| Deep machine learning-a new frontier in artificial intelligence research [research frontier] I Arel, DC Rose, TP Karnowski IEEE computational intelligence magazine 5 (4), 13-18, 2010 | 1930 | 2010 |
| Optimizing deep learning hyper-parameters through an evolutionary algorithm SR Young, DC Rose, TP Karnowski, SH Lim, RM Patton Proceedings of the workshop on machine learning in high-performance …, 2015 | 607 | 2015 |
| Exudate-based diabetic macular edema detection in fundus images using publicly available datasets L Giancardo, F Meriaudeau, TP Karnowski, Y Li, S Garg, KW Tobin Jr, ... Medical image analysis 16 (1), 216-226, 2012 | 442 | 2012 |
| Detection of anatomic structures in human retinal imagery KW Tobin, E Chaum, VP Govindasamy, TP Karnowski IEEE transactions on medical imaging 26 (12), 1729-1739, 2007 | 307 | 2007 |
| Validating retinal fundus image analysis algorithms: issues and a proposal E Trucco, A Ruggeri, T Karnowski, L Giancardo, E Chaum, ... Investigative ophthalmology & visual science 54 (5), 3546-3559, 2013 | 219 | 2013 |
| Method for indexing and retrieving manufacturing-specific digital imagery based on image content RK Ferrell, TP Karnowski, KW Tobin Jr US Patent 6,751,343, 2004 | 200 | 2004 |
| Automated detection of microaneurysms using scale-adapted blob analysis and semi-supervised learning KM Adal, D Sidibé, S Ali, E Chaum, TP Karnowski, F Mériaudeau Computer methods and programs in biomedicine 114 (1), 1-10, 2014 | 163 | 2014 |
| Automatic retina exudates segmentation without a manually labelled training set L Giancardo, F Meriaudeau, TP Karnowski, Y Li, KW Tobin, E Chaum 2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro …, 2011 | 107 | 2011 |
| Automated diagnosis of retinopathy by content-based image retrieval E Chaum, TP Karnowski, VP Govindasamy, M Abdelrahman, KW Tobin Retina 28 (10), 1463-1477, 2008 | 97 | 2008 |
| Microaneurysm detection with radon transform-based classification on retina images L Giancardo, F Meriaudeau, TP Karnowski, Y Li, KW Tobin, E Chaum 2011 Annual international conference of the ieee engineering in medicine and …, 2011 | 96 | 2011 |
| Elliptical local vessel density: a fast and robust quality metric for retinal images L Giancardo, MD Abràmoff, E Chaum, TP Karnowski, F Meriaudeau, ... 2008 30th Annual International Conference of the IEEE Engineering in …, 2008 | 94 | 2008 |
| A fast and stable incremental clustering algorithm S Young, I Arel, TP Karnowski, D Rose 2010 Seventh International Conference on Information Technology: New …, 2010 | 83 | 2010 |
| The relationship between driving volatility in time to collision and crash-injury severity in a naturalistic driving environment B Wali, AJ Khattak, T Karnowski Analytic methods in accident research 28, 100136, 2020 | 82 | 2020 |
| Automated defect spatial signature analysis for semiconductor manufacturing process KW Tobin Jr, SS Gleason, TP Karnowski, H Sari-Sarraf US Patent 5,982,920, 1999 | 80 | 1999 |
| Method for localizing and isolating an errant process step KW Tobin Jr, TP Karnowski, RK Ferrell US Patent 6,535,776, 2003 | 77 | 2003 |
| Statistical atlas based exudate segmentation S Ali, D Sidibé, KM Adal, L Giancardo, E Chaum, TP Karnowski, ... Computerized Medical Imaging and Graphics 37 (5-6), 358-368, 2013 | 75 | 2013 |
| Textureless macula swelling detection with multiple retinal fundus images L Giancardo, F Meriaudeau, TP Karnowski, KW Tobin, E Grisan, P Favaro, ... IEEE transactions on biomedical engineering 58 (3), 795-799, 2010 | 75 | 2010 |
| Microaneurysms detection with the radon cliff operator in retinal fundus images L Giancardo, F Mériaudeau, TP Karnowski, KW Tobin, Y Li, E Chaum Medical Imaging 2010: Image Processing 7623, 292-299, 2010 | 75 | 2010 |
| Exploring microscopic driving volatility in naturalistic driving environment prior to involvement in safety critical events—Concept of event-based driving volatility B Wali, AJ Khattak, T Karnowski Accident Analysis & Prevention 132, 105277, 2019 | 63 | 2019 |
| Automatic classification of spatial signatures on semiconductor wafer maps KW Tobin Jr, SS Gleason, TP Karnowski, SL Cohen, F Lakhani Metrology, Inspection, and Process Control for Microlithography XI 3050, 434-444, 1997 | 62 | 1997 |
KW TobinOak Ridge Associated UniversitiesVerified email at orau.org
