| Modeling of thermoelectric effects in phase change memory cells A Faraclas, G Bakan, LH Adnane, F Dirisaglik, NE Williams, A Gokirmak, ... IEEE Transactions on Electron Devices 61 (2), 372-378, 2014 | 105 | 2014 |
| Silicon-layer guided-mode resonance polarizer with 40-nm bandwidth KJ Lee, R LaComb, B Britton, M Shokooh-Saremi, H Silva, E Donkor, ... IEEE Photonics Technology Letters 20 (22), 1857-1859, 2008 | 99 | 2008 |
| Small silicon memories: confinement, single-electron,. and interface state considerations S Tiwari, JA Wahl, H Silva, F Rana, JJ Welser Applied Physics A: Materials Science & Processing 71 (4), 403-414, 2000 | 93 | 2000 |
| High speed, high temperature electrical characterization of phase change materials: metastable phases, crystallization dynamics, and resistance drift F Dirisaglik, G Bakan, Z Jurado, S Muneer, M Akbulut, J Rarey, L Sullivan, ... Nanoscale 7 (40), 16625-16630, 2015 | 87 | 2015 |
| Extracting the temperature distribution on a phase-change memory cell during crystallization G Bakan, B Gerislioglu, F Dirisaglik, Z Jurado, L Sullivan, A Dana, C Lam, ... Journal of Applied Physics 120 (16), 2016 | 81 | 2016 |
| Modeling of Set and Reset Operations of Phase-Change Memory Cells A Faraclas, N Williams, A Gokirmak, H Silva Electron Device Letters, IEEE, 1-3, 2011 | 65 | 2011 |
| Electrical Resistivity of LiquidBased on Thin-Film and Nanoscale Device Measurements K Cil, F Dirisaglik, L Adnane, M Wennberg, A King, A Faraclas, ... IEEE transactions on electron devices 60 (1), 433-437, 2012 | 55 | 2012 |
| High-temperature thermoelectric transport at small scales: Thermal generation, transport and recombination of minority carriers G Bakan, N Khan, H Silva, A Gokirmak Scientific reports 3 (1), 2724, 2013 | 53 | 2013 |
| High temperature electrical resistivity and Seebeck coefficient of Ge2Sb2Te5 thin films L Adnane, F Dirisaglik, A Cywar, K Cil, Y Zhu, C Lam, AFM Anwar, ... Journal of Applied Physics 122 (12), 2017 | 50 | 2017 |
| Self-heating of silicon microwires: Crystallization and thermoelectric effects G Bakan, N Khan, A Cywar, K Cil, M Akbulut, A Gokirmak, H Silva Journal of Materials Research 26 (09), 1061-1071, 2011 | 45 | 2011 |
| Nanoscale semiconductor memories: technology and applications SK Kurinec, K Iniewski CRC press, 2013 | 44 | 2013 |
| Thickness dependence of the amorphous-cubic and cubic-hexagonal phase transition temperatures of GeSbTe thin films on silicon nitride HK Peng, K Cil, A Gokirmak, G Bakan, Y Zhu, CS Lai, CH Lam, H Silva Thin Solid Films, 2011 | 39 | 2011 |
| Nanoscale RingFETs N Williams, H Silva, A Gokirmak IEEE electron device letters 33 (10), 1339-1341, 2012 | 34 | 2012 |
| Modeling and impacts of the latent heat of phase change and specific heat for phase change materials J Scoggin, RS Khan, H Silva, A Gokirmak Applied Physics Letters 112 (19), 2018 | 33 | 2018 |
| Write, erase and storage times in nanocrystal memories and the role of interface states JA Wahl, H Silva, A Gokirmak, A Kumar, JJ Welser, S Tiwari Electron Devices Meeting, 1999. IEDM Technical Digest. International, 375-378, 1999 | 32 | 1999 |
| Improved mobility of amorphous silicon thin-film transistors deposited by hot-wire chemical vapor deposition on glass substrates V Chu, J Jarego, H Silva, T Silva, M Reissner, P Brogueira, JP Conde Applied physics letters 70, 2714, 1997 | 30 | 1997 |
| Melting and crystallization of nanocrystalline silicon microwires through rapid self-heating G Bakan, A Cywar, H Silva, A Gokirmak Applied Physics Letters 94, 251910, 2009 | 29 | 2009 |
| Activation energy of metastable amorphous Ge2Sb2Te5 from room temperature to melt S Muneer, J Scoggin, F Dirisaglik, L Adnane, A Cywar, G Bakan, K Cil, ... AIP Advances 8 (6), 2018 | 28 | 2018 |
| High temperature Hall measurement setup for thin film characterization L Adnane, A Gokirmak, H Silva Review of Scientific Instruments 87 (7), 2016 | 28 | 2016 |
| Ultrashort SONOS memories MK Kim, SD Chae, HS Chae, JH Kim, YS Jeong, JW Lee, H Silva, S Tiwari, ... IEEE Transactions on nanotechnology 3 (4), 417-424, 2004 | 28 | 2004 |
Ali GokirmakElectrical and Computer Engineering, University of ConnecticutVerified email at uconn.edu
