WO2012163681A1 - Optical sensor - Google Patents
Optical sensor Download PDFInfo
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- WO2012163681A1 WO2012163681A1 PCT/EP2012/059122 EP2012059122W WO2012163681A1 WO 2012163681 A1 WO2012163681 A1 WO 2012163681A1 EP 2012059122 W EP2012059122 W EP 2012059122W WO 2012163681 A1 WO2012163681 A1 WO 2012163681A1
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- WO
- WIPO (PCT)
- Prior art keywords
- measurement
- interferometer
- interferometers
- laser
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L11/00—Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00
- G01L11/02—Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00 by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/266—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light by interferometric means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/21—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour by interference
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R23/00—Transducers other than those covered by groups H04R9/00 - H04R21/00
- H04R23/008—Transducers other than those covered by groups H04R9/00 - H04R21/00 using optical signals for detecting or generating sound
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/21—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour by interference
- G02F1/216—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour by interference using liquid crystals, e.g. liquid crystal Fabry-Perot filters
Definitions
- the invention relates to a device comprising a measurement interferometer, which can be used to form an optical sensor. It also relates to a layer structure from which the device can be built and to an optical microphone comprising the device.
- optical sensor make use of interferometers to detect changes in a physical parameter.
- light from a laser is coupled into an interferometer, which is influenced by changes in the physical parameter to produce corresponding changes in the interference pattern.
- These changes in the interference pattern manifest as changes in intensity, which can be detected by a photodetector.
- Various different physical parameters can be used to cause a change in the interference pattern and hence can be sensed by this type of sensor. Examples include pressure (including air pressure), strain and displacement.
- the signal-to-noise ratio (SNR) of such sensors is often limited by noise caused by fluctuations in intensity or frequency of the light output from the laser.
- SNR signal-to-noise ratio
- a device comprising measurement and reference interferometers, each configured to receive light from the same light source and to emit light to respective detectors and having a respective operating point, wherein the measurement interferometer is configured to respond to variations in a physical parameter by varying the intensity of light emitted, whereas the reference interferometer is configured to be unresponsive to variations in the physical parameter, the device further comprising a signal processor for generating a differential output signal depending on respective output signals generated by the detectors.
- both interferometers will be affected by fluctuations in the light from the light source, but only the measurement interferometer will be influenced by changes in the physical parameter; the reference interferometer is isolated from these changes.
- the interference pattern in the reference interferometer thus represents the noise from the light source only as does the signal from its respective detector. This signal can be used to compensate for noise from the light source in the signal from the measurement interferometer's respective detector, such that the signal represents changes in the physical parameter only.
- each of the reference and measurement interferometer is selected to achieve a linear variation of the transmission of the interferometer with frequency.
- the parameter q is of course proportional to the frequency of light.
- the relationship between transmission and q is represented by the so-called "Airy function".
- Figure 5 also shows graphs of the first and second derivatives of the transmission versus q graph.
- the best linearity of the transmission versus q is found at a point where the second derivative is zero.
- the point where the second derivative of the relationship of transmission with q is zero is therefore preferably selected as the operating point for each interferometer.
- the operating points are likely to be different for each interferometer as even a small change in size of the interferometers will influence the optimum position of the operating points.
- An alternative operating point that can be used is to tune the interferometers so that the value of transmission at the operating point is 75% of the maximum value. This point is approximately the same as the point where the second derivative becomes zero.
- the operating point may be adjusted by varying any of the parameters on which q depends.
- the reference or measurement interferometer may be tuned to the operating point by adjusting the refractive index in the interferometer cavity or the spacing between the cavity's mirrors.
- the wavelength of the light emitted by the light source may be adjusted to suit the intrinsic or adjusted operating point of the reference or measurement interferometer.
- the reference interferometer may be configured to be unresponsive to variations in the physical parameter by isolating it from the physical parameter or by evacuating a cavity within the interferometer or by filling a cavity within the interferometer with a solid, light-transitive material, such as glass.
- the measurement and/or reference interferometers are Fabry- Perot interferometers.
- the measurement and/or reference interferometers may comprise a pair of spaced apart mirrors.
- the mirrors may both be plane mirrors or curved mirrors or may comprise one plane and one curved mirror.
- adjustment of the operating point can be achieved by adjusting the laser wavelength (for example, by adjusting the supply current to the laser).
- a tuning mechanism may be provided for the other interferometer.
- the device may further comprise a thermal tuning element for tuning the operating point of either the measurement or the reference interferometer.
- a thermal tuning element for tuning the operating point of either the measurement or the reference interferometer. This makes use of a thermo-optic effect to adjust the refractive index of the optical medium in the measurement or reference interferometer thermally.
- the device may further comprise a tuning electrode for tuning the operating point of either the measurement or the reference interferometer.
- a tuning electrode for tuning the operating point of either the measurement or the reference interferometer.
- an electro-optic effect e.g. a linear effect such as the Pockels effect or a non-linear effect such as the Kerr effect
- an externally applied electric field e.g. a linear effect such as the Pockels effect or a non-linear effect such as the Kerr effect
- the device may further comprise a liquid crystal tuning element disposed between either the measurement or the reference interferometer and its respective detector.
