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Weisheng ZhaoFert Beijing Institute, Beihang UniversityVerified email at buaa.edu.cn
Weiqiang LiuProfessor, Nanjing University of Aeronautics and AstronauticsVerified email at nuaa.edu.cn
Ke ChenNanjing University of Aeronautics and AstronauticsVerified email at nuaa.edu.cn
Zhaohao WangBeihang UniversityVerified email at buaa.edu.cn
Tianyang YuNanjing University of Aeronautics and AstronauticsVerified email at nuaa.edu.cn
Yuanqing ChengAssociate Professor of Electrical Engineering, Beihang UniversityVerified email at ieee.org
Ying WangInstitute of Computing Technology, Chinese Academy of SciencesVerified email at ict.ac.cn
Wang KangBeihang UniversityVerified email at buaa.edu.cn
Haonan ZhuNanjing University of Aeronautics and AstronauticsVerified email at nuaa.edu.cnJianlei YangBeihang UniversityVerified email at buaa.edu.cn
Xiaobo Sharon HuUniversity of Notre Dame, Department of Computer Science and EngineeringVerified email at nd.edu
Fabrizio LombardiInternational Test Conference (ITC) Endowed Chair Professor, Northeastern UniversityVerified email at northeastern.edu
Aida Todri-SanialFull Professor, TU Eindhoven | Director of Research, CNRSVerified email at tue.nl
Yue Zhang (张悦)Professor, Beihang University, Beijing, ChinaVerified email at u-psud.fr
Guangyu SunSchool of Integrated Circuits, Peking UniversityVerified email at pku.edu.cn
Yuan XieChair Professor of Hong Kong University of Science and Technology (HKUST)Verified email at ust.hk
Lionel TORRESLIRMMVerified email at lirmm.fr