| A novel transverse read technique for domain-wall “racetrack” memories K Roxy, S Ollivier, A Hoque, S Longofono, AK Jones, S Bhanja IEEE Transactions on Nanotechnology 19, 648-652, 2020 | 25 | 2020 |
| CORUSCANT: Fast efficient processing-in-racetrack memories S Ollivier, S Longofono, P Dutta, J Hu, S Bhanja, AK Jones 2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO), 784-798, 2022 | 15 | 2022 |
| Brain-inspired Cognition in Next-generation Racetrack Memories AA Khan, S Ollivier, S Longofono, G Hempel, J Castrillon, AK Jones ACM Transactions on Embedded Computing Systems 21 (6), 1-28, 2022 | 14 | 2022 |
| Pirm: Processing in racetrack memories S Ollivier, S Longofono, P Dutta, J Hu, S Bhanja, AK Jones arXiv preprint arXiv:2108.01202, 2021 | 11 | 2021 |
| Predicting and mitigating single-event upsets in DRAM using HOTH S Longofono, D Kline Jr, R Melhem, AK Jones Microelectronics Reliability 117, 114024, 2021 | 10 | 2021 |
| Toward comprehensive shifting fault tolerance for domain-wall memories with PIETT S Ollivier, S Longofono, P Dutta, J Hu, S Bhanja, AK Jones IEEE Transactions on Computers 72 (4), 1095-1109, 2022 | 8 | 2022 |
| Virtual coset coding for encrypted non-volatile memories with multi-level cells S Longofono, SM Seyedzadeh, AK Jones 2022 IEEE International Symposium on High-Performance Computer Architecture …, 2022 | 8 | 2022 |
| A CASTLE With TOWERs for Reliable, Secure Phase-Change Memory S Longofono, D Kline, R Melhem, AK Jones IEEE Transactions on Computers 70 (9), 1311-1324, 2020 | 6 | 2020 |
| Pinning fault mode modeling for DWM shifting K Roxy, S Longofono, S Olliver, S Bhanja, AK Jones IEEE Transactions on Circuits and Systems II: Express Briefs 69 (7), 3319-3323, 2022 | 4 | 2022 |
| Toward secure, reliable, and energy efficient phase-change main memory with MACE S Longofono, D Kline, R Melhem, AK Jones 2019 Tenth International Green and Sustainable Computing Conference (IGSC), 1-8, 2019 | 3 | 2019 |
| PREMSim: A resilience framework for modeling traditional and emerging memory reliability D Kline, S Longofono, S Ollivier, E Higgins, R Melhem, AK Jones 2019 IEEE 27th International Symposium on Modeling, Analysis, and Simulation …, 2019 | 3 | 2019 |
| Predicting single event effects in DRAM D Kline, S Longofono, R Melhem, AK Jones 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019 | 2 | 2019 |
| Tuning Memory Fault Tolerance on the Edge AK Jones, S Longofono, S Ollivier, D Kline, J Zhang, R Melhem Proceedings of the 2021 Great Lakes Symposium on VLSI, 421-424, 2021 | | 2021 |
| Secure, Reliable, and Energy-efficient Phase Change Main Memory S Longofono University of Pittsburgh, 2021 | | 2021 |
