| Femtosecond control of electric currents in metallic ferromagnetic heterostructures TJ Huisman, RV Mikhaylovskiy, JD Costa, F Freimuth, E Paz, J Ventura, ... Nature nanotechnology 11 (5), 455-458, 2016 | 292 | 2016 |
| Focusing light through random photonic media by binary amplitude modulation D Akbulut, TJ Huisman, EG van Putten, WL Vos, AP Mosk Optics express 19 (5), 4017-4029, 2011 | 268 | 2011 |
| Terahertz Magnon-Polaritons in TmFeO3 K Grishunin, T Huisman, G Li, E Mishina, T Rasing, AV Kimel, K Zhang, ... ACS photonics 5 (4), 1375-1380, 2018 | 93 | 2018 |
| Simultaneous measurements of terahertz emission and magneto-optical Kerr effect for resolving ultrafast laser-induced demagnetization dynamics TJ Huisman, RV Mikhaylovskiy, A Tsukamoto, T Rasing, AV Kimel Physical Review B 92 (10), 104419, 2015 | 78 | 2015 |
| Resonant Pumping of Crystal Field Electronic Transitions as a Mechanism of Ultrafast Optical Control of the Exchange Interactions in Iron Oxides RV Mikhaylovskiy, TJ Huisman, VA Gavrichkov, SI Polukeev, ... Physical review letters 125 (15), 157201, 2020 | 64 | 2020 |
| Spin-photo-currents generated by femtosecond laser pulses in a ferrimagnetic GdFeCo/Pt bilayer TJ Huisman, C Ciccarelli, A Tsukamoto, RV Mikhaylovskiy, T Rasing, ... Applied physics letters 110 (7), 2017 | 63 | 2017 |
| Programmable multiport optical circuits in opaque scattering materials SR Huisman, TJ Huisman, TAW Wolterink, AP Mosk, PWH Pinkse Optics express 23 (3), 3102-3116, 2015 | 58 | 2015 |
| Terahertz magnetization dynamics induced by femtosecond resonant pumping of subsystem in the multisublattice antiferromagnet RV Mikhaylovskiy, TJ Huisman, AI Popov, AK Zvezdin, T Rasing, ... Physical Review B 92 (9), 094437, 2015 | 47 | 2015 |
| THz emission spectroscopy for THz spintronics TJ Huisman, T Rasing Journal of the Physical Society of Japan 86 (1), 011009, 2017 | 44 | 2017 |
| Selective Excitation of Terahertz Magnetic and Electric Dipoles in Ions by Femtosecond Laser Pulses in RV Mikhaylovskiy, TJ Huisman, RV Pisarev, T Rasing, AV Kimel Physical review letters 118 (1), 017205, 2017 | 42 | 2017 |
| Programming balanced optical beam splitters in white paint SR Huisman, TJ Huisman, SA Goorden, AP Mosk, PWH Pinkse Optics express 22 (7), 8320-8332, 2014 | 39 | 2014 |
| Controlling single-photon Fock-state propagation through opaque scattering media TJ Huisman, SR Huisman, AP Mosk, PWH Pinkse Applied Physics B 116 (3), 603-607, 2014 | 33 | 2014 |
| Terahertz magneto-optics in the ferromagnetic semiconductor HgCdCr2Se4 TJ Huisman, RV Mikhaylovskiy, AV Telegin, YP Sukhorukov, ... Applied Physics Letters 106 (13), 2015 | 32 | 2015 |
| Sub-100-ps dynamics of the anomalous Hall effect at terahertz frequencies TJ Huisman, RV Mikhaylovskiy, T Rasing, AV Kimel, A Tsukamoto, ... Physical Review B 95 (9), 094418, 2017 | 27 | 2017 |
| Depth estimation from a single SEM image using pixel-wise fine-tuning with multimodal data T Houben, T Huisman, M Pisarenco, F Van Der Sommen, PHN de With Machine Vision and Applications 33 (4), 56, 2022 | 25 | 2022 |
| Terahertz dynamics of spins and charges in multilayers JD Costa, TJ Huisman, RV Mikhaylovskiy, I Razdolski, J Ventura, ... Physical Review B 91 (10), 104407, 2015 | 18 | 2015 |
| Training procedure for scanning electron microscope 3D surface reconstruction using unsupervised domain adaptation with simulated data T Houben, T Huisman, M Pisarenco, F Van Der Sommen, P de With Journal of Micro/Nanopatterning, Materials, and Metrology 22 (3), 031208-031208, 2023 | 12 | 2023 |
| Sem image enhancement methods and systems W Fang, L Pu, TJ Huisman, EP SMAKMAN US Patent App. 16/508,087, 2020 | 12 | 2020 |
| Analyze line roughness sources using power spectral density (PSD) L Pu, T Wang, TJ Huisman, R Maas, M Goosen, H Dillen, P Leray, W Fang Metrology, Inspection, and Process Control for Microlithography XXXIII 10959 …, 2019 | 9 | 2019 |
| Understanding the influence of three-dimensional sidewall roughness on observed line-edge roughness in scanning electron microscopy images L Van Kessel, T Huisman, CW Hagen Journal of Micro/Nanolithography, MEMS, and MOEMS 19 (3), 034002-034002, 2020 | 7 | 2020 |
