| Dynamics of annular bright field imaging in scanning transmission electron microscopy SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, Y Ikuhara Ultramicroscopy 110 (7), 903-923, 2010 | 549 | 2010 |
| Differential phase-contrast microscopy at atomic resolution N Shibata, SD Findlay, Y Kohno, H Sawada, Y Kondo, Y Ikuhara Nature Physics 8 (8), 611-615, 2012 | 533 | 2012 |
| Quantitative atomic resolution scanning transmission electron microscopy JM LeBeau, SD Findlay, LJ Allen, S Stemmer Physical Review Letters 100 (20), 206101, 2008 | 475 | 2008 |
| Robust atomic resolution imaging of light elements using scanning transmission electron microscopy SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, T Yamamoto, ... Applied Physics Letters 95 (19), 2009 | 439 | 2009 |
| Spectroscopic imaging of single atoms within a bulk solid M Varela, SD Findlay, AR Lupini, HM Christen, AY Borisevich, N Dellby, ... Physical Review Letters 92 (9), 095502, 2004 | 414 | 2004 |
| Two-dimensional mapping of chemical information at atomic resolution M Bosman, VJ Keast, JL García-Muñoz, AJ D’Alfonso, SD Findlay, ... Physical Review Letters 99 (8), 086102, 2007 | 319 | 2007 |
| Three-dimensional imaging of individual hafnium atoms inside a semiconductor device K Van Benthem, AR Lupini, M Kim, HS Baik, SJ Doh, JH Lee, MP Oxley, ... Applied Physics Letters 87 (3), 2005 | 300 | 2005 |
| Position averaged convergent beam electron diffraction: Theory and applications JM LeBeau, SD Findlay, LJ Allen, S Stemmer Ultramicroscopy 110 (2), 118-125, 2010 | 290 | 2010 |
| Standardless atom counting in scanning transmission electron microscopy JM LeBeau, SD Findlay, LJ Allen, S Stemmer Nano letters 10 (11), 4405-4408, 2010 | 273 | 2010 |
| Modelling the inelastic scattering of fast electrons LJ Allen, SD Findlay Ultramicroscopy 151, 11-22, 2015 | 271 | 2015 |
| Atomic Structure of a CeO2 Grain Boundary: The Role of Oxygen Vacancies H Hojo, T Mizoguchi, H Ohta, SD Findlay, N Shibata, T Yamamoto, ... Nano letters 10 (11), 4668-4672, 2010 | 250 | 2010 |
| Lattice-resolution contrast from a focused coherent electron probe. Part I LJ Allen, SD Findlay, MP Oxley, CJ Rossouw Ultramicroscopy 96 (1), 47-63, 2003 | 247 | 2003 |
| Electric field imaging of single atoms N Shibata, T Seki, G Sánchez-Santolino, SD Findlay, Y Kohno, ... Nature communications 8 (1), 15631, 2017 | 217 | 2017 |
| Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation BD Forbes, AV Martin, SD Findlay, AJ D’Alfonso, LJ Allen Physical Review B—Condensed Matter and Materials Physics 82 (10), 104103, 2010 | 187 | 2010 |
| Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons R Close, Z Chen, N Shibata, SD Findlay Ultramicroscopy 159, 124-137, 2015 | 183 | 2015 |
| New area detector for atomic-resolution scanning transmission electron microscopy N Shibata, Y Kohno, SD Findlay, H Sawada, Y Kondo, Y Ikuhara Journal of electron microscopy 59 (6), 473-479, 2010 | 179 | 2010 |
| Oxygen-vacancy ordering at surfaces of lithium manganese (III, IV) oxide spinel nanoparticles R Huang, YH Ikuhara, T Mizoguchi, SD Findlay, A Kuwabara, CAJ Fisher, ... Angewandte Chemie-International Edition 50 (13), 3053-3057, 2011 | 175 | 2011 |
| Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy N Shibata, SD Findlay, H Sasaki, T Matsumoto, H Sawada, Y Kohno, ... Scientific reports 5 (1), 10040, 2015 | 174 | 2015 |
| Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy K van Benthem, AR Lupini, MP Oxley, SD Findlay, LJ Allen, ... Ultramicroscopy 106 (11-12), 1062-1068, 2006 | 165 | 2006 |
| Atomic-scale imaging of individual dopant atoms in a buried interface N Shibata, SD Findlay, S Azuma, T Mizoguchi, T Yamamoto, Y Ikuhara Nature Materials 8 (8), 654-658, 2009 | 163 | 2009 |
Naoya ShibataThe University of TokyoVerified email at sigma.t.u-tokyo.ac.jp
