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Jianwei Huang 黄建伟Associate Vice President, CUHK Shenzhen; Former Editor-in-Chief of IEEE TNSEVerified email at cuhk.edu.cn
George IosifidisDelft University of TechnologyVerified email at tudelft.nl
Leandros TassiulasProfessor of Electrical Engineering, Yale UniversityVerified email at yale.edu
Lingjie DuanProfessor at Hong Kong University of Science and Technology (Guangzhou)Verified email at hkust-gz.edu.cn
Ming TangSouthern University of Science and TechnologyVerified email at sustech.edu.cn
Zhiyuan WangBeihang University (BUAA)Verified email at buaa.edu.cn
yuan luoThe Chinese University of Hong Kong (Shenzhen)Verified email at cuhk.edu.cn
Qian MaSun Yat-sen UniversityVerified email at mail.sysu.edu.cn
Xu ChenProfessor, Sun Yat-sen university, Guangzhou, ChinaVerified email at mail.sysu.edu.cn
Prof. Qinyu ZhangHarbin Institute of Technology Shenzhen Graduate SchoolVerified email at hit.edu.cn
Dusit (Tao) NiyatoNanyang Technological University (NTU)Verified email at ntu.edu.sg
Ekram HossainProfessor, University of Manitoba, Canada, IEEE FellowVerified email at umanitoba.ca
Haoran Yu (余皓然)Associate Professor, Beijing Institute of TechnologyVerified email at bit.edu.cn
Qian ZhangTencent Professor of Engineering, Chair Prof. of Dept. of CSE, HKUST, HKVerified email at cse.ust.hk
Ningning DING (丁宁宁)Hong Kong University of Science and Technology (Gaungzhou)Verified email at hkust-gz.edu.cn