| Connecting system identification and robust control for next-generation motion control of a wafer stage T Oomen, R Van Herpen, S Quist, M Van De Wal, O Bosgra, M Steinbuch IEEE Transactions on Control Systems Technology 22 (1), 102-118, 2013 | 231 | 2013 |
| On inversion-based approaches for feedforward and ILC J van Zundert, T Oomen Mechatronics 50, 282-291, 2018 | 184 | 2018 |
| Advanced motion control for precision mechatronics: Control, identification, and learning of complex systems T Oomen IEEJ Journal of Industry Applications 7 (2), 127-140, 2018 | 183 | 2018 |
| Rational basis functions in iterative learning control—with experimental verification on a motion system J Bolder, T Oomen IEEE Transactions on Control Systems Technology 23 (2), 722-729, 2014 | 172 | 2014 |
| Constrained iterative feedback tuning for robust control of a wafer stage system MF Heertjes, B Van der Velden, T Oomen IEEE transactions on control systems technology 24 (1), 56-66, 2015 | 133 | 2015 |
| Iterative motion feedforward tuning: A data-driven approach based on instrumental variable identification F Boeren, T Oomen, M Steinbuch Control Engineering Practice 37, 11-19, 2015 | 130 | 2015 |
| Batch-to-batch rational feedforward control: from iterative learning to identification approaches, with application to a wafer stage L Blanken, F Boeren, D Bruijnen, T Oomen IEEE/ASME Transactions on Mechatronics 22 (2), 826-837, 2016 | 127 | 2016 |
| Frequency-domain ILC approach for repeating and varying tasks: With application to semiconductor bonding equipment F Boeren, A Bareja, T Kok, T Oomen IEEE/ASME Transactions on Mechatronics 21 (6), 2716-2727, 2016 | 124 | 2016 |
| Optimality and flexibility in iterative learning control for varying tasks J Van Zundert, J Bolder, T Oomen Automatica 67, 295-302, 2016 | 112 | 2016 |
| Using iterative learning control with basis functions to compensate medium deformation in a wide-format inkjet printer J Bolder, T Oomen, S Koekebakker, M Steinbuch Mechatronics 24 (8), 944-953, 2014 | 108 | 2014 |
| Joint input shaping and feedforward for point-to-point motion: Automated tuning for an industrial nanopositioning system F Boeren, D Bruijnen, N van Dijk, T Oomen Mechatronics 24 (6), 572-581, 2014 | 104 | 2014 |
| Data‐driven multivariable ILC: enhanced performance by eliminating L and Q filters J Bolder, S Kleinendorst, T Oomen International Journal of Robust and Nonlinear Control 28 (12), 3728-3751, 2018 | 90 | 2018 |
| Iterative Data-DrivenNorm Estimation of Multivariable Systems With Application to Robust Active Vibration Isolation T Oomen, R van der Maas, CR Rojas, H Hjalmarsson IEEE Transactions on Control Systems Technology 22 (6), 2247-2260, 2014 | 88 | 2014 |
| Sparse iterative learning control with application to a wafer stage: Achieving performance, resource efficiency, and task flexibility T Oomen, CR Rojas Mechatronics 47, 134-147, 2017 | 84 | 2017 |
| Exploiting additional actuators and sensors for nano-positioning robust motion control R van Herpen, T Oomen, E Kikken, M van de Wal, W Aangenent, ... Mechatronics 24 (6), 619-631, 2014 | 84 | 2014 |
| Resource-efficient ILC for LTI/LTV systems through LQ tracking and stable inversion: Enabling large feedforward tasks on a position-dependent printer J van Zundert, J Bolder, S Koekebakker, T Oomen Mechatronics 38, 76-90, 2016 | 80 | 2016 |
| Kernel-based identification of non-causal systems with application to inverse model control L Blanken, T Oomen Automatica 114, 108830, 2020 | 71 | 2020 |
| Mitigation of torsional vibrations in drilling systems: A robust control approach T Vromen, CH Dai, N van de Wouw, T Oomen, P Astrid, A Doris, ... IEEE Transactions on Control Systems Technology 27 (1), 249-265, 2017 | 71 | 2017 |
| Motion control, mechatronics design, and Moore's law M Steinbuch, T Oomen, H Vermeulen IEEJ Journal of Industry Applications 11 (2), 245-255, 2022 | 68 | 2022 |
| Enhancing flatbed printer accuracy and throughput: Optimal rational feedforward controller tuning via iterative learning control J Bolder, J van Zundert, S Koekebakker, T Oomen IEEE Transactions on Industrial Electronics 64 (5), 4207-4216, 2016 | 64 | 2016 |
Maarten SteinbuchEindhoven University of TechnologyVerified email at tue.nl
