[go: up one dir, main page]

WO2012163681A1 - Optical sensor - Google Patents

Optical sensor Download PDF

Info

Publication number
WO2012163681A1
WO2012163681A1 PCT/EP2012/059122 EP2012059122W WO2012163681A1 WO 2012163681 A1 WO2012163681 A1 WO 2012163681A1 EP 2012059122 W EP2012059122 W EP 2012059122W WO 2012163681 A1 WO2012163681 A1 WO 2012163681A1
Authority
WO
WIPO (PCT)
Prior art keywords
measurement
interferometer
interferometers
laser
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2012/059122
Other languages
French (fr)
Inventor
Balthasar Fischer
Friedrich Reining
Ernst Wintner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
XARION Laser Acoustics GmbH
Original Assignee
XARION Laser Acoustics GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by XARION Laser Acoustics GmbH filed Critical XARION Laser Acoustics GmbH
Priority to EP12722142.2A priority Critical patent/EP2710335B8/en
Priority to US14/117,445 priority patent/US9417147B2/en
Priority to CN201280022889.2A priority patent/CN103562684B/en
Priority to KR1020137030900A priority patent/KR101926894B1/en
Priority to JP2014510796A priority patent/JP6120336B2/en
Publication of WO2012163681A1 publication Critical patent/WO2012163681A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L11/00Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00
    • G01L11/02Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00 by optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/266Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light by interferometric means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/0207Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/21Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  by interference
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04RLOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R23/00Transducers other than those covered by groups H04R9/00 - H04R21/00
    • H04R23/008Transducers other than those covered by groups H04R9/00 - H04R21/00 using optical signals for detecting or generating sound
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/21Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  by interference
    • G02F1/216Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  by interference using liquid crystals, e.g. liquid crystal Fabry-Perot filters

