| Virtual execution platforms for mixed-time-criticality systems: The compsoc architecture and design flow K Goossens, A Azevedo, K Chandrasekar, MD Gomony, S Goossens, ... ACM SIGBED Review 10 (3), 23-34, 2013 | 118 | 2013 |
| Process-variation-aware mapping of best-effort and real-time streaming applications to MPSoCs D Mirzoyan, B Akesson, K Goossens ACM Transactions on Embedded Computing Systems (TECS) 13 (2s), 1-24, 2014 | 15 | 2014 |
| Process-variation aware mapping of real-time streaming applications to MPSoCs for improved yield D Mirzoyan, B Akesson, K Goossens Thirteenth International Symposium on Quality Electronic Design (ISQED), 41-48, 2012 | 14 | 2012 |
| Embedded computer architecture laboratory: A hands-on experience programming embedded systems with resource and energy constraints A Nelson, A Molnos, AB Nejad, D Mirzoyan, S Cotofana, K Goossens Proceedings of the Workshop on Embedded and Cyber-Physical Systems Education …, 2012 | 5 | 2012 |
| Virtual execution platforms for mixed-time-criticality applications: the CompSoC architecture and design flow KGW Goossens, A Azevedo, K Chandrasekar, MD Gomony, ... conference; CRTS 2012; 2012-12-04; 2012-12-04, 23-30, 2012 | 5 | 2012 |
| A new process variation monitoring circuit D Mirzoyan, A Khachatryan 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 1-5, 2016 | 4 | 2016 |
| Throughput analysis and voltage-frequency island partitioning for streaming applications under process variation D Mirzoyan, S Stuijk, B Akesson, K Goossens The 11th IEEE Symposium on Embedded Systems for Real-time Multimedia, 1-10, 2013 | 3 | 2013 |
| A process variation detection method V Melikyan, D Mirzoyan, G Petrosyan 2010 East-West Design & Test Symposium (EWDTS), 30-33, 2010 | 3 | 2010 |
| A novel approach to detect temperature variation A Khachatryan, D Mirzoyan 2016 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2016 | 2 | 2016 |
| A Novel approach for process variation detection D Mirzoyan, A Khachatryan, V Melikyan 2016 IEEE 36th International Conference on Electronics and Nanotechnology …, 2016 | 2 | 2016 |
| A novel process corner detection circuit D Mirzoyan, A Khachatryan 2016 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2016 | 1 | 2016 |
| Better than Worst-Case Design for Streaming Applications under Process Variation D Mirzoyan | 1 | 2013 |
| On chip resistance value compensation technique for termination resistor V Melikyan, A Khachatryan, D Mirzoyan 2016 IEEE 36th International Conference on Electronics and Nanotechnology …, 2016 | | 2016 |
| PROCEEDINGS OF IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, ISVLSI D Mirzoyan, A Khachatryan, HT Shen, F Rahman, B Shakya, ... | | 2016 |
| A reconfigurable mixed-time-criticality SDRAM controller SLM Goossens | | 2015 |
| Maximizing the number of good dies for streaming applications in NoC-based MPSoCs under process variation D Mirzoyan, B Akesson, S Stuijk, K Goossens ACM Transactions on Embedded Computing Systems (TECS) 14 (4), 1-26, 2015 | | 2015 |
| Impact of application quality parameters on the application throughput and output quality in MPSoCs D Mirzoyan, KB Akesson, KGW Goossens Annual Workshop on PROGram for Research on Embedded Sysems & Software …, 2011 | | 2011 |
| Stable current and voltage generation under process variation V Melikyan, S Karapetyan, D Mirzoyan, E Babayan 2010 East-West Design & Test Symposium (EWDTS), 40-42, 2010 | | 2010 |
| Impact of proces variations on the throughput of real-time applications in multiprocessor system-on-chip. D Mirzoyan, KB Akesson, KGW Goossens Annual Workshop on PROGram for Research on Embedded Systems & Software …, 2010 | | 2010 |
| Алгоритм определения размеров транзисторов, базируемый на статистическом статическом временном анализe ВШ Меликян, ДЛ Мирзоян, ГА Петросян, ВК Агаронян Проблемы разработки перспективных микро-и наноэлектронных систем (МЭС), 114-119, 2010 | | 2010 |
