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Wojciech Paszkowicz
Wojciech Paszkowicz
Professor of Materials Science, Institute of Physics, Warsaw
Verified email at ifpan.edu.pl
Title
Cited by
Cited by
Year
Lattice parameters and anisotropic thermal expansion of hexagonal boron nitride in the 10–297.5 K temperature range
W Paszkowicz, JB Pelka, M Knapp, T Szyszko, S Podsiadlo
Applied Physics A 75 (3), 431-435, 2002
4052002
Extremely low temperature growth of ZnO by atomic layer deposition
E Guziewicz, IA Kowalik, M Godlewski, K Kopalko, V Osinniy, A Wójcik, ...
Journal of Applied Physics 103 (3), 2008
3112008
Genetic algorithms, a nature-inspired tool: survey of applications in materials science and related fields
W Paszkowicz
Materials and Manufacturing Processes 24 (2), 174-197, 2009
2002009
Rietveld-refinement study of aluminium and gallium nitrides
W Paszkowicz, S Podsiadło, R Minikayev
Journal of alloys and compounds 382 (1-2), 100-106, 2004
1762004
ZnO grown by atomic layer deposition: A material for transparent electronics and organic heterojunctions
E Guziewicz, M Godlewski, T Krajewski, Ł Wachnicki, A Szczepanik, ...
Journal of Applied Physics 105 (12), 2009
1562009
XPS and XRD study of crystalline 3C-SiC grown by sublimation method
RJ Iwanowski, K Fronc, W Paszkowicz, M Heinonen
Journal of alloys and compounds 286 (1-2), 143-147, 1999
1511999
Raman scattering in α-In2Se3 crystals
R Lewandowska, R Bacewicz, J Filipowicz, W Paszkowicz
Materials research bulletin 36 (15), 2577-2583, 2001
1392001
Magnetic properties of La 0.67 Sr 0.33 MnO 3/YBa 2 Cu 3 O 7 superlattices
P Przyslupski, I Komissarov, W Paszkowicz, P Dluzewski, R Minikayev, ...
Physical Review B 69 (13), 134428, 2004
1262004
Rietveld refinement for indium nitride in the 105–295 K range
W Paszkowicz, R Černý, S Krukowski
Powder Diffraction 18 (2), 114-121, 2003
1142003
Controlling of preferential growth mode of ZnO thin films grown by atomic layer deposition
A Wójcik, M Godlewski, E Guziewicz, R Minikayev, W Paszkowicz
Journal of Crystal Growth 310 (2), 284-289, 2008
1122008
X-ray powder diffraction data for indium nitride
W Paszkowicz
Powder Diffraction 14 (4), 258-260, 1999
1011999
Genetic algorithms, a nature-inspired tool: a survey of applications in materials science and related fields: part II
W Paszkowicz
Materials and Manufacturing Processes 28 (7), 708-725, 2013
972013
Complementary microstructural and chemical analyses of Sepia officinalis endoskeleton
M Florek, E Fornal, P Gómez-Romero, E Zieba, W Paszkowicz, J Lekki, ...
Materials Science and Engineering: C 29 (4), 1220-1226, 2009
962009
Rietveld refinement for CuInSe2 and CuIn3Se5
W Paszkowicz, R Lewandowska, R Bacewicz
Journal of alloys and compounds 362 (1-2), 241-247, 2004
792004
Transparent and conductive undoped zinc oxide thin films grown by atomic layer deposition
G Luka, T Krajewski, L Wachnicki, B Witkowski, E Lusakowska, ...
physica status solidi (a) 207 (7), 1568-1571, 2010
772010
Photoluminescence, electrical and structural properties of ZnO films, grown by ALD at low temperature
E Przeździecka, W Paszkowicz, E Łusakowska, T Krajewski, G Łuka, ...
Semiconductor Science and Technology 24 (10), 105014, 2009
742009
Structural and optical properties of low-temperature ZnO films grown by atomic layer deposition with diethylzinc and water precursors
IA Kowalik, E Guziewicz, K Kopalko, S Yatsunenko, A Wójcik-Głodowska, ...
Journal of crystal growth 311 (4), 1096-1101, 2009
702009
Composition dependence of the unit cell dimensions and the energy gap in Zn1-xMgxSe crystals
F Firszt, H Meczynska, B Sekulska, J Szatkowski, W Paszkowicz, ...
Semiconductor science and technology 10 (2), 197, 1995
641995
High-pressure powder X-ray diffraction at the turn of the century
W Paszkowicz
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002
602002
Lattice parameters and orthorhombic distortion of CaMnO3
W Paszkowicz, J Piętosa, SM Woodley, PA Dłużewski, M Kozłowski, ...
Powder Diffraction 25 (1), 46-59, 2010
582010
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Articles 1–20