Definitions

  • the invention relates to a device comprising a measurement interferometer, which can be used to form an optical sensor. It also relates to a layer structure from which the device can be built and to an optical microphone comprising the device.
  • optical sensor make use of interferometers to detect changes in a physical parameter.
  • light from a laser is coupled into an interferometer, which is influenced by changes in the physical parameter to produce corresponding changes in the interference pattern.
  • These changes in the interference pattern manifest as changes in intensity, which can be detected by a photodetector.
  • Various different physical parameters can be used to cause a change in the interference pattern and hence can be sensed by this type of sensor. Examples include pressure (including air pressure), strain and displacement.
  • the signal-to-noise ratio (SNR) of such sensors is often limited by noise caused by fluctuations in intensity or frequency of the light output from the laser.
  • SNR signal-to-noise ratio
  • a device comprising measurement and reference interferometers, each configured to receive light from the same light source and to emit light to respective detectors and having a respective operating point, wherein the measurement interferometer is configured to respond to variations in a physical parameter by varying the intensity of light emitted, whereas the reference interferometer is configured to be unresponsive to variations in the physical parameter, the device further comprising a signal processor for generating a differential output signal depending on respective output signals generated by the detectors.
  • both interferometers will be affected by fluctuations in the light from the light source, but only the measurement interferometer will be influenced by changes in the physical parameter; the reference interferometer is isolated from these changes.
  • the interference pattern in the reference interferometer thus represents the noise from the light source only as does the signal from its respective detector. This signal can be used to compensate for noise from the light source in the signal from the measurement interferometer's respective detector, such that the signal represents changes in the physical parameter only.
  • each of the reference and measurement interferometer is selected to achieve a linear variation of the transmission of the interferometer with frequency.
  • the parameter q is of course proportional to the frequency of light.
  • the relationship between transmission and q is represented by the so-called "Airy function".
  • Figure 5 also shows graphs of the first and second derivatives of the transmission versus q graph.
  • the best linearity of the transmission versus q is found at a point where the second derivative is zero.
  • the point where the second derivative of the relationship of transmission with q is zero is therefore preferably selected as the operating point for each interferometer.
  • the operating points are likely to be different for each interferometer as even a small change in size of the interferometers will influence the optimum position of the operating points.
  • An alternative operating point that can be used is to tune the interferometers so that the value of transmission at the operating point is 75% of the maximum value. This point is approximately the same as the point where the second derivative becomes zero.
  • the operating point may be adjusted by varying any of the parameters on which q depends.
  • the reference or measurement interferometer may be tuned to the operating point by adjusting the refractive index in the interferometer cavity or the spacing between the cavity's mirrors.
  • the wavelength of the light emitted by the light source may be adjusted to suit the intrinsic or adjusted operating point of the reference or measurement interferometer.
  • the reference interferometer may be configured to be unresponsive to variations in the physical parameter by isolating it from the physical parameter or by evacuating a cavity within the interferometer or by filling a cavity within the interferometer with a solid, light-transitive material, such as glass.
  • the measurement and/or reference interferometers are Fabry- Perot interferometers.
  • the measurement and/or reference interferometers may comprise a pair of spaced apart mirrors.
  • the mirrors may both be plane mirrors or curved mirrors or may comprise one plane and one curved mirror.
  • adjustment of the operating point can be achieved by adjusting the laser wavelength (for example, by adjusting the supply current to the laser).
  • a tuning mechanism may be provided for the other interferometer.
  • the device may further comprise a thermal tuning element for tuning the operating point of either the measurement or the reference interferometer.
  • a thermal tuning element for tuning the operating point of either the measurement or the reference interferometer. This makes use of a thermo-optic effect to adjust the refractive index of the optical medium in the measurement or reference interferometer thermally.
  • the device may further comprise a tuning electrode for tuning the operating point of either the measurement or the reference interferometer.
  • a tuning electrode for tuning the operating point of either the measurement or the reference interferometer.
  • an electro-optic effect e.g. a linear effect such as the Pockels effect or a non-linear effect such as the Kerr effect
  • an externally applied electric field e.g. a linear effect such as the Pockels effect or a non-linear effect such as the Kerr effect
  • the device may further comprise a liquid crystal tuning element disposed between either the measurement or the reference interferometer and its respective detector.
  • the device further comprises a light source controller adapted to cause the light source to emit light alternately at first and second wavelengths, the operating points of the measurement and reference interferometers being achieved at the first and second wavelengths respectively.
  • the reference and measurement interferometers are tuned to their operating points in each alternate cycle of operation by adjusting the wavelength of the light source. This may be achieved by adjusting the supply current to the light source, for example.
  • the device further comprises an optical isolator disposed between the light source and the reference interferometer, the optical isolator comprising a linear polariser and a quarter-wavelength plate.
  • the light source is a laser.
  • the laser may advantageously be a double-emitting laser, first and second emitted beams being coupled to the measurement and reference interferometers respectively.
  • the double-emitting laser allows a particularly compact structure to be produced.
  • the double-emitting laser is a double-sided emission laser diode arranged on a substrate between first and second layer structures, each forming one of the measurement and reference interferometers and each comprising two respective mirror layers spaced apart by respective spacer layers and detector layers distal from the substrate relative to the mirror layers.
  • the respective spacer layer for the reference interferometer will typically comprise a cavity between the two respective mirror layers, the cavity being acoustically coupled to the environment by an aperture in the spacer layer.
  • the first and second layer structures may each further comprise optical isolating layers disposed between the substrate and an innermost one of the respective mirror layers.
  • the optical isolators typically comprise a linear polariser and a quarter-wavelength plate.
  • the first and second layer structures may each further comprise a lens disposed between the substrate and an innermost one of the respective mirror layers.
  • the lens may be disposed between the optical isolating layers and the innermost one of the respective mirror layers.
  • the detector layers may each comprise a respective photodetector.
  • the signal processor further comprises an adaptive equaliser to equalise the average amplitude of the respective output generated by the detectors over an equalisation time period. This ensures that the noise is properly cancelled even if the light power received by the two detectors varies for some reason.
  • an optical microphone comprising a device according to the first aspect of the invention, wherein the measurement interferometer is acoustically coupled with the environment, the reference interferometer is acoustically isolated from the environment, and the physical parameter is air pressure.
  • the "acoustic isolation" of the reference interferometer may be achieved either by decoupling it from variations in air pressure (e.g. by not allowing fluid communication between the cavity of the reference interferometer and the environment) or by making use of a solid interferometer, which naturally is decoupled from variations in air pressure.
  • This microphone is particularly suited for mobile communications applications having a high SNR and being very compact.
  • the measurement interferometer is acoustically coupled with its environment by an aperture in a cavity of the measurement interferometer.
  • Figure 1 shows a schematic representation of a device according to the invention
  • Figure 2 shows a schematic representation of an optical microphone
  • Figures 3a and 3b show cross-sections through a measurement interferometer in the optical microphone of Figure 2;
  • Figure 4 shows a cross-section through a layer structure by which such an optical microphone can be made
  • Figure 5 shows the transmission function of an interferometer.
  • Figure 1 shows a laser source 1 , for example a laser diode, which emits light that passes through an optical isolator 2 to a reference Fabry-Perot interferometer or etalon 3.
  • the reference Fabry-Perot etalon 3 acts as a frequency discriminator. It can either be a solid etalon or an evacuated etalon or an air-spaced etalon isolated from the surrounding environment.
  • Tuning electrodes 4 are disposed adjacent the reference Fabry-Perot etalon 3 and are used to influence its transmission characteristics in a way that a favorable operating point is established. This operating point usually is the inflexion point of the transmission function of the reference Fabry-Perot etalon 3. These electrodes 4 influence the transmission characteristics by way of an electro-optic or thermo-optical effect. Alternatively, thin film resistors or Peltier elements can be used in place of the tuning electrodes 4. These make use of a thermal or thermo-optical effect to change the transmission characteristics of the reference Fabry-Perot etalon 3 thermally.
  • Another way to change the transmission characteristics of the reference Fabry-Perot etalon 3 makes use of a liquid crystal 5. This element may be placed either inside or outside the reference Fabry-Perot etalon 3.
  • the tuning electrodes 4 may also be replaced by a piezo-electric element deformable by electric current, which will in turn deform the reference Fabry-Perot etalon 3.
