| Intelligent gate drivers for future power converters J Henn, C Lüdecke, M Laumen, S Beushausen, S Kalker, ... IEEE Transactions on Power Electronics 37 (3), 3484-3503, 2021 | 116 | 2021 |
| Research on active thermal control: Actual status and future trends J Kuprat, CH van der Broeck, M Andresen, S Kalker, M Liserre, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 9 (6 …, 2021 | 103 | 2021 |
| Reviewing thermal-monitoring techniques for smart power modules S Kalker, LA Ruppert, CH Van Der Broeck, J Kuprat, M Andresen, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 10 (2 …, 2021 | 90 | 2021 |
| In-situ thermal impedance spectroscopy of power electronic modules for localized degradation identification CH van der Broeck, S Kalker, TA Polom, RD Lorenz, RW De Doncker PCIM Europe 2019; International Exhibition and Conference for Power …, 2019 | 36 | 2019 |
| Online junction-temperature sensing of SiC MOSFETs with minimal calibration effort S Kalker, CH van der Broeck, RW De Doncker PCIM Europe digital days 2020; International Exhibition and Conference for …, 2020 | 33 | 2020 |
| Next Generation Monitoring of SiC mosfets Via Spectral Electroluminescence Sensing S Kalker, CH van der Broeck, LA Ruppert, RW De Doncker IEEE Transactions on Industry Applications 57 (3), 2746-2757, 2021 | 32 | 2021 |
| Utilizing electroluminescence of SiC MOSFETs for unified junction-temperature and current sensing S Kalker, CH van der Broeck, RW De Doncker 2020 IEEE Applied Power Electronics Conference and Exposition (APEC), 1098-1105, 2020 | 30 | 2020 |
| Intelligent monitoring and maintenance technology for next-generation power electronic systems CH Van Der Broeck, S Kalker, RW De Doncker IEEE Journal of Emerging and Selected Topics in Power Electronics 11 (4 …, 2021 | 27 | 2021 |
| Junction-temperature sensing of paralleled sic mosfets utilizing temperature sensitive optical parameters LA Ruppert, S Kalker, RW De Doncker 2021 IEEE Energy Conversion Congress and Exposition (ECCE), 5597-5604, 2021 | 19 | 2021 |
| Self-calibrating loss models for real-time monitoring of power modules based on artificial neural networks S Kalker, D Meier, CH van der Broeck, RW De Doncker 2022 IEEE Energy Conversion Congress and Exposition (ECCE), 1-8, 2022 | 14 | 2022 |
| Analyzing spectral electroluminescence sensitivities of SiC MOSFETs and their impact on power device monitoring LA Ruppert, S Kalker, CH van der Broeck, RW De Doncker PCIM Europe digital days 2021; International Exhibition and Conference for …, 2021 | 14 | 2021 |
| Online junction-temperature extraction method for SiC MOSFETs utilizing turn-on delay S Kalker, CH Van Der Broeck, RW De Doncker 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2021 | 10 | 2021 |
| Diagnosing degradation in power modules using phase delay changes of electrical response I Austrup, CH van der Broeck, TB Albert, S Kalker, RW De Doncker 2022 IEEE 7th Southern Power Electronics Conference (SPEC), 1-6, 2022 | 9 | 2022 |
| Figures-of-merit study for thermal transient measurement of SiC MOSFETs Y Zhang, Y Zhang, VH Wong, S Kalker, A Caruso, L Ruppert, F Iannuzzo, ... IEEE Transactions on Power Electronics 39 (9), 11583-11595, 2024 | 8 | 2024 |
| A Sparsity-Promoting Time Domain Evaluation Method for Thermal Transient Measurement of Power Semiconductors Y Zhang, A Evgrafov, S Zhao, S Kalker, RW De Doncker IEEE Transactions on Power Electronics 39 (6), 7525-7535, 2024 | 7 | 2024 |
| Fast-charging technologies, topologies and standards S Kalker, B Mortimer, B Schäfer, I Schoeneberger, M Stieneke, ... E. ON Energy Research Center, RWTH Aachen University, 2018 | 6 | 2018 |
| Utilizing electroluminescence of silicon IGBTs for junction temperature sensing LA Ruppert, B Wirsen, S Kalker, RW De Doncker 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE …, 2023 | 4 | 2023 |
| Diagnosing Thermal-Interface Aging of Power Devices Using Self-Sensing I Austrup, CH van der Broeck, S Kalker, TB Albert, F Janoth, ... IEEE Transactions on Power Electronics, 2024 | 3 | 2024 |
| Degradation diagnosis during active power cycling via frequency-domain thermal impedance spectroscopy S Kalker, J Holz, I Austrup, RW De Doncker 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE …, 2023 | 3 | 2023 |
| Sensitivity Analysis Method of Temperature-Dependent Parameters During Turn-on Process of SiC Power MOSFETs NN Do, S Kalker, I Austrup, HJ Chiu, RW De Doncker 2022 IEEE 7th Southern Power Electronics Conference (SPEC), 1-6, 2022 | 3 | 2022 |
