| CMOS small-signal and thermal noise modeling at high frequencies A Antonopoulos, M Bucher, K Papathanasiou, N Mavredakis, N Makris, ... IEEE Transactions on Electron Devices 60 (11), 3726-3733, 2013 | 50 | 2013 |
| Compact modeling technology for the simulation of integrated circuits based on graphene field‐effect transistors F Pasadas, PC Feijoo, N Mavredakis, A Pacheco‐Sanchez, FA Chaves, ... Advanced Materials 34 (48), 2201691, 2022 | 45 | 2022 |
| Improved metal-graphene contacts for low-noise, high-density microtransistor arrays for neural sensing N Schaefer, R Garcia-Cortadella, A Bonaccini Calia, N Mavredakis, X Illa, ... Carbon, 2020 | 30 | 2020 |
| Understanding the Bias Dependence of Low Frequency Noise in Single Layer Graphene FETs N Mavredakis, R Garcia Cortadella, A Bonaccini Calia, JA Garrido, ... Nanoscale, 14947-14956, 2018 | 30 | 2018 |
| Experimental observation and modeling of the impact of traps on static and analog/HF performance of graphene transistors A Pacheco-Sanchez, N Mavredakis, PC Feijoo, W Wei, E Pallecchi, ... IEEE Transactions on Electron Devices 67 (12), 5790-5796, 2020 | 23 | 2020 |
| Velocity saturation effect on low frequency noise in short channel single layer graphene field effect transistors N Mavredakis, W Wei, E Pallecchi, D Vignaud, H Happy, ... ACS Applied Electronic Materials 1 (12), 2626-2636, 2019 | 22 | 2019 |
| Measurement and modelling of 1/f noise in 180 nm NMOS and PMOS devices N Mavredakis, A Antonopoulos, M Bucher Proceedings of Papers 5th European Conference on Circuits and Systems for …, 2010 | 22 | 2010 |
| Charge-Based Compact Model for Bias-Dependent Variability of 1/ Noise in MOSFETs N Mavredakis, N Makris, P Habas, M Bucher IEEE Transactions on Electron Devices 63 (11), 4201-4208, 2016 | 18 | 2016 |
| An extraction method for mobility degradation and contact resistance of graphene transistors A Pacheco-Sanchez, N Mavredakis, PC Feijoo, D Jimenez IEEE Transactions on Electron Devices 69 (7), 4037-4041, 2022 | 15 | 2022 |
| Low-frequency noise parameter extraction method for single-layer graphene FETs N Mavredakis, W Wei, E Pallecchi, D Vignaud, H Happy, RG Cortadella, ... IEEE transactions on electron devices 67 (5), 2093-2099, 2020 | 13 | 2020 |
| Bias dependence of low frequency noise in 90nm CMOS N Mavredakis, A Antonopoulos, M Bucher Proc. NSTI-Nanotech/Microtech 2, 805-808, 2010 | 12 | 2010 |
| A scalable compact model for the static drain current of graphene FETs N Mavredakis, A Pacheco-Sanchez, O Txoperena, E Torres, D Jiménez IEEE Transactions on Electron Devices 71 (1), 853-859, 2023 | 11 | 2023 |
| Bias-dependent intrinsic RF thermal noise modeling and characterization of single-layer graphene FETs N Mavredakis, A Pacheco-Sanchez, P Sakalas, W Wei, E Pallecchi, ... IEEE Transactions on Microwave Theory and Techniques 69 (11), 4639-4646, 2021 | 10 | 2021 |
| Analog/RF figures of merit of advanced DG MOSFETs RK Sharma, A Antonopoulos, N Mavredakis, M Bucher 2012 8th International Caribbean Conference on Devices, Circuits and Systems …, 2012 | 10 | 2012 |
| Straightforward bias-and frequency-dependent small-signal model extraction for single-layer graphene FETs N Mavredakis, A Pacheco-Sanchez, W Wei, E Pallecchi, H Happy, ... Microelectronics Journal 133, 105715, 2023 | 9 | 2023 |
| Variability of low frequency noise and mismatch in enclosed-gate and standard nMOSFETs M Bucher, A Nikolaou, N Mavredakis, N Makris, M Coustans, J Lolivier, ... 2017 International Conference of Microelectronic Test Structures (ICMTS), 1-4, 2017 | 8 | 2017 |
| Measurement and Compact Modeling of 1/f Noise in HV-MOSFETs ES Nikolaos Mavredakis, Matthias Bucher, Roland Electron Devices, IEEE Transactions on 60 (2), 2013 | 8* | 2013 |
| Bias Dependent Variability of Low Frequency Noise in Single Layer Graphene FETs N Mavredakis, RG Cortadella, X Illa, N Schaefer, AB Calia, ... Nanoscale Advances 2 (11), 5450-5460, 2020 | 7 | 2020 |
| Inversion-coefficient based design of RF CMOS low-noise amplifiers N Mavredakis, M Bucher 2006 13th IEEE International Conference on Electronics, Circuits and Systems …, 2006 | 7 | 2006 |
| Compact Model for Variability of Low Frequency Noise due to Number Fluctuation Effect N Mavredakis, M Bucher European Solid State Device Research Conference (ESSDERC), 464-467, 2016 | 6 | 2016 |
