| X-ray and neutron reflectivity: principles and applications J Daillant, A Gibaud Springer, 2008 | 965 | 2008 |
| Thermally tunable optical constants of vanadium dioxide thin films measured by spectroscopic ellipsometry JBK Kana, JM Ndjaka, G Vignaud, A Gibaud, M Maaza Optics Communications 284 (3), 807-812, 2011 | 263 | 2011 |
| X-ray reflectivity and diffuse scattering A Gibaud, S Hazra Current Science, 1467-1477, 2000 | 223 | 2000 |
| Visible‐light photocatalysis in titania‐based mesoporous thin films SS Soni, MJ Henderson, JF Bardeau, A Gibaud Advanced Materials 20 (8), 1493-1498, 2008 | 220 | 2008 |
| Peering into the self-assembly of surfactant templated thin-film silica mesophases DA Doshi, A Gibaud, V Goletto, M Lu, H Gerung, B Ocko, SM Han, ... Journal of the American Chemical Society 125 (38), 11646-11655, 2003 | 208 | 2003 |
| Correlation between lithium intercalation capacity and microstructure in hard carbons W Xing, JS Xue, T Zheng, A Gibaud, JR Dahn Journal of the Electrochemical Society 143 (11), 3482, 1996 | 202 | 1996 |
| Evaporation-controlled self-assembly of silica surfactant mesophases A Gibaud, D Grosso, B Smarsly, A Baptiste, JF Bardeau, F Babonneau, ... The Journal of Physical Chemistry B 107 (25), 6114-6118, 2003 | 198 | 2003 |
| Quantitative SAXS analysis of the P123/water/ethanol ternary phase diagram SS Soni, G Brotons, M Bellour, T Narayanan, A Gibaud The journal of physical chemistry B 110 (31), 15157-15165, 2006 | 195 | 2006 |
| A small angle X-ray scattering study of carbons made from pyrolyzed sugar A Gibaud, JS Xue, JR Dahn Carbon 34 (4), 499-503, 1996 | 159 | 1996 |
| Effects of partial coherence on the scattering of x rays by matter SK Sinha, M Tolan, A Gibaud Physical Review B 57 (5), 2740, 1998 | 153 | 1998 |
| Postassembly chemical modification of a highly ordered organosilane multilayer: new insights into the structure, bonding, and dynamics of self-assembling silane monolayers K Wen, R Maoz, H Cohen, J Sagiv, A Gibaud, A Desert, BM Ocko ACS nano 2 (3), 579-599, 2008 | 130 | 2008 |
| The correction of geometrical factors in the analysis of X-ray reflectivity A Gibaud, G Vignaud, SK Sinha Foundations of Crystallography 49 (4), 642-648, 1993 | 124 | 1993 |
| Densification and depression in glass transition temperature in polystyrene thin films G Vignaud, M S. Chebil, JK Bal, N Delorme, T Beuvier, Y Grohens, ... Langmuir 30 (39), 11599-11608, 2014 | 120 | 2014 |
| X-ray scattering studies of surface roughness of GaAs/A1As multilayers SK Sinha, MK Sanyal, SK Satija, CF Majkrzak, DA Neumann, H Homma, ... Physica B: Condensed Matter 198 (1-3), 72-77, 1994 | 111 | 1994 |
| Evaporation‐Induced Self‐Assembly (EISA) at Its Limit: Ultrathin, Crystalline Patterns by Templating of Micellar Monolayers T Brezesinski, M Groenewolt, A Gibaud, N Pinna, M Antonietti, B Smarsly Advanced Materials 18 (17), 2260-2263, 2006 | 109 | 2006 |
| Scattering study on the selective solvent swelling induced surface reconstruction T Xu, JT Goldbach, MJ Misner, S Kim, A Gibaud, O Gang, B Ocko, ... Macromolecules 37 (8), 2972-2977, 2004 | 104 | 2004 |
| Numerical simulation and optimization of n-Al-ZnO/n-CdS/p-CZTSe/p-NiO (HTL)/Mo solar cell system using SCAPS-1D A Ait Abdelkadir, E Oublal, M Sahal, A Gibaud Results in Optics 8, 100257, 2022 | 102 | 2022 |
| REFLEX: a program for the analysis of specular X-ray and neutron reflectivity data G Vignaud, A Gibaud Applied Crystallography 52 (1), 201-213, 2019 | 102 | 2019 |
| Fourier reconstruction of density profiles of thin films using anomalous X-ray reflectivity MK Sanyal, SK Sinha, A Gibaud, KG Huang, BL Carvalho, M Rafailovich, ... Europhysics Letters 21 (6), 691, 1993 | 98 | 1993 |
| X-ray and neutron reflectivity: principles and applications A Gibaud, J Daillant Springer, 1999 | 97 | 1999 |
MaazaUNESCO-UNISA-iThemba LABS NRF Africa Chair in Nanosciences & NanotechnologiesVerified email at tlabs.ac.za
