| Echo TEMPEST: EM information leakage induced by IEMI for electronic devices S Kaji, D Fujimoto, M Kinugawa, Y Hayashi IEEE Transactions on Electromagnetic Compatibility 65 (3), 655-666, 2023 | 27 | 2023 |
| Data injection attack against electronic devices with locally weakened immunity using a hardware Trojan S Kaji, M Kinugawa, D Fujimoto, Y Hayashi IEEE Transactions on Electromagnetic Compatibility 61 (4), 1115-1121, 2018 | 22 | 2018 |
| Segmentation method based modeling and analysis of a glass package power distribution network (PDN) Y Kim, D Fujimoto, S Kaji, S Wada, H Park, D Lho, J Kim, Y Hayashi Nonlinear Theory and Its Applications, IEICE 11 (2), 170-188, 2020 | 7 | 2020 |
| A fundamental evaluation of em information leakage induced by IEMI for a device with differential signaling S Kaji, D Fujimoto, Y Kim, Y Hayashi 2021 Asia-Pacific International Symposium on Electromagnetic Compatibility …, 2021 | 2 | 2021 |
| A Feasibility of Self-Interference Suppression Method in Echo TEMPEST Using Frequency Conversion R Nagoshi, S Kaji, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 124 (258), 1-4, 2024 | 1 | 2024 |
| Fundamental Study on Detection of Counterfeit Parts with Abnormal Aging Characteristics Using Electromagnetic Backscattering from I/O Circuits S Kaji, M Kinugawa, D Fujimoto, Y Hayashi 2024 International Symposium on Electromagnetic Compatibility–EMC Europe …, 2024 | 1 | 2024 |
| Simulation-Based Approach to Generating Golden Data for PCB-Level Hardware Trojan Detection Using Capacitive Sensor S Kaji, D Fujimoto, Y Hayashi 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-7, 2023 | 1 | 2023 |
| Enhanced Modulation Degree of Leakage Wave Induced by IEMI via Nonlinear Circuit Elements S Kaji, D Fujimoto, Y Hayashi 2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power …, 2023 | 1 | 2023 |
| Method for Identifying Individual Electronic Devices Focusing on Differences in Spectrum Emissions S Kaji, M Kinugawa, D Fujimoto, L Sauvage, JL Danger, Y Hayashi 2019 Joint International Symposium on Electromagnetic Compatibility and Asia …, 2019 | 1 | 2019 |
| Capacitance Sensor-Based Board-Level PUF for Device Identification R Haga, A Tachikake, S Kaji, D Fujimoto, Y Hayashi IEEE Access, 2025 | | 2025 |
| Anti-Phase Signal Approach to Echo TEMPEST Self-Interference Suppression Retaining a Two-Antenna Setup S Kaji, D Fujimoto, Y Hayashi 2025 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2025 | | 2025 |
| Detection of Hardware Trojans Using a Capacitance Sensor Focused on Parasitic Coupling Between Wires R Haga, S Kaji, D Fujimoto, Y Hayashi 2025 23rd IEEE Interregional NEWCAS Conference (NEWCAS), 104-107, 2025 | | 2025 |
| Amplifying Electromagnetic Leakage by Hardware Trojans Through Cable Geometry Manipulation H Ide, S Matsumoto, T Kitazawa, S Kaji, D Fujimoto, T Kasuga, Y Hayashi 2025 IEEE International Symposium on Hardware Oriented Security and Trust …, 2025 | | 2025 |
| Fundamental Study of Side-Channel Analysis Focusing on Backscattering from Switching Regulators T KITAZAWA, S KAJI, D FUJIMOTO, Y HAYASHI 電子情報通信学会技術研究報告 (Web) 123 (215 (EMCJ2023 35-71)), 28-31, 2023 | | 2023 |
| Fundamental Study on ID Generation Method Focusing on Distribution of Capacitance Sensor Output Values S Kaji, A Tachikake, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 122 (11), 19-23, 2022 | | 2022 |
| Fundamental Evaluation Method for EM Information Leakage Caused by Hardware Trojans on Signal Cables--Impact of Modulation Factor and Emission Intensity T Yukawa, S Kaji, D Fujimoto, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 121 (413), 153-157, 2022 | | 2022 |
| Development of an Evaluation System for Modeling of Information Leakage Induced by Low-Power IEMI S TAKANO, S KAJI, M KINUGAWA, D FUJIMOTO, Y HAYASHI 電子情報通信学会技術研究報告 (Web) 122 (206 (EMCJ2022 35-62)), 93-96, 2022 | | 2022 |
| Fundamental Study on Hardware Trojan Detection on Cable Using On-chip Sensor Y Nishitoba, S Kaji, M Kinugawa, D Fujimoto, Y Hayshi IEICE Technical Report; IEICE Tech. Rep. 121 (206), 38-42, 2021 | | 2021 |
| Fundamental Study on Individual Identification of Printed Circuit Boards Using Capacitance Sensors A Tachikake, S Kaji, D Fujitomo, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 121 (206), 49-52, 2021 | | 2021 |
| Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors H Ueda, S Kaji, D Fujimoto, Y Kim, Y Hayashi IEICE Technical Report; IEICE Tech. Rep. 120 (425), 40-43, 2021 | | 2021 |
