| Sub-Nanosecond Switching of Si:HfO2 Ferroelectric Field-Effect Transistor MM Dahan, H Mulaosmanovic, O Levit, S Dunkel, S Beyer, E Yalon Nano Letters 23 (4), 1395-1400, 2023 | 67 | 2023 |
| Reconfigurable low-voltage hexagonal boron nitride nonvolatile switches for millimeter-wave wireless communications SJ Yang, MM Dahan, O Levit, F Makal, P Peterson, J Alikpala, ... Nano Letters 23 (4), 1152-1158, 2023 | 32 | 2023 |
| C-AND: Mixed writing scheme for disturb reduction in 1T ferroelectric FET memory MM Dahan, ET Breyer, S Slesazeck, T Mikolajick, S Kvatinsky IEEE Transactions on Circuits and Systems I: Regular Papers 69 (4), 1595-1605, 2022 | 14 | 2022 |
| Crystallization dynamics probed by transient resistance in phase change memory cells E Ordan, RG Nir-Harwood, MM Dahan, Y Keller, E Yalon Journal of Applied Physics 135 (20), 2024 | 3 | 2024 |
| Ionic–electronic dynamics in an electrochemical gate stack toward high-speed artificial synapses O Levit, E Ber, MM Dahan, Y Keller, E Yalon Applied Physics Letters 123 (21), 2023 | 2 | 2023 |
| Reconfigurable Time-Domain In-Memory Computing Marco using CAM FeFET with Multilevel Delay Calibration in 28 nm CMOS J Mattar, MM Dahan, S Dunkel, H Mulaosmanovic, S Beyer, E Yalon, ... arXiv preprint arXiv:2504.03925, 2025 | 1 | 2025 |
| Impact of Charge Trapping and Ferroelectric Polarization on the Memory Window in HfOx FeFETs Probed by Dynamic Measurements G Zilberman, MM Dahan, H Mulaosmanovic, S Dünkel, S Beyer, E Yalon 2025 Device Research Conference (DRC), 1-2, 2025 | | 2025 |
| Novel Ultrafast Non-Destructive Readout of FeRAM by Low-Voltage Transient Current MM Dahan, E Ber, F Wunderwald, G Zilberman, G Orlev, Y Keller, ... 2025 IEEE International Memory Workshop (IMW), 1-4, 2025 | | 2025 |
| Origin of charges in bulk Si: HfO2 FeFET probed by nanosecond polarization measurements MM Dahan, H Mulaosmanovic, O Levit, S Dünkel, J Mueller, S Beyer, ... Microelectronic Engineering 296, 112284, 2025 | | 2025 |
| Exploring Charge Trapping Dynamics in Si: HfO₂-FeFETs by Temperature-Dependent Electrical Characterization MM Dahan, E Ber, O Levit, H Mulaosmanovic, S Dünkel, J Müller, S Beyer, ... 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
| Antonelli, Maximiliano A Aymonino, DC Balderas, L Barboni, M Barezzi, M Bender Machado, ... | | |
Eilam YalonTechnion, Israel Institute of TechnologyVerified email at technion.ac.il