- the device further comprises a light source controller adapted to cause the light source to emit light alternately at first and second wavelengths, the operating points of the measurement and reference interferometers being achieved at the first and second wavelengths respectively.
- the reference and measurement interferometers are tuned to their operating points in each alternate cycle of operation by adjusting the wavelength of the light source. This may be achieved by adjusting the supply current to the light source, for example.
- the device further comprises an optical isolator disposed between the light source and the reference interferometer, the optical isolator comprising a linear polariser and a quarter-wavelength plate.
- the light source is a laser.
- the laser may advantageously be a double-emitting laser, first and second emitted beams being coupled to the measurement and reference interferometers respectively.
- the double-emitting laser allows a particularly compact structure to be produced.
- the double-emitting laser is a double-sided emission laser diode arranged on a substrate between first and second layer structures, each forming one of the measurement and reference interferometers and each comprising two respective mirror layers spaced apart by respective spacer layers and detector layers distal from the substrate relative to the mirror layers.
- the respective spacer layer for the reference interferometer will typically comprise a cavity between the two respective mirror layers, the cavity being acoustically coupled to the environment by an aperture in the spacer layer.
- the first and second layer structures may each further comprise optical isolating layers disposed between the substrate and an innermost one of the respective mirror layers.
- the optical isolators typically comprise a linear polariser and a quarter-wavelength plate.
- the first and second layer structures may each further comprise a lens disposed between the substrate and an innermost one of the respective mirror layers.
- the lens may be disposed between the optical isolating layers and the innermost one of the respective mirror layers.
- the detector layers may each comprise a respective photodetector.
- the signal processor further comprises an adaptive equaliser to equalise the average amplitude of the respective output generated by the detectors over an equalisation time period. This ensures that the noise is properly cancelled even if the light power received by the two detectors varies for some reason.
- an optical microphone comprising a device according to the first aspect of the invention, wherein the measurement interferometer is acoustically coupled with the environment, the reference interferometer is acoustically isolated from the environment, and the physical parameter is air pressure.
- the "acoustic isolation" of the reference interferometer may be achieved either by decoupling it from variations in air pressure (e.g. by not allowing fluid communication between the cavity of the reference interferometer and the environment) or by making use of a solid interferometer, which naturally is decoupled from variations in air pressure.
- This microphone is particularly suited for mobile communications applications having a high SNR and being very compact.
- the measurement interferometer is acoustically coupled with its environment by an aperture in a cavity of the measurement interferometer.
- Figure 1 shows a schematic representation of a device according to the invention
- Figure 2 shows a schematic representation of an optical microphone
- Figures 3a and 3b show cross-sections through a measurement interferometer in the optical microphone of Figure 2;
- Figure 4 shows a cross-section through a layer structure by which such an optical microphone can be made
- Figure 5 shows the transmission function of an interferometer.
- Figure 1 shows a laser source 1 , for example a laser diode, which emits light that passes through an optical isolator 2 to a reference Fabry-Perot interferometer or etalon 3.
- the reference Fabry-Perot etalon 3 acts as a frequency discriminator. It can either be a solid etalon or an evacuated etalon or an air-spaced etalon isolated from the surrounding environment.
- Tuning electrodes 4 are disposed adjacent the reference Fabry-Perot etalon 3 and are used to influence its transmission characteristics in a way that a favorable operating point is established. This operating point usually is the inflexion point of the transmission function of the reference Fabry-Perot etalon 3. These electrodes 4 influence the transmission characteristics by way of an electro-optic or thermo-optical effect. Alternatively, thin film resistors or Peltier elements can be used in place of the tuning electrodes 4. These make use of a thermal or thermo-optical effect to change the transmission characteristics of the reference Fabry-Perot etalon 3 thermally.
- Another way to change the transmission characteristics of the reference Fabry-Perot etalon 3 makes use of a liquid crystal 5. This element may be placed either inside or outside the reference Fabry-Perot etalon 3.
- the tuning electrodes 4 may also be replaced by a piezo-electric element deformable by electric current, which will in turn deform the reference Fabry-Perot etalon 3.
- the liquid crystal 5, if used may be replaced by an electrically-deformable lens.
- an optical isolator 2 is used between the laser source 1 and the reference Fabry-Perot etalon 3.
- This isolator 2 is a combination of a linear polarising filter and a quarter wave plate.
- the emerging light from the reference Fabry-Perot etalon 3 is detected by a photodetector 6, for example a PIN diode.
- the light from the laser source 1 is also incident on a measurement Fabry-Perot etalon 7, which is influenced by changes in a physical parameter (for example, air pressure).
- a physical parameter for example, air pressure
- the exact manner in which the measurement Fabry-Perot etalon 7 is caused to interact with the environment so as to be influenced by the physical parameter will depend on the nature of the physical parameter. In the case of air pressure, the measurement Fabry-Perot etalon 7 will simply have a cavity that is coupled to the air through an aperture. This will become clearer below.
