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Dr. B. Vandana
Dr. B. Vandana
Department of Electronics and Communication Engineering and Scholar@ Kalinga Institute of Industrial
Verified email at kgr.ac.in
Title
Cited by
Cited by
Year
Study of Floating Body Effect in SOI Technology
B Vandana
International Journal of Modern Engineering Research (IJMER) 3 (3), 1817-1824, 2013
472013
Inverted ‘T’junctionless FinFET (ITJL FinFET): performance estimation through device geometry variation
B Vandana, BS Patro, JK Das, BK Kaushik, SK Mohapatra
ECS Journal of Solid State Science and Technology 7 (4), Q52, 2018
142018
1 GHz high sensitivity differential current comparator for high speed ADC
BS Patro, S Biswas, I Roy, B Vandana
Journal of Digital Integrated Circuits in Electrical Devices 2 (1), 7-12, 2017
122017
Automatic movable road divider using Arduino UNO with Node Micro Controller Unit (MCU)
SSS Vastava, B Vandana, M Bhavana, R Gongati
Materials Today: Proceedings 80, 1842-1845, 2023
112023
Impact of channel engineering (si1-0.25 ge0. 25) technique on gm (transconductance) and its higher order derivatives of 3d conventional and wavy junctionless finfets (jlt)
B Vandana, JK Das, SK Mohapatra, SL Tripathi
Facta Universitatis, Series: Electronics and Energetics 31 (2), 257-265, 2018
112018
Channel thickness dependency of high-k gate dielectric based double-gate CMOS inverter
S Tayal, P Samrat, V Keerthi, B Vandana, S Gupta
International Journal of Nano Dimension 11 (3), 2020
102020
Memoryless nonlinearity in IT JL FinFET with spacer technology: Investigation towards reliability
B Vandana, SK Mohapatra, JK Das, KP Pradhan, A Kundu, BK Kaushik
Microelectronics Reliability 119, 114072, 2021
92021
Effectiveness of High Permittivity Spacer for Underlap Regions of Wavy-Junctionless FinFET at 22 nm Node and Scaling Short Channel Effects
B Vandana, JK Das, SK Mohapatra, BK Kaushik
International Symposium on VLSI Design and Test, 545-556, 2017
62017
Mole fraction dependency electrical performances of extremely thin SiGe on insulator junctionless channel transistor (SG-OI JLCT)
B Vandana, P Parashar, BS Patro, KP Pradhan, SK Mohapatra, JK Das
Advances in Signal Processing and Communication: Select Proceedings of ICSC …, 2018
42018
Low Power Strategies for beyond Moore's Law Era: Low Power Device Technologies and Materials
BS Patro, B Vandana
Design and Modeling of Low Power VLSI Systems, 27-47, 2016
42016
Exploration towards electrostatic integrity for SiGe on insulator (SG-OI) on junctionless channel transistor (JLCT)
B Vandana, JK Das, BS Patro, SK Mohapatra
Facta Universitatis, Series: Electronics and Energetics 30 (3), 383-390, 2017
32017
Physical insight of junctionless transistor with simulation study of Strained channel
B Vandana, BS Patro, JK Das, SK Mohapatra
ECTI Transactions on Electrical Engineering, Electronics, and Communications …, 2017
32017
Challenges and Limitations of Low Power Techniques: Low Power Methodologies in
B Vandana, BS Patro
Design and Modeling of Low Power VLSI Systems, 48, 2016
32016
Low Power Performance Analysis of 16-Bit Vedic Math RISC Processor
PSA Khan, B Vandana, MVVS Deepak, KR Baddam
2023 3rd Asian Conference on Innovation in Technology (ASIANCON), 1-6, 2023
22023
Implementation of three stage comparator using a modified latch with sustainable resources
G Navya, K Jamal, HB Valiveti, JK Gupta, B Vandana
E3S Web of Conferences 430, 01012, 2023
12023
Macromodel development for Wind Speed Estimation Using RBF-SVM
BS Patro, P Swain, B Vandana
2021 IEEE 4th International Conference on Computing, Power and Communication …, 2021
12021
Emerging Trends in Nanoscale Semiconductor Devices
JKDSKM B. Vandana, B. S. Patro
Advanced VLSI Design and Testability Issues, 111-127, 2020
12020
Prospects of 2D Junctionless Channel Transistor (JLCT) Towards Analog and RF Metrics Using Si and SiGe in Device Layer
B Vandana, SK Mohapatra, JK Das, BS Patro
Journal of Low Power Electronics 13 (3), 536-544, 2017
12017
Memory Efficient Fractal-SPIHT Based Hybrid Image Encoder
M Panigrahy, NC Behera, B Vandana, I Chakrabarti, AS Dhar
International Symposium on VLSI Design and Test, 376-387, 2017
12017
Impact on gate oxide material of inverted ‘T’Junctionless FinFET at 22 nm technology node
B Vandana, JK Das, SK Mohapatra, MS Jyothi
2017 1st International Conference on Electronics, Materials Engineering and …, 2017
12017
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Articles 1–20