| Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model JM Dutertre, V Beroulle, P Candelier, S De Castro, LB Faber, ML Flottes, ... 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 1-6, 2018 | 89 | 2018 |
| Hardware Security Evaluation Platform for MCU-Based Connected Devices: Application to Healthcare IoT Z Kazemi, A Papadimitriou, D Hely, M Fazcli, V Beroulle 2018 IEEE 3rd International Verification and Security Workshop (IVSW), 87-92, 2018 | 40 | 2018 |
| A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks A Papadimitriou, D Hély, V Beroulle, P Maistri, R Leveugle 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014 | 39 | 2014 |
| The COCAE detector: An instrument for localization—Identification of radioactive sources CP Lambropoulos, T Aoki, J Crocco, E Dieguez, C Disch, A Fauler, ... IEEE Transactions on Nuclear Science 58 (5), 2363-2370, 2011 | 36 | 2011 |
| On a Low Cost Fault Injection Framework for Security Assessment of Cyber-Physical Systems: Clock Glitch Attacks Z Kazemi, A Papadimitriou, I Souvatzoglou, E Aerabi, MM Ahmed, D Hely, ... 2019 IEEE 4th International Verification and Security Workshop (IVSW), 7-12, 2019 | 34 | 2019 |
| On a Security-oriented Design Framework for Medical IoT Devices: The Hardware Security Perspective K Nomikos, A Papadimitriou, G Stergiopoulos, D Koutras, M Psarakis, ... 2020 23rd Euromicro Conference on Digital System Design (DSD), 301-308, 2020 | 32 | 2020 |
| Cross-layer analysis of software fault models and countermeasures against hardware fault attacks in a RISC-V processor J Laurent, V Beroulle, C Deleuze, F Pebay-Peyroula, A Papadimitriou Microprocessors and Microsystems 71, 102862, 2019 | 32 | 2019 |
| On the performance of non-profiled differential deep learning attacks against an aes encryption algorithm protected using a correlated noise generation based hiding countermeasure A Alipour, A Papadimitriou, V Beroulle, E Aerabi, D Hély 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 614-617, 2020 | 29 | 2020 |
| Laser-induced fault effects in security-dedicated circuits R Leveugle, P Maistri, P Vanhauwaert, F Lu, G Di Natale, ML Flottes, ... 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC …, 2014 | 26 | 2014 |
| Design Space Exploration for Ultra-Low-Energy and Secure IoT MCUs C Bresch, R Lysecky, E Aerabi, M Bohlouli, MHA Livany, M Fazeli, ... ACM Transactions on Embedded Computing Systems (TECS) 19 (3), 1-34, 2020 | 23 | 2020 |
| Design Space Exploration for Ultra-Low-Energy and Secure IoT MCUs E Aerabi, M Bohlouli, MHA Livany, M Fazeli, A Papadimitriou, D Hely ACM Transactions on Embedded Computing Systems (TECS) 19 (3), 1-34, 2020 | 23 | 2020 |
| On the Importance of Analysing Microarchitecture for Accurate Software Fault Models J Laurent, V Beroulle, C Deleuze, F Pebay-Peyroula, A Papadimitriou 2018 21st Euromicro Conference on Digital System Design (DSD), 561-564, 2018 | 18 | 2018 |
| You can detect but you cannot hide: Fault Assisted Side Channel Analysis on Protected Software-based Block Ciphers A Papadimitriou, K Nomikos, M Psarakis, E Aerabi, D Hely 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 16 | 2020 |
| Stack Redundancy to Thwart Return Oriented Programming in Embedded Systems D Hely, C Bresch, A Papadimitriou, A Michelet-Gignoux, L Amato, T Meyer | 15* | 2018 |
| Stack Redundancy to Thwart Return Oriented Programming in Embedded Systems C Bresch, D Hély, A Papadimitriou, A Michelet-Gignoux, L Amato, T Meyer IEEE Embedded Systems Letters 10 (3), 87-90, 2018 | 15 | 2018 |
| Validation of RTL laser fault injection model with respect to layout information A Papadimitriou, M Tampas, D Hély, V Beroulle, P Maistri, R Leveugle 2015 IEEE International Symposium on Hardware Oriented Security and Trust …, 2015 | 15 | 2015 |
| On error models for RTL security evaluations P Vanhauwaert, P Maistri, R Leveugle, A Papadimitriou, D Hély, ... 2014 9th IEEE International Conference on Design & Technology of Integrated …, 2014 | 15 | 2014 |
| Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS Bulk JM Dutertre, V Beroulle, P Candelier, S De Castro, LB Faber, ML Flottes, ... IEEE Transactions on Device and Materials Reliability 19 (1), 6-15, 2018 | 13 | 2018 |
| On a Side Channel and Fault Attack Concurrent Countermeasure Methodology for MCU-based Byte-sliced Cipher Implementations E Aerabi, A Papadimitriou, D Hely 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 11 | 2019 |
| Analysis of laser-induced errors: RTL fault models versus layout locality characteristics A Papadimitriou, D Hély, V Beroulle, P Maistri, R Leveugle Microprocessors and microsystems 47, 64-73, 2016 | 11 | 2016 |
