seah, SJ Spencer, IS Gilmore, JE Johnstone Surface and Interface Analysis: An International Journal devoted to the …, 2000 | 14 | 2000 |
| Applied Scanning Probe Methods VIII PJ Cumpson, CA Clifford, JF Portoles, JE Johnstone, M Munz, B Bhushan, ... Springer, 2008 | 11 | 2008 |
| Characterisation of surface roughness of fibres by atomic force microscopy. S Maudgal, GD Sims, JE Johnstone, NM Jennett | 7 | 1998 |
| United Kingdom profile in nanotechnologies. J Johnstone ISO Focus 4 (4), 53-54, 2007 | | 2007 |
| Preparation and characterisation of novel fluorinated surfaces JE Johnstone | | 2005 |
| Report on: force repeatability in imaging forces and force vs distance spectroscopy using an atomic force microscope (AFM). J Johnstone, C Clifford | | 2003 |
| Tutorial Review-Depth resolution in sputter depth profiling--Characterisation of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS MP Seah, SJ Spencer, IS Gilmore, JE Johnstone Surface and Interface Analysis 29 (1), 73-81, 2000 | | 2000 |
Peter CumpsonProfessor, University of New South WalesVerified email at unsw.edu.au