  • the liquid crystal 5, if used may be replaced by an electrically-deformable lens.
  • an optical isolator 2 is used between the laser source 1 and the reference Fabry-Perot etalon 3.
  • This isolator 2 is a combination of a linear polarising filter and a quarter wave plate.
  • the emerging light from the reference Fabry-Perot etalon 3 is detected by a photodetector 6, for example a PIN diode.
  • the light from the laser source 1 is also incident on a measurement Fabry-Perot etalon 7, which is influenced by changes in a physical parameter (for example, air pressure).
  • a physical parameter for example, air pressure
  • the exact manner in which the measurement Fabry-Perot etalon 7 is caused to interact with the environment so as to be influenced by the physical parameter will depend on the nature of the physical parameter. In the case of air pressure, the measurement Fabry-Perot etalon 7 will simply have a cavity that is coupled to the air through an aperture. This will become clearer below.
  • the emerging light from the measurement Fabry-Perot etalon 7 is also detected by a photodetector (not shown), for example a PIN diode.
  • the output signal from this photodetector will depend on the fluctuations in the physical parameter to be measured and on noise from the laser source 1 .
  • a difference signal between the output signal from this photodetector and the output signal from photodetector 6 is generated by a difference amplifier 8. By this means, common mode laser noise from laser source 1 is cancelled.
  • the difference amplifier 8 In order to dynamically adjust the DC levels from both the reference path (i.e. through reference Fabry-Perot etalon 3 and photodetector 6) and the measurement path (i.e. through measurement Fabry-Perot etalon 7 and its photodetector), the difference amplifier 8 has a preceding gain stage where both output signals are dynamically adjusted with a long time constant.
  • the light from laser source 1 may be caused to impinge on both etalons 3, 7 by way of a beam splitter.
  • a double-sided emission laser source may be used.
  • the tuning electrodes 4 and liquid crystal 5 are omitted.
  • the laser source 1 is operated in pulses, alternating between the measurement path and the reference path such that successive pulses are incident on one or the other (but not both) of the reference and measurement Fabry-Perot etalons 3, 7.
  • the operating point can be set by adjusting the current of the laser source 1 power supply. Even if the transmission peaks of the measurement Fabry-Perot etalon 7 do not correspond to the transmission peaks of the reference Fabry-Perot etalon 3, the ideal operating point for both etalons 3, 7 can be obtained due to the sequential mode of operation.
  • the laser source 1 current is adjusted for one etalon 3, 7, and during the successive cycle, the laser source 1 current is adjusted for the other etalon 3, 7.
  • Noise cancellation is still carried out by difference amplifier 8 after detection by the photodetectors.
  • the switching mode is less effective for laser noise cancellation than the continuous mode using the tuning electrodes 4 or liquid crystal 5.
  • computer simulation has shown that 1/f noise can be successfully canceled nevertheless. It does have the advantage of allowing a more compact device to be constructed (due to the omission of tuning electrodes 4 and liquid crystal 5) and having a lower overall power consumption.
  • this embodiment works by generating a noise signal (representing the noise from laser source 1 ) using a reference Fabry-Perot etalon 3 and subtracting this noise signal from the signal generated using a measurement Fabry-Perot etalon 7 to improve the measurement Fabry-Perot etalon's 7 SNR.
  • Both etalons 3, 7 should preferably be operated at the inflexion points of their respective transmission functions. At this point, a linear relationship between the physical parameter being measured and light output and a linear relationship between frequency noise and light output is achieved.
  • the slope steepness of the etalons 3, 7 can be adjusted by choice of mirror reflectivity and mirror distance in a way that the physical parameter being measured and the frequency noise are not generating amplitudes which would move too far away from the ideal operating point (i.e. the inflexion points of the periodic transmission functions).
  • frequency and phase fluctuations in the laser source 1 are prevented from impairing the performance of the device, and it is possible to reach the quantum or shot noise limit, even when laser source 1 is an unstabilised laser diode.
  • Figure 2 shows an optical microphone based on the same priniciple as the embodiment of Figure 1 .
  • the optical microphone of Figure 2 has the significant advantage that it can be manufactured without any moving parts, such as a membrane typically required in conventional miniature microphones. It therefore has a compact size and is very robust.
  • the influence of the tuning elements (8) is intensified because of the small distance between them.
  • the tuning mechanism may be proportional to the electric field which, in turn, is proportional to the distance between the electrodes (8).
  • Laser light emitted from a laser source 10 (e.g. a PIN diode) is incident on an optical isolator consisting of a linear polarising filter 1 1 and a quarter wavelength plate 12. Thereafter, the light is coupled into a waveguide structure 13, which splits the light so that it is transmitted along a measurement path, whose main element is a measurement Fabry-Perot etalon 14, and a reference path, whose main element is a reference Fabry-Perot etalon formed by two mirrors 15a, 15b.
  • a laser source 10 e.g. a PIN diode
  • Tapered waveguide structures 16a, 16b are provided to couple the waveguide structure 13 into the measurement Fabry-Perot etalon 14. These ensure efficient coupling into the measurement Fabry-Perot etalon 14.
  • the tapering reduces the divergence of the light emerging from the waveguide structure 13. The reduction of divergence occurs in the dimension parallel to the plane of the substrate 23, typically Lithium Niobate, on which the optical microphone is built.
  • the reference cavity can be tuned by tuning electrodes 17 or thin film resistors in the same manner as described with the embodiment of Figure 1 .
  • the measurement Fabry-Perot etalon 14 can be realised in two different ways shown in Figures 3a and 3b.
  • a concentric mirror structure 21 for example, either a tube or a hollow core fibre
  • a plane parallel etalon is made by opposed parallel plane mirrors 22.
  • the laser source 10 can be operated in a pulsed switching mode as with the embodiment of Figure 1 .
  • Two different switching modes, based on two duty cycles of different lengths, are envisaged, allowing for high SNR and low SNR operation.
  • the current consumption is greatly reduced as the duty cycle is lower.
  • the optical microphone of Figure 2 It is possible to manufacture the optical microphone of Figure 2 using silicon on insulator (SOI) techniques.
  • SOI silicon on insulator
  • a major advantage of the waveguide structure 13 is the possibility to integrate the reference path so that it has small physical dimensions; the reference Fabry-Perot etalon may have dimensions of typically 1 ⁇ to 1 mm (length) and 1 ⁇ (width).
  • the measurement Fabry-Perot etalon 14 is acoustically coupled to the environment (e.g. air). This is done by making a hole in the measurement Fabry-Perot etalon 14, which provides fluid communication between an air-filled cavity in the measurement Fabry-Perot etalon 14 with the surrounding air.
  • variations in air pressure (such as caused by an acoustic wave) are coupled to the air-filled cavity and influence the refractive index within the cavity, which is detected as a variation in light intensity at photodetector 19.
  • a laser diode with double-sided emission 30 embedded in a substrate 31 is employed.
  • This laser diode 30 can be a vertical cavity surface- emitting laser (VCSEL).
  • VCSEL vertical cavity surface- emitting laser
  • the VCSEL can either be modified by partial removal of the substrate to allow light to be emitted from both the front and the rear sides, or, a double-sided emission can be specially manufactured by omitting part of the substrate.
  • Another device that can be used (again, either by modification or special manufacture) for double-sided emission is a distributed feedback (DFB) laser diode.
  • DFB distributed feedback
  • the layers of the stack can consist of glass, polymer, silicon or other dielectric layers, depending on the wavelength of light emitted by laser diode 30 and the desired mechanical processing properties. Also a combination of materials in the stack is possible. The layers may be combined using bonding, gluing or other technologies.
  • the reference path consists of the following elements (in order of transition): an optical isolating layer 32, collimating lens 33 with anti-reflection coating 53, first mirror 34 of a reference Fabry-Perot etalon, a spacer element 35, second mirror 36 of reference Fabry-Perot etalon, and photodetector 37 embedded in substrate 38.
  • the reference Fabry-Perot etalon is thus fabricated from first and second mirrors 34, 36 and the spacer element 35, which spaces the two mirror 34, 36 apart.
  • Each of the mirrors 34, 36 is provided with anti- reflection coatings 39a, 39b, 40a, 40b.
  • the measurement path is similar in construction. It consists of the following elements (in order of transition): an optical isolating layer 41 , collimating lens 42 with anti-reflection coating 43, first mirror 44 of a measurement Fabry-Perot etalon, a spacer element 45, second mirror 46 of measurement Fabry-Perot etalon, and photodetector 47 embedded in substrate 48.
  • the measurement Fabry-Perot etalon is thus fabricated from first and second mirrors 44, 46 and the spacer element 45, which spaces the two mirror 44, 46 apart.
  • Each of the mirrors 44, 46 is provided with anti-reflection coatings 49a, 49b, 50a, 50b.
  • the spacer element 45 has an opening or aperture 51 by way of which the air in cavity 52 is coupled to the environment.
  • the pressure of the air in cavity 52 is therefore influenced by pressure changes in the environment. This in turn effects the optical transmission characteristics of the measurement Fabry-Perot etalon, and variations in air pressure will be detected as variations in output signal from photodetector 47.
  • the device responds to an acoustic wave and acts as a microphone.
  • tuning electrodes 53a, 53b are used. The manner in which these work is the same as tuning electrodes 4 described with reference to the embodiment of Figure 1 .
  • the resulting layer structure results in a very compact optical microphone and the two light beams lie on the same spatial axis. Both aspects are favorable for a cost-effective, mass producible miniature device. It is therefore very suitable for mobile communications applications.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

