| A survey of wide bandgap power semiconductor devices J Millan, P Godignon, X Perpiñà, A Pérez-Tomás, J Rebollo IEEE transactions on Power Electronics 29 (5), 2155-2163, 2013 | 3107 | 2013 |
| Gate oxide degradation of SiC MOSFET in switching conditions R Ouaida, M Berthou, J León, X Perpina, S Oge, P Brosselard, C Joubert IEEE Electron Device Letters 35 (12), 1284-1286, 2014 | 173 | 2014 |
| Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current X Perpiñà, JF Serviere, J Saiz, D Barlini, M Mermet-Guyennet, J Millan Microelectronics Reliability 46 (9-11), 1834-1839, 2006 | 132 | 2006 |
| Thermomechanical assessment of die-attach materials for wide bandgap semiconductor devices and harsh environment applications LA Navarro, X Perpina, P Godignon, J Montserrat, V Banu, M Vellvehi, ... IEEE transactions on Power Electronics 29 (5), 2261-2271, 2013 | 128 | 2013 |
| SiC Schottky diodes for harsh environment space applications P Godignon, X Jorda, M Vellvehi, X Perpina, V Banu, D Lopez, J Barbero, ... IEEE Transactions on Industrial Electronics 58 (7), 2582-2590, 2010 | 127 | 2010 |
| Short-circuit study in medium-voltage GaN cascodes, p-GaN HEMTs, and GaN MISHEMTs M Fernández, X Perpina, J Roig-Guitart, M Vellvehi, F Bauwens, M Tack, ... IEEE Transactions on Industrial Electronics 64 (11), 9012-9022, 2017 | 108 | 2017 |
| Reliability and safety in railway X Perpinya BoD–Books on Demand, 2012 | 87 | 2012 |
| Origin of large negative electrocaloric effect in antiferroelectric P Vales-Castro, R Faye, M Vellvehi, Y Nouchokgwe, X Perpiñà, ... Physical Review B 103 (5), 054112, 2021 | 82 | 2021 |
| Irradiance-based emissivity correction in infrared thermography for electronic applications M Vellvehi, X Perpiñà, GL Lauro, F Perillo, X Jordà Review of scientific instruments 82 (11), 2011 | 78 | 2011 |
| Long-term reliability of railway power inverters cooled by heat-pipe-based systems X Perpina, X Jorda, M Vellvehi, J Rebollo, M Mermet-Guyennet IEEE transactions on industrial electronics 58 (7), 2662-2672, 2010 | 71 | 2010 |
| P-GaN HEMTs drain and gate current analysis under short-circuit M Fernández, X Perpiñà, J Roig, M Vellvehi, F Bauwens, X Jordà, M Tack IEEE Electron Device Letters 38 (4), 505-508, 2017 | 68 | 2017 |
| Analysis of clamped inductive turnoff failure in railway traction IGBT power modules under overload conditions X Perpina, JF Serviere, J Urresti-Ibanez, I Cortes, X Jorda, S Hidalgo, ... IEEE Transactions on Industrial Electronics 58 (7), 2706-2714, 2010 | 62 | 2010 |
| GaN metal-oxide-semiconductor field-effect transistor inversion channel mobility modeling A Pérez-Tomás, M Placidi, X Perpiñà, A Constant, P Godignon, X Jordà, ... Journal of Applied Physics 105 (11), 2009 | 59 | 2009 |
| IGBT module failure analysis in railway applications X Perpina, JF Serviere, X Jordà, A Fauquet, S Hidalgo, J Urresti-Ibañez, ... Microelectronics Reliability 48 (8-9), 1427-1431, 2008 | 47 | 2008 |
| CPT1C in the ventromedial nucleus of the hypothalamus is necessary for brown fat thermogenesis activation in obesity R Rodríguez-Rodríguez, C Miralpeix, A Fosch, M Pozo, ... Molecular metabolism 19, 75-85, 2019 | 45 | 2019 |
| Gaming simulations for railways: Lessons learned from modeling six games for the Dutch infrastructure management SA Meijer, X Perpinya Infrastructure design, signaling and security in railway, 275-294, 2012 | 44 | 2012 |
| Revisiting power cycling test for better life-time prediction in traction M Mermet-Guyennet, X Perpina, M Piton Microelectronics Reliability 47 (9-11), 1690-1695, 2007 | 41 | 2007 |
| Train braking C Cruceanu, X Perpinya Reliability and safety in railway, 29-74, 2012 | 40 | 2012 |
| Thermal resistance investigations on new leadframe-based LED packages and boards B Pardo, A Gasse, A Fargeix, J Jakovenko, RJ Werkhoven, X Perpiñà, ... Microelectronics Reliability 53 (8), 1084-1094, 2013 | 36 | 2013 |
| Internal infrared laser deflection system: a tool for power device characterization X Perpiñà, X Jordà, N Mestres, M Vellvehi, P Godignon, J Millán, ... Measurement Science and Technology 15 (5), 1011, 2004 | 36 | 2004 |
Xavier JORDAResearch Scientist, IMB-CNM (CSIC)Verified email at imb-cnm.csic.es
