| Complex permittivity determination from propagation constant measurements MD Janezic, JA Jargon IEEE microwave and guided wave letters 9 (2), 76-78, 2002 | 392 | 2002 |
| A statistical study of de-embedding applied to eye diagram analysis PD Hale, J Jargon, CMJ Wang, B Grossman, M Claudius, JL Torres, ... IEEE Transactions on Instrumentation and Measurement 61 (2), 475-488, 2011 | 152 | 2011 |
| Characterization of broad-band transmission for coplanar waveguides on CMOS silicon substrates V Milanovic, M Ozgur, DC DeGroot, JA Jargon, M Gaitan, ME Zaghloul IEEE transactions on microwave theory and techniques 46 (5), 632-640, 2002 | 148 | 2002 |
| Multiline TRL revealed DC DeGroot, JA Jargon, RB Marks 60th ARFTG Conference Digest, Fall 2002., 131-155, 2002 | 147 | 2002 |
| Applications of artificial neural networks in optical performance monitoring X Wu, JA Jargon, RA Skoog, L Paraschis, AE Willner Journal of Lightwave Technology 27 (16), 3580-3589, 2009 | 128 | 2009 |
| Millimeter-wave modulated-signal and error-vector-magnitude measurement with uncertainty KA Remley, DF Williams, PD Hale, CM Wang, J Jargon, Y Park IEEE Transactions on Microwave Theory and Techniques 63 (5), 1710-1720, 2015 | 83 | 2015 |
| Measurement challenges for 5G and beyond: An update from the National Institute of Standards and Technology KA Remley, JA Gordon, D Novotny, AE Curtin, CL Holloway, MT Simons, ... IEEE Microwave Magazine 18 (5), 41-56, 2017 | 82 | 2017 |
| Robust SOLT and alternative calibrations for four-sampler vector network analyzers JA Jargon, RB Marks, DK Rytting IEEE transactions on microwave theory and techniques 47 (10), 2008-2013, 2002 | 66 | 2002 |
| Calibration comparison method for vector network analyzers RB Marks, JA Jargon, JR Juroshek 48th ARFTG conference digest 30, 38-45, 1996 | 59 | 1996 |
| Optical performance monitoring of QPSK data channels by use of neural networks trained with parameters derived from asynchronous constellation diagrams JA Jargon, X Wu, HY Choi, YC Chung, AE Willner Optics Express 18 (5), 4931-4938, 2010 | 57 | 2010 |
| Optical performance monitoring using artificial neural networks trained with eye-diagram parameters JA Jargon, X Wu, AE Willner IEEE Photonics Technology Letters 21 (1), 54-56, 2008 | 42 | 2008 |
| Applications of artificial neural networks to RF and microwave measurements JA Jargon, KC Gupta, DC DeGroot International Journal of RF and Microwave Computer‐Aided Engineering: Co …, 2002 | 41 | 2002 |
| Sequential estimation of timebase corrections for an arbitrarily long waveform CMJ Wang, PD Hale, JA Jargon, DF Williams, KA Remley IEEE Transactions on Instrumentation and Measurement 61 (10), 2689-2694, 2012 | 37 | 2012 |
| Nonlinear large-signal scattering parameters: Theory and applications JA Jargon, KC Gupta, DC DeGroot ARFTG 63rd Conference, Spring 2004, 157-174, 2004 | 35 | 2004 |
| Extraction of conversion matrices for P-HEMTs based on vectorial large-signal measurements A Cidronali, KC Gupta, J Jargon, KA Remley, D DeGroot, G Manes IEEE MTT-S International Microwave Symposium Digest, 2003 2, 777-780, 2003 | 33 | 2003 |
| Traceability of high-speed electrical waveforms at NIST, NPL, and PTB PD Hale, DF Williams, A Dienstfrey, J Wang, J Jargon, D Humphreys, ... 2012 Conference on Precision electromagnetic Measurements, 522-523, 2012 | 32 | 2012 |
| Optical performance monitoring by use of artificial neural networks trained with parameters derived from delay-tap asynchronous sampling JA Jargon, X Wu, AE Willner 2009 Conference on Optical Fiber Communication, 1-3, 2009 | 32 | 2009 |
| Establishing traceability of an electronic calibration unit using the NIST Microwave Uncertainty Framework JA Jargon, DF Williams, TM Wallis, DX LeGolvan, PD Hale 79th ARFTG Microwave Measurement Conference, 1-5, 2012 | 30 | 2012 |
| ANN-based optical performance monitoring of QPSK signals using parameters derived from balanced-detected asynchronous diagrams X Wu, JA Jargon, L Paraschis, AE Willner IEEE Photonics Technology Letters 23 (4), 248-250, 2010 | 30 | 2010 |
| Physical models for 2.4 mm and 3.5 mm coaxial VNA calibration kits developed within the NIST microwave uncertainty framework JA Jargon, C Cho, DF Williams, PD Hale 2015 85th Microwave Measurement Conference (ARFTG), 1-7, 2015 | 29 | 2015 |
Alan WillnerProfessor of Electrical Engineering, University of Southern CaliforniaVerified email at usc.edu