A device comprising measurement (7) and reference (3) interferometers is disclosed. Each interferometer is configured to receive light from the same light source (1) and to emit light to respective detectors (6) and has a respective operating point. The measurement interferometer (7) is configured to respond to variations in a physical parameter by varying the intensity of light emitted, whereas the reference interferometer (3) is configured to be unresponsive to variations in the physical parameter. The device further comprises a signal processor for generating a differential output signal depending on respective output signals generated by the detectors (6).

Description

OPTICAL SENSOR
Field of Invention
The invention relates to a device comprising a measurement interferometer, which can be used to form an optical sensor. It also relates to a layer structure from which the device can be built and to an optical microphone comprising the device.
Background of Invention
Various types of optical sensor make use of interferometers to detect changes in a physical parameter. In such sensors, light from a laser is coupled into an interferometer, which is influenced by changes in the physical parameter to produce corresponding changes in the interference pattern. These changes in the interference pattern manifest as changes in intensity, which can be detected by a photodetector.
Various different physical parameters can be used to cause a change in the interference pattern and hence can be sensed by this type of sensor. Examples include pressure (including air pressure), strain and displacement.
The signal-to-noise ratio (SNR) of such sensors is often limited by noise caused by fluctuations in intensity or frequency of the light output from the laser. There are various methods for stabilising laser frequency. For example, one method makes use of a Fabry-Perot interferometer or etalon to generate an error signal. The etalon converts frequency fluctuations into intensity fluctuations, which can be detected by a photodetector. The resulting photocurrent is used as a feedback signal, which can either act on the laser supply current or move a cavity mirror, for example, to correct the frequency fluctuations.
However, this kind of arrangement is bulky and expensive. It is incompatible with many applications where use of optical sensors would be desirable. For example, in mobile communication devices, microphones are required that are highly stable and resistant to shock, insusceptible to wind noise. These features can all be provided by an optical microphone making use of a laser light source and interferometer since these do not have moving parts, such as a membrane. However, it is also required that such microphones are compact and have a high SNR. Whilst the stabilisation technique referred to above can compensate for laser frequency noise to a certain extent, it cannot compensate of relative intensity noise.
Summary of Invention
According to the invention, there is provided a device comprising measurement and reference interferometers, each configured to receive light from the same light source and to emit light to respective detectors and having a respective operating point, wherein the measurement interferometer is configured to respond to variations in a physical parameter by varying the intensity of light emitted, whereas the reference interferometer is configured to be unresponsive to variations in the physical parameter, the device further comprising a signal processor for generating a differential output signal depending on respective output signals generated by the detectors.
Light from the same light source is coupled into both a reference interferometer that is insensitive or unresponsive to variations in a physical parameter to be sensed and into a measurement interferometer that is responsive to such variations. Therefore, both interferometers will be affected by fluctuations in the light from the light source, but only the measurement interferometer will be influenced by changes in the physical parameter; the reference interferometer is isolated from these changes. The interference pattern in the reference interferometer thus represents the noise from the light source only as does the signal from its respective detector. This signal can be used to compensate for noise from the light source in the signal from the measurement interferometer's respective detector, such that the signal represents changes in the physical parameter only. The SNR is therefore increased, and furthermore, the device may be made to be very compact since the only additional component required is the reference interferometer. The operating point of each of the reference and measurement interferometer is selected to achieve a linear variation of the transmission of the interferometer with frequency. Figure 5 shows a graph of the transmission (normalised to a maximum value of 1 ) against a parameter "q", where q=4nnd/A (n is refractive index in the interferometer cavity; d is the spacing between the interferometer mirrors; and λ is the wavelength of light). The parameter q is of course proportional to the frequency of light. The relationship between transmission and q is represented by the so-called "Airy function". Figure 5 also shows graphs of the first and second derivatives of the transmission versus q graph. The best linearity of the transmission versus q is found at a point where the second derivative is zero. The point where the second derivative of the relationship of transmission with q is zero is therefore preferably selected as the operating point for each interferometer.
The operating points are likely to be different for each interferometer as even a small change in size of the interferometers will influence the optimum position of the operating points.
An alternative operating point that can be used is to tune the interferometers so that the value of transmission at the operating point is 75% of the maximum value. This point is approximately the same as the point where the second derivative becomes zero.
The operating point may be adjusted by varying any of the parameters on which q depends. Thus, the reference or measurement interferometer may be tuned to the operating point by adjusting the refractive index in the interferometer cavity or the spacing between the cavity's mirrors. Also, the wavelength of the light emitted by the light source may be adjusted to suit the intrinsic or adjusted operating point of the reference or measurement interferometer.
The reference interferometer may be configured to be unresponsive to variations in the physical parameter by isolating it from the physical parameter or by evacuating a cavity within the interferometer or by filling a cavity within the interferometer with a solid, light-transitive material, such as glass.
Typically, the measurement and/or reference interferometers are Fabry- Perot interferometers. The measurement and/or reference interferometers may comprise a pair of spaced apart mirrors. The mirrors may both be plane mirrors or curved mirrors or may comprise one plane and one curved mirror.
For one of the interferometers, adjustment of the operating point can be achieved by adjusting the laser wavelength (for example, by adjusting the supply current to the laser). For the other interferometer, a tuning mechanism may be provided.
Thus, the device may further comprise a thermal tuning element for tuning the operating point of either the measurement or the reference interferometer. This makes use of a thermo-optic effect to adjust the refractive index of the optical medium in the measurement or reference interferometer thermally.
The device may further comprise a tuning electrode for tuning the operating point of either the measurement or the reference interferometer. This makes use of an electro-optic effect (e.g. a linear effect such as the Pockels effect or a non-linear effect such as the Kerr effect) to adjust the refractive index of the optical medium in the measurement or reference interferometer by an externally applied electric field.
The device may further comprise a liquid crystal tuning element disposed between either the measurement or the reference interferometer and its respective detector.
In one embodiment, the device further comprises a light source controller adapted to cause the light source to emit light alternately at first and second wavelengths, the operating points of the measurement and reference interferometers being achieved at the first and second wavelengths respectively. In this way, the reference and measurement interferometers are tuned to their operating points in each alternate cycle of operation by adjusting the wavelength of the light source. This may be achieved by adjusting the supply current to the light source, for example. Thus, it is possible to omit any additional tuning elements when using this "pulsed mode" of operation.
