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Igor Beinik
Igor Beinik
Researcher, MAX IV, Lund University
Verified email at maxiv.lu.se
Title
Cited by
Cited by
Year
Enhanced wetting of Cu on ZnO by migration of subsurface oxygen vacancies
I Beinik, M Hellström, TN Jensen, P Broqvist, JV Lauritsen
Nature Communications 6 (1), 8845, 2015
822015
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
I Beinik, M Kratzer, A Wachauer, L Wang, RT Lechner, C Teichert, C Motz, ...
Journal of applied physics 110 (5), 2011
562011
Water dissociation and hydroxyl ordering on anatase tio 2 (001)-(1× 4)
I Beinik, A Bruix, Z Li, KC Adamsen, S Koust, B Hammer, S Wendt, ...
Physical review letters, 206003, 2018
472018
Single-layer MoS 2 formation by sulfidation of molybdenum oxides in different oxidation states on Au (111)
N Salazar, I Beinik, JV Lauritsen
Physical Chemistry Chemical Physics 19 (21), 14020-14029, 2017
422017
Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM
I Beinik, M Kratzer, A Wachauer, L Wang, YP Piryatinski, G Brauer, ...
Beilstein journal of nanotechnology 4 (1), 208-217, 2013
352013
Conductive atomic-force microscopy investigation of nanostructures in microelectronics
C Teichert, I Beinik
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 691-721, 2010
332010
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
B Galiana, I Rey-Stolle, I Beinik, C Algora, C Teichert, ...
Solar energy materials and solar cells 95 (7), 1949-1954, 2011
292011
Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films
JD Pedarnig, K Siraj, MA Bodea, I Puica, W Lang, R Kolarova, P Bauer, ...
Thin Solid Films 518 (23), 7075-7080, 2010
292010
Subsurface hydrogen bonds at the polar Zn-terminated ZnO (0001) surface
M Hellström, I Beinik, P Broqvist, JV Lauritsen, K Hermansson
Physical Review B 94 (24), 245433, 2016
262016
Scanning probe microscopy in nanoscience and nanotechnology
C Teichert, I Beinik, B Bhushan
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 691-721, 2011
242011
Soft/MAX-A new Soft X-ray Microscopy and Coherent Imaging Beamline at the MAX IV Facility.
J Schwenke, K Thanell, I Beinik, L Roslund, T Tyliszczak
Microscopy and Microanalysis 24 (S2), 232-233, 2018
212018
Coverage-dependent oxidation and reduction of vanadium supported on anatase TiO2 (1 0 1)
S Koust, BN Reinecke, KC Adamsen, I Beinik, K Handrup, Z Li, PG Moses, ...
Journal of Catalysis 360, 118-126, 2018
212018
Ion beam irradiation of cuprate high-temperature superconductors: Systematic modification of the electrical properties and fabrication of nanopatterns
W Lang, M Marksteiner, MA Bodea, K Siraj, JD Pedarnig, R Kolarova, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
212012
Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
P Tejedor, L Díez-Merino, I Beinik, C Teichert
Applied physics letters 95 (12), 2009
202009
Facile embedding of single vanadium atoms at the anatase TiO 2 (101) surface
S Koust, L Arnarson, PG Moses, Z Li, I Beinik, JV Lauritsen, S Wendt
Physical Chemistry Chemical Physics 19 (14), 9424-9431, 2017
172017
Step edge structures on the anatase TiO 2 (001) surface studied by atomic-resolution TEM and STM
M Ek, I Beinik, A Bruix, S Wendt, JV Lauritsen, S Helveg
Faraday discussions 208, 325-338, 2018
152018
KCl ultra-thin films with polar and non-polar surfaces grown on Si (111) 7× 7
I Beinik, C Barth, M Hanbücken, L Masson
Scientific Reports 5 (1), 8223, 2015
122015
Electrical and photovoltaic properties of self-assembled Ge nanodomes on Si (001)
M Kratzer, M Rubezhanska, C Prehal, I Beinik, SV Kondratenko, ...
Physical Review B—Condensed Matter and Materials Physics 86 (24), 245320, 2012
122012
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
G Brauer, W Anwand, D Grambole, W Egger, P Sperr, I Beinik, L Wang, ...
physica status solidi c 6 (11), 2556-2560, 2009
122009
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
I Beinik, B Galiana, M Kratzer, C Teichert, I Rey-Stolle, C Algora, ...
Journal of Vacuum Science & Technology B 28 (4), C5G5-C5G10, 2010
112010
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Articles 1–20