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Hae Jin Kim
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Nociceptive memristor
Y Kim, YJ Kwon, DE Kwon, KJ Yoon, JH Yoon, S Yoo, HJ Kim, TH Park, ...
Advanced Materials 30 (8), 1704320, 2018
2332018
A ferroelectric photocatalyst for enhancing hydrogen evolution: polarized particulate suspension
S Park, CW Lee, MG Kang, S Kim, HJ Kim, JE Kwon, SY Park, CY Kang, ...
Physical Chemistry Chemical Physics 16 (22), 10408-10413, 2014
1272014
Nucleation‐Limited Ferroelectric Orthorhombic Phase Formation in Hf0.5Zr0.5O2 Thin Films
YH Lee, SD Hyun, HJ Kim, JS Kim, C Yoo, T Moon, KD Kim, HW Park, ...
Advanced Electronic Materials 5 (2), 1800436, 2019
1062019
Thickness effect of ultra-thin Ta2O5 resistance switching layer in 28 nm-diameter memory cell
TH Park, SJ Song, HJ Kim, SG Kim, S Chung, BY Kim, KJ Lee, KM Kim, ...
Scientific reports 5 (1), 15965, 2015
792015
Fabrication of a Cu‐cone‐shaped cation source inserted conductive bridge random access memory and its improved switching reliability
HJ Kim, TH Park, KJ Yoon, WM Seong, JW Jeon, YJ Kwon, Y Kim, ...
Advanced Functional Materials 29 (8), 1806278, 2019
772019
Defect-Engineered Electroforming-Free Analog HfOx Memristor and Its Application to the Neural Network
GS Kim, H Song, YK Lee, JH Kim, W Kim, TH Park, HJ Kim, K Min Kim, ...
ACS applied materials & interfaces 11 (50), 47063-47072, 2019
662019
A stateful logic family based on a new logic primitive circuit composed of two antiparallel bipolar memristors
N Xu, TG Park, HJ Kim, X Shao, KJ Yoon, TH Park, L Fang, KM Kim, ...
Advanced Intelligent Systems 2 (1), 1900082, 2020
592020
Uniform Self-rectifying Resistive Switching Behavior via Preformed Conducting Paths in a Vertical-type Ta2O5/HfO2–x Structure with a Sub-μm2 Cell Area
JH Yoon, S Yoo, SJ Song, KJ Yoon, DE Kwon, YJ Kwon, TH Park, HJ Kim, ...
ACS Applied Materials & Interfaces 8 (28), 18215-18221, 2016
582016
Double‐Layer‐Stacked One Diode‐One Resistive Switching Memory Crossbar Array with an Extremely High Rectification Ratio of 109
KJ Yoon, GH Kim, S Yoo, W Bae, JH Yoon, TH Park, DE Kwon, YJ Kwon, ...
Advanced Electronic Materials 3 (7), 1700152, 2017
562017
Filament Shape Dependent Reset Behavior Governed by the Interplay between the Electric Field and Thermal Effects in the Pt/TiO2/Cu Electrochemical …
HJ Kim, KJ Yoon, TH Park, HJ Kim, YJ Kwon, XL Shao, DE Kwon, YM Kim, ...
Advanced Electronic Materials 3 (2), 1600404, 2017
432017
Sn self-doped α-Fe2O3 nanobranch arrays supported on a transparent, conductive SnO2 trunk to improve photoelectrochemical water oxidation
S Park, HJ Kim, CW Lee, HJ Song, SS Shin, SW Seo, HK Park, S Lee, ...
International journal of hydrogen energy 39 (29), 16459-16467, 2014
402014
Hierarchical assembly of TiO2–SrTiO3 heterostructures on conductive SnO2 backbone nanobelts for enhanced photoelectrochemical and photocatalytic performance
S Park, S Kim, HJ Kim, CW Lee, HJ Song, SW Seo, HK Park, DW Kim, ...
Journal of hazardous materials 275, 10-18, 2014
382014
Solvothermal synthesis of SnNb2O6 nanoplates and enhanced photocatalytic H2 evolution under visible light
SW Seo, TH Noh, S Park, CW Lee, SH Kim, HJ Kim, HK Park, KS Hong
International journal of hydrogen energy 39 (30), 17517-17523, 2014
372014
Single‐Cell Stateful Logic Using a Dual‐Bit Memristor
KM Kim, N Xu, X Shao, KJ Yoon, HJ Kim, RS Williams, CS Hwang
physica status solidi (RRL)–Rapid Research Letters 13 (3), 1800629, 2019
342019
Roles of conducting filament and non-filament regions in the Ta 2 O 5 and HfO 2 resistive switching memory for switching reliability
TH Park, HJ Kim, WY Park, SG Kim, BJ Choi, CS Hwang
Nanoscale 9 (18), 6010-6019, 2017
332017
Heterogeneous reservoir computing in second-order Ta 2 O 5/HfO 2 memristors
N Ghenzi, TW Park, SS Kim, HJ Kim, YH Jang, KS Woo, CS Hwang
Nanoscale horizons 9 (3), 427-437, 2024
322024
Balancing the source and sink of oxygen vacancies for the resistive switching memory
TH Park, YJ Kwon, HJ Kim, HC Woo, GS Kim, CH An, Y Kim, DE Kwon, ...
ACS applied materials & interfaces 10 (25), 21445-21450, 2018
322018
Novel selector‐induced current‐limiting effect through asymmetry control for high‐density one‐selector–one‐resistor crossbar arrays
Y Kim, YJ Kwon, J Kim, CH An, T Park, DE Kwon, HC Woo, HJ Kim, ...
Advanced Electronic Materials 5 (7), 1800806, 2019
312019
Investigation of the retention performance of an ultra-thin HfO2 resistance switching layer in an integrated memory device
GS Kim, TH Park, HJ Kim, TJ Ha, WY Park, SG Kim, CS Hwang
Journal of Applied Physics 124 (2), 2018
312018
Interface engineering for improving reliability of resistance switching in Cu/HfO2/TiO2/Pt structure
L Wei Zhou, X Long Shao, X Yuan Li, H Jiang, R Chen, K Jean Yoon, ...
Applied Physics Letters 107 (7), 2015
302015
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Articles 1–20