Typically, the device further comprises an optical isolator disposed between the light source and the reference interferometer, the optical isolator comprising a linear polariser and a quarter-wavelength plate. Preferably, the light source is a laser.
The laser may advantageously be a double-emitting laser, first and second emitted beams being coupled to the measurement and reference interferometers respectively.
The use of a double-emitting laser allows a particularly compact structure to be produced. In this embodiment, the double-emitting laser is a double-sided emission laser diode arranged on a substrate between first and second layer structures, each forming one of the measurement and reference interferometers and each comprising two respective mirror layers spaced apart by respective spacer layers and detector layers distal from the substrate relative to the mirror layers.
The respective spacer layer for the reference interferometer will typically comprise a cavity between the two respective mirror layers, the cavity being acoustically coupled to the environment by an aperture in the spacer layer.
The first and second layer structures may each further comprise optical isolating layers disposed between the substrate and an innermost one of the respective mirror layers. The optical isolators typically comprise a linear polariser and a quarter-wavelength plate.
The first and second layer structures may each further comprise a lens disposed between the substrate and an innermost one of the respective mirror layers. The lens may be disposed between the optical isolating layers and the innermost one of the respective mirror layers.
The detector layers may each comprise a respective photodetector.
Typically the signal processor further comprises an adaptive equaliser to equalise the average amplitude of the respective output generated by the detectors over an equalisation time period. This ensures that the noise is properly cancelled even if the light power received by the two detectors varies for some reason.
In accordance with a second aspect of the invention, there is provided an optical microphone comprising a device according to the first aspect of the invention, wherein the measurement interferometer is acoustically coupled with the environment, the reference interferometer is acoustically isolated from the environment, and the physical parameter is air pressure. The "acoustic isolation" of the reference interferometer may be achieved either by decoupling it from variations in air pressure (e.g. by not allowing fluid communication between the cavity of the reference interferometer and the environment) or by making use of a solid interferometer, which naturally is decoupled from variations in air pressure.
This microphone is particularly suited for mobile communications applications having a high SNR and being very compact.
Typically, the measurement interferometer is acoustically coupled with its environment by an aperture in a cavity of the measurement interferometer.
Brief Description of the Drawings
Examples of the invention will now be described in detail with reference to the accompanying drawings, in which:
Figure 1 shows a schematic representation of a device according to the invention;
Figure 2 shows a schematic representation of an optical microphone;
Figures 3a and 3b show cross-sections through a measurement interferometer in the optical microphone of Figure 2;
Figure 4 shows a cross-section through a layer structure by which such an optical microphone can be made; and
Figure 5 shows the transmission function of an interferometer.
Detailed Description of the Drawings
Figure 1 shows a laser source 1 , for example a laser diode, which emits light that passes through an optical isolator 2 to a reference Fabry-Perot interferometer or etalon 3. The reference Fabry-Perot etalon 3 acts as a frequency discriminator. It can either be a solid etalon or an evacuated etalon or an air-spaced etalon isolated from the surrounding environment.
Tuning electrodes 4 are disposed adjacent the reference Fabry-Perot etalon 3 and are used to influence its transmission characteristics in a way that a favorable operating point is established. This operating point usually is the inflexion point of the transmission function of the reference Fabry-Perot etalon 3. These electrodes 4 influence the transmission characteristics by way of an electro-optic or thermo-optical effect. Alternatively, thin film resistors or Peltier elements can be used in place of the tuning electrodes 4. These make use of a thermal or thermo-optical effect to change the transmission characteristics of the reference Fabry-Perot etalon 3 thermally.
Another way to change the transmission characteristics of the reference Fabry-Perot etalon 3 makes use of a liquid crystal 5. This element may be placed either inside or outside the reference Fabry-Perot etalon 3.
The tuning electrodes 4 may also be replaced by a piezo-electric element deformable by electric current, which will in turn deform the reference Fabry-Perot etalon 3. Similarly, the liquid crystal 5, if used, may be replaced by an electrically-deformable lens. However, in some applications (such as an optical microphone) it is best to refrain from using mechanically deformable elements.
To prevent the laser source 1 from being effected by optical feedback, an optical isolator 2 is used between the laser source 1 and the reference Fabry-Perot etalon 3. This isolator 2 is a combination of a linear polarising filter and a quarter wave plate.
The emerging light from the reference Fabry-Perot etalon 3 is detected by a photodetector 6, for example a PIN diode.
The light from the laser source 1 is also incident on a measurement Fabry-Perot etalon 7, which is influenced by changes in a physical parameter (for example, air pressure). The exact manner in which the measurement Fabry-Perot etalon 7 is caused to interact with the environment so as to be influenced by the physical parameter will depend on the nature of the physical parameter. In the case of air pressure, the measurement Fabry-Perot etalon 7 will simply have a cavity that is coupled to the air through an aperture. This will become clearer below. The emerging light from the measurement Fabry-Perot etalon 7 is also detected by a photodetector (not shown), for example a PIN diode. The output signal from this photodetector will depend on the fluctuations in the physical parameter to be measured and on noise from the laser source 1 . A difference signal between the output signal from this photodetector and the output signal from photodetector 6 is generated by a difference amplifier 8. By this means, common mode laser noise from laser source 1 is cancelled. In order to dynamically adjust the DC levels from both the reference path (i.e. through reference Fabry-Perot etalon 3 and photodetector 6) and the measurement path (i.e. through measurement Fabry-Perot etalon 7 and its photodetector), the difference amplifier 8 has a preceding gain stage where both output signals are dynamically adjusted with a long time constant.
The light from laser source 1 may be caused to impinge on both etalons 3, 7 by way of a beam splitter. Alternatively, a double-sided emission laser source may be used.
In an alternative switching mode, the tuning electrodes 4 and liquid crystal 5 are omitted. The laser source 1 is operated in pulses, alternating between the measurement path and the reference path such that successive pulses are incident on one or the other (but not both) of the reference and measurement Fabry-Perot etalons 3, 7. In this switching mode, the operating point can be set by adjusting the current of the laser source 1 power supply. Even if the transmission peaks of the measurement Fabry-Perot etalon 7 do not correspond to the transmission peaks of the reference Fabry-Perot etalon 3, the ideal operating point for both etalons 3, 7 can be obtained due to the sequential mode of operation. During one cycle, the laser source 1 current is adjusted for one etalon 3, 7, and during the successive cycle, the laser source 1 current is adjusted for the other etalon 3, 7.
Noise cancellation is still carried out by difference amplifier 8 after detection by the photodetectors. The switching mode is less effective for laser noise cancellation than the continuous mode using the tuning electrodes 4 or liquid crystal 5. However, computer simulation has shown that 1/f noise can be successfully canceled nevertheless. It does have the advantage of allowing a more compact device to be constructed (due to the omission of tuning electrodes 4 and liquid crystal 5) and having a lower overall power consumption.
As can be seen, this embodiment works by generating a noise signal (representing the noise from laser source 1 ) using a reference Fabry-Perot etalon 3 and subtracting this noise signal from the signal generated using a measurement Fabry-Perot etalon 7 to improve the measurement Fabry-Perot etalon's 7 SNR. Both etalons 3, 7 should preferably be operated at the inflexion points of their respective transmission functions. At this point, a linear relationship between the physical parameter being measured and light output and a linear relationship between frequency noise and light output is achieved. The slope steepness of the etalons 3, 7 can be adjusted by choice of mirror reflectivity and mirror distance in a way that the physical parameter being measured and the frequency noise are not generating amplitudes which would move too far away from the ideal operating point (i.e. the inflexion points of the periodic transmission functions). Using this embodiment, frequency and phase fluctuations in the laser source 1 are prevented from impairing the performance of the device, and it is possible to reach the quantum or shot noise limit, even when laser source 1 is an unstabilised laser diode.
Figure 2 shows an optical microphone based on the same priniciple as the embodiment of Figure 1 . The optical microphone of Figure 2 has the significant advantage that it can be manufactured without any moving parts, such as a membrane typically required in conventional miniature microphones. It therefore has a compact size and is very robust.
Furthermore, the influence of the tuning elements (8) is intensified because of the small distance between them. For instance, the tuning mechanism may be proportional to the electric field which, in turn, is proportional to the distance between the electrodes (8).
Laser light emitted from a laser source 10 (e.g. a PIN diode) is incident on an optical isolator consisting of a linear polarising filter 1 1 and a quarter wavelength plate 12. Thereafter, the light is coupled into a waveguide structure 13, which splits the light so that it is transmitted along a measurement path, whose main element is a measurement Fabry-Perot etalon 14, and a reference path, whose main element is a reference Fabry-Perot etalon formed by two mirrors 15a, 15b.
Tapered waveguide structures 16a, 16b are provided to couple the waveguide structure 13 into the measurement Fabry-Perot etalon 14. These ensure efficient coupling into the measurement Fabry-Perot etalon 14. The tapering reduces the divergence of the light emerging from the waveguide structure 13. The reduction of divergence occurs in the dimension parallel to the plane of the substrate 23, typically Lithium Niobate, on which the optical microphone is built.
The reference cavity can be tuned by tuning electrodes 17 or thin film resistors in the same manner as described with the embodiment of Figure 1 .
Light emitted from the reference and measurement 14 Fabry-Perot etalons is incident on respective photodetectors 18, 19 and the difference signal is obtained by a difference amplifier 20.
The measurement Fabry-Perot etalon 14 can be realised in two different ways shown in Figures 3a and 3b. In Figure 3a, a concentric mirror structure 21 (for example, either a tube or a hollow core fibre) is used. In Figure 3b, a plane parallel etalon is made by opposed parallel plane mirrors 22.
The laser source 10 can be operated in a pulsed switching mode as with the embodiment of Figure 1 . Two different switching modes, based on two duty cycles of different lengths, are envisaged, allowing for high SNR and low SNR operation. In the low SNR operational mode, the current consumption is greatly reduced as the duty cycle is lower.
It is possible to manufacture the optical microphone of Figure 2 using silicon on insulator (SOI) techniques. A major advantage of the waveguide structure 13 is the possibility to integrate the reference path so that it has small physical dimensions; the reference Fabry-Perot etalon may have dimensions of typically 1 μιτι to 1 mm (length) and 1 μιτι (width).
In order to act as a microphone, the measurement Fabry-Perot etalon 14 is acoustically coupled to the environment (e.g. air). This is done by making a hole in the measurement Fabry-Perot etalon 14, which provides fluid communication between an air-filled cavity in the measurement Fabry-Perot etalon 14 with the surrounding air. Thus, variations in air pressure (such as caused by an acoustic wave) are coupled to the air-filled cavity and influence the refractive index within the cavity, which is detected as a variation in light intensity at photodetector 19.
One possible way of making an optical microphone similar to that of Figure 2 (although without the waveguide structure) is illustrated in Figure 4. This is a stacked or layer structure design, in which several thin optical layers and elements are stacked in contact with each other. Consequently, a compact and robust sensor is obtained. In order to omit the waveguide beam splitter used in Figure 2, a laser diode with double-sided emission 30 embedded in a substrate 31 is employed. This laser diode 30 can be a vertical cavity surface- emitting laser (VCSEL). The VCSEL can either be modified by partial removal of the substrate to allow light to be emitted from both the front and the rear sides, or, a double-sided emission can be specially manufactured by omitting part of the substrate. Another device that can be used (again, either by modification or special manufacture) for double-sided emission is a distributed feedback (DFB) laser diode.
The layers of the stack can consist of glass, polymer, silicon or other dielectric layers, depending on the wavelength of light emitted by laser diode 30 and the desired mechanical processing properties. Also a combination of materials in the stack is possible. The layers may be combined using bonding, gluing or other technologies.
One of the emerging laser beams is incident on a reference path; the other laser beam, emitted from the opposite side is incident on a measurement path. The reference path consists of the following elements (in order of transition): an optical isolating layer 32, collimating lens 33 with anti-reflection coating 53, first mirror 34 of a reference Fabry-Perot etalon, a spacer element 35, second mirror 36 of reference Fabry-Perot etalon, and photodetector 37 embedded in substrate 38. The reference Fabry-Perot etalon is thus fabricated from first and second mirrors 34, 36 and the spacer element 35, which spaces the two mirror 34, 36 apart. Each of the mirrors 34, 36 is provided with anti- reflection coatings 39a, 39b, 40a, 40b.
The measurement path is similar in construction. It consists of the following elements (in order of transition): an optical isolating layer 41 , collimating lens 42 with anti-reflection coating 43, first mirror 44 of a measurement Fabry-Perot etalon, a spacer element 45, second mirror 46 of measurement Fabry-Perot etalon, and photodetector 47 embedded in substrate 48. The measurement Fabry-Perot etalon is thus fabricated from first and second mirrors 44, 46 and the spacer element 45, which spaces the two mirror 44, 46 apart. Each of the mirrors 44, 46 is provided with anti-reflection coatings 49a, 49b, 50a, 50b.
The spacer element 45 has an opening or aperture 51 by way of which the air in cavity 52 is coupled to the environment. The pressure of the air in cavity 52 is therefore influenced by pressure changes in the environment. This in turn effects the optical transmission characteristics of the measurement Fabry-Perot etalon, and variations in air pressure will be detected as variations in output signal from photodetector 47. Thus, the device responds to an acoustic wave and acts as a microphone.
To influence the transmission characteristic of the reference cavity, tuning electrodes 53a, 53b are used. The manner in which these work is the same as tuning electrodes 4 described with reference to the embodiment of Figure 1 .
The resulting layer structure results in a very compact optical microphone and the two light beams lie on the same spatial axis. Both aspects are favorable for a cost-effective, mass producible miniature device. It is therefore very suitable for mobile communications applications.
Other variations to the disclosed embodiments can be understood and effected by those skilled in the art in practising the claimed invention, from a study of the drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other elements or steps, and the indefinite article "a" or "an" does not exclude a plurality. A single processor or other unit may fulfill the functions of several items recited in the claims. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage. Any reference signs in the claims should not be construed as limiting the scope.

Claims

1 . A device comprising measurement (7) and reference (3) interferometers, each configured to receive light from the same light source (1 ) and to emit light to respective detectors (6) and having a respective operating point, wherein the measurement interferometer (7) is configured to respond to variations in a physical parameter by varying the intensity of light emitted, whereas the reference interferometer (3) is configured to be unresponsive to variations in the physical parameter, the device further comprising a signal processor for generating a differential output signal depending on respective output signals generated by the detectors (6).
2. A device according to claim 1 , wherein the measurement (7) and/or reference (3) interferometers are Fabry-Perot interferometers.
3. A device according to claim 2, wherein the measurement (7) and/or reference (3) interferometers comprise a pair of spaced apart mirrors.
4. A device according to any of the preceding claims, further comprising a thermal tuning element for tuning the operating point of either the measurement (7) or the reference (3) interferometer.
5. A device according to any of the preceding claims, further comprising a tuning electrode (4) for tuning the operating point of either the measurement (7) or the reference (3) interferometer.
6. A device according to any of the preceding claims, further comprising a liquid crystal tuning element (5) disposed between either the measurement (7) or the reference interferometer (3) and its respective detector (6).
7. A device according to any of the preceding claims, further comprising a light source controller adapted to cause the light source (1 ) to emit light alternately at first and second wavelengths, the operating points of the measurement (7) and reference (3) interferometers being achieved at the first and second wavelengths respectively.
8 . A device according to any of the preceding claims, further comprising an optical isolator (2) disposed between the light source (1 ) and the reference interferometer (3), the optical isolator (2) comprising a linear polariser and a quarter-wavelength plate.
9. A device according to any of the preceding claims, wherein the light source (1 ) is a laser.
10. A device according to claim 9, wherein the laser is a double-emitting laser, first and second emitted beams being coupled to the measurement (7) and reference (3) interferometers respectively.
1 1 . A device according to claim 10, wherein the double-emitting laser is a double-sided emission laser diode arranged on a substrate between first and second layer structures, each forming one of the measurement (7) and reference (3) interferometers and each comprising two respective mirror layers spaced apart by respective spacer layers and detector layers distal from the substrate relative to the mirror layers.
12. A device according to any of the preceding claims, wherein the signal processor further comprises an adaptive equaliser to equalise the average amplitude of the respective output generated by the detectors (6) over an equalisation time period.
13. An optical microphone comprising a device according to any of the preceding claims, wherein the measurement interferometer (7) is acoustically coupled with the environment, the reference interferometer (3) is acoustically isolated from the environment, and the physical parameter is air pressure.
14. An optical microphone according to claim 10, wherein the measurement interferometer (7) is acoustically coupled with its environment by an aperture in a cavity of the measurement interferometer (7).
PCT/EP2012/059122 2011-05-16 2012-05-16 Optical sensor Ceased WO2012163681A1 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
EP12722142.2A EP2710335B8 (en) 2011-05-16 2012-05-16 Optical sensor
US14/117,445 US9417147B2 (en) 2011-05-16 2012-05-16 Optical sensor
CN201280022889.2A CN103562684B (en) 2011-05-16 2012-05-16 Optical pickocff
KR1020137030900A KR101926894B1 (en) 2011-05-16 2012-05-16 Optical sensor
JP2014510796A JP6120336B2 (en) 2011-05-16 2012-05-16 Light sensor

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP11166253.2 2011-05-16
EP11166253A EP2525194A1 (en) 2011-05-16 2011-05-16 Optical sensor

Publications (1)

Publication Number Publication Date
WO2012163681A1 true WO2012163681A1 (en) 2012-12-06

Family

ID=44588345

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2012/059122 Ceased WO2012163681A1 (en) 2011-05-16 2012-05-16 Optical sensor

Country Status (6)

Country Link
US (1) US9417147B2 (en)
EP (2) EP2525194A1 (en)
JP (1) JP6120336B2 (en)
KR (1) KR101926894B1 (en)
CN (1) CN103562684B (en)
WO (1) WO2012163681A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015163074A1 (en) * 2014-04-22 2015-10-29 シャープ株式会社 Optical sensor system, optical-type gas sensor system, microparticle sensor system, light-emitting device, and image printing device
EP3173781A1 (en) 2015-11-25 2017-05-31 Xarion Laser Acoustics GmbH Airborne ultrasound testing system for a test object

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10352911B2 (en) * 2008-09-12 2019-07-16 Balthasar Fischer Airborne ultrasound testing system for a test object
EP2525194A1 (en) * 2011-05-16 2012-11-21 Knowles Electronics Asia PTE. Ltd. Optical sensor
CN103809281B (en) * 2014-02-18 2016-05-11 苏州旭创科技有限公司 Optical standard tool and assemble method thereof
US10281391B2 (en) * 2015-06-05 2019-05-07 Luminit Llc Spectrally pure short-pulse laser
NO343314B1 (en) * 2015-11-29 2019-01-28 Tunable As Optical pressure sensor
DE102017205586A1 (en) 2017-04-03 2018-10-04 Robert Bosch Gmbh Punch riveting apparatus and method for monitoring a punch riveting apparatus
KR101979815B1 (en) * 2017-08-24 2019-05-23 송광섭 Optical Sensor
EP3677907A1 (en) * 2019-01-04 2020-07-08 Xarion Laser Acoustics GmbH Device and method for testing a test object
CN109827653A (en) * 2019-02-28 2019-05-31 曲阜师范大学 A kind of complete optical fiber vector microphone probe
US11378551B2 (en) 2019-05-01 2022-07-05 Northrop Grumman Systems Corporation Inspection devices with laser emitters and optical microphones, and related systems and methods
DE102019130696B4 (en) * 2019-11-14 2022-07-07 Carl Zeiss Smt Gmbh Device for measuring a substrate and method for correcting cyclic error components of an interferometer
EP3825678A1 (en) 2019-11-22 2021-05-26 Ams Ag Apparatus and method for detecting objects
CN114868404A (en) * 2020-02-25 2022-08-05 松下电器(美国)知识产权公司 Optical microphone
DE102020112494A1 (en) 2020-05-08 2021-11-11 Jenoptik Automatisierungstechnik Gmbh Process for the production of an airbag cover with a predetermined breaking line with a defined tear resistance
DE102020112495A1 (en) 2020-05-08 2021-11-11 Jenoptik Automatisierungstechnik Gmbh Method for testing an airbag cover with a predetermined breaking line with a defined tear resistance
CN114812627B (en) * 2021-01-18 2025-03-21 Tdk株式会社 Light detecting element, receiving device and light sensor device
CN114414529B (en) * 2021-12-07 2023-09-19 广东科学技术职业学院 Salinity detection method, computer device and computer-readable storage medium

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050146726A1 (en) * 2002-10-15 2005-07-07 Balakumar Balachandran Fiber tip based sensor system for measurements of pressure gradient, air particle velocity and acoustic intensity
US7224464B2 (en) * 1998-11-04 2007-05-29 Manning Christopher J Fourier-transform spectrometers
US20070165238A1 (en) * 2006-01-13 2007-07-19 Luna Innovations Incorporated Demodulation method and apparatus for fiber optic sensors

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1979000506A1 (en) * 1978-01-13 1979-08-09 Nat Res Dev Interferometer systems
JPH03146803A (en) * 1989-11-02 1991-06-21 Kowa Co Method and instrument for measuring distance
GB2314617B (en) * 1996-06-24 2000-08-23 Graviner Ltd Kidde High sensitivity gas detection
FR2765964A1 (en) * 1997-07-08 1999-01-15 Bertin & Cie Optical distance measuring system using precision interferometers
JPH1163914A (en) * 1997-08-15 1999-03-05 Nikon Corp Optical frequency domain reflected light distribution measuring device
CN100465595C (en) * 2000-04-24 2009-03-04 周晟 Phase difference measuring device and heterodyne interference measuring system using same
JP3605010B2 (en) * 2000-08-08 2004-12-22 株式会社ミツトヨ Surface texture measuring instrument
US7355723B2 (en) * 2006-03-02 2008-04-08 Symphony Acoustics, Inc. Apparatus comprising a high-signal-to-noise displacement sensor and method therefore
US7583390B2 (en) * 2006-03-02 2009-09-01 Symphony Acoustics, Inc. Accelerometer comprising an optically resonant cavity
WO2008086017A1 (en) * 2007-01-10 2008-07-17 Lightlab Imaging, Inc. Methods and apparatus for swept-source optical coherence tomography
US8007609B2 (en) * 2007-10-31 2011-08-30 Symphony Acoustics, Inc. Parallel plate arrangement and method of formation
JP5646337B2 (en) * 2007-11-05 2014-12-24 バイオセンサー,インコーポレーテッド Optical sensor for determining the concentration of an analyte
JP2009231316A (en) * 2008-03-19 2009-10-08 Nec Corp Ld module
KR101295941B1 (en) * 2008-09-12 2013-08-13 놀레스 일렉트로닉스 아시아 피티이 리미티드 Method, apparatus and computer readable storage medium for converting acoustic signals into electrical signals
GB0900705D0 (en) * 2009-01-16 2009-03-04 Univ Huddersfield Surface measurement system
CN101718520B (en) * 2009-11-16 2011-01-05 浙江大学 A Rapid Surface Quality Measurement System
EP2525194A1 (en) * 2011-05-16 2012-11-21 Knowles Electronics Asia PTE. Ltd. Optical sensor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7224464B2 (en) * 1998-11-04 2007-05-29 Manning Christopher J Fourier-transform spectrometers
US20050146726A1 (en) * 2002-10-15 2005-07-07 Balakumar Balachandran Fiber tip based sensor system for measurements of pressure gradient, air particle velocity and acoustic intensity
US20070165238A1 (en) * 2006-01-13 2007-07-19 Luna Innovations Incorporated Demodulation method and apparatus for fiber optic sensors

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015163074A1 (en) * 2014-04-22 2015-10-29 シャープ株式会社 Optical sensor system, optical-type gas sensor system, microparticle sensor system, light-emitting device, and image printing device
JPWO2015163074A1 (en) * 2014-04-22 2017-04-13 シャープ株式会社 Optical sensor system, optical gas sensor system, particulate sensor system, light emitting device, and image printing apparatus
US9874518B2 (en) 2014-04-22 2018-01-23 Sharp Kabushiki Kaisha Optical sensor system, optical gas sensor system, particulate sensor system, light emitting apparatus, and image printing apparatus
EP3173781A1 (en) 2015-11-25 2017-05-31 Xarion Laser Acoustics GmbH Airborne ultrasound testing system for a test object

Also Published As

Publication number Publication date
EP2710335A1 (en) 2014-03-26
CN103562684B (en) 2016-10-12
JP6120336B2 (en) 2017-04-26
JP2014515114A (en) 2014-06-26
EP2710335B1 (en) 2016-07-13
US9417147B2 (en) 2016-08-16
KR101926894B1 (en) 2018-12-07
CN103562684A (en) 2014-02-05
US20150139451A1 (en) 2015-05-21
EP2710335B8 (en) 2016-09-14
EP2525194A1 (en) 2012-11-21
KR20140040720A (en) 2014-04-03

Similar Documents

Publication Publication Date Title
EP2710335B1 (en) Optical sensor
US7359067B2 (en) Optical displacement sensor comprising a wavelength-tunable optical source
CN102150439B (en) Transducer system apparatus and method
US6594022B1 (en) Wavelength reference device
WO2003003082A1 (en) Optical displacement sensor
JP2002006238A (en) Hollow structure for Fabry-Perot resonator
EP3223540B1 (en) Optical microphone system
WO2007143362A2 (en) Improved displacement sensor
CA2665527A1 (en) Method and device for reducing laser phase noise
US6580516B1 (en) Tunable Fabry Perot microelectromechanical resonator adapted for optical filters and lasers with reduced optical power-dependent tuning
EP2389014A1 (en) Microphone
KR101979815B1 (en) Optical Sensor
Fischer et al. Sound recording by laser interferometry

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 12722142

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2014510796

Country of ref document: JP

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 14117445

Country of ref document: US

NENP Non-entry into the national phase

Ref country code: DE

ENP Entry into the national phase

Ref document number: 20137030900

Country of ref document: KR

Kind code of ref document: A

REEP Request for entry into the european phase

Ref document number: 2012722142

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 2012722142

Country of ref document: EP