- the emerging light from the measurement Fabry-Perot etalon 7 is also detected by a photodetector (not shown), for example a PIN diode.
- the output signal from this photodetector will depend on the fluctuations in the physical parameter to be measured and on noise from the laser source 1 .
- a difference signal between the output signal from this photodetector and the output signal from photodetector 6 is generated by a difference amplifier 8. By this means, common mode laser noise from laser source 1 is cancelled.
- the difference amplifier 8 In order to dynamically adjust the DC levels from both the reference path (i.e. through reference Fabry-Perot etalon 3 and photodetector 6) and the measurement path (i.e. through measurement Fabry-Perot etalon 7 and its photodetector), the difference amplifier 8 has a preceding gain stage where both output signals are dynamically adjusted with a long time constant.
- the light from laser source 1 may be caused to impinge on both etalons 3, 7 by way of a beam splitter.
- a double-sided emission laser source may be used.
- the tuning electrodes 4 and liquid crystal 5 are omitted.
- the laser source 1 is operated in pulses, alternating between the measurement path and the reference path such that successive pulses are incident on one or the other (but not both) of the reference and measurement Fabry-Perot etalons 3, 7.
- the operating point can be set by adjusting the current of the laser source 1 power supply. Even if the transmission peaks of the measurement Fabry-Perot etalon 7 do not correspond to the transmission peaks of the reference Fabry-Perot etalon 3, the ideal operating point for both etalons 3, 7 can be obtained due to the sequential mode of operation.
- the laser source 1 current is adjusted for one etalon 3, 7, and during the successive cycle, the laser source 1 current is adjusted for the other etalon 3, 7.
- Noise cancellation is still carried out by difference amplifier 8 after detection by the photodetectors.
- the switching mode is less effective for laser noise cancellation than the continuous mode using the tuning electrodes 4 or liquid crystal 5.
- computer simulation has shown that 1/f noise can be successfully canceled nevertheless. It does have the advantage of allowing a more compact device to be constructed (due to the omission of tuning electrodes 4 and liquid crystal 5) and having a lower overall power consumption.
- this embodiment works by generating a noise signal (representing the noise from laser source 1 ) using a reference Fabry-Perot etalon 3 and subtracting this noise signal from the signal generated using a measurement Fabry-Perot etalon 7 to improve the measurement Fabry-Perot etalon's 7 SNR.
- Both etalons 3, 7 should preferably be operated at the inflexion points of their respective transmission functions. At this point, a linear relationship between the physical parameter being measured and light output and a linear relationship between frequency noise and light output is achieved.
- the slope steepness of the etalons 3, 7 can be adjusted by choice of mirror reflectivity and mirror distance in a way that the physical parameter being measured and the frequency noise are not generating amplitudes which would move too far away from the ideal operating point (i.e. the inflexion points of the periodic transmission functions).
- frequency and phase fluctuations in the laser source 1 are prevented from impairing the performance of the device, and it is possible to reach the quantum or shot noise limit, even when laser source 1 is an unstabilised laser diode.
- Figure 2 shows an optical microphone based on the same priniciple as the embodiment of Figure 1 .
- the optical microphone of Figure 2 has the significant advantage that it can be manufactured without any moving parts, such as a membrane typically required in conventional miniature microphones. It therefore has a compact size and is very robust.
- the influence of the tuning elements (8) is intensified because of the small distance between them.
- the tuning mechanism may be proportional to the electric field which, in turn, is proportional to the distance between the electrodes (8).
- Laser light emitted from a laser source 10 (e.g. a PIN diode) is incident on an optical isolator consisting of a linear polarising filter 1 1 and a quarter wavelength plate 12. Thereafter, the light is coupled into a waveguide structure 13, which splits the light so that it is transmitted along a measurement path, whose main element is a measurement Fabry-Perot etalon 14, and a reference path, whose main element is a reference Fabry-Perot etalon formed by two mirrors 15a, 15b.
- a laser source 10 e.g. a PIN diode
- Tapered waveguide structures 16a, 16b are provided to couple the waveguide structure 13 into the measurement Fabry-Perot etalon 14. These ensure efficient coupling into the measurement Fabry-Perot etalon 14.
- the tapering reduces the divergence of the light emerging from the waveguide structure 13. The reduction of divergence occurs in the dimension parallel to the plane of the substrate 23, typically Lithium Niobate, on which the optical microphone is built.
- the reference cavity can be tuned by tuning electrodes 17 or thin film resistors in the same manner as described with the embodiment of Figure 1 .
- the measurement Fabry-Perot etalon 14 can be realised in two different ways shown in Figures 3a and 3b.
- a concentric mirror structure 21 for example, either a tube or a hollow core fibre
- a plane parallel etalon is made by opposed parallel plane mirrors 22.
- the laser source 10 can be operated in a pulsed switching mode as with the embodiment of Figure 1 .
- Two different switching modes, based on two duty cycles of different lengths, are envisaged, allowing for high SNR and low SNR operation.
- the current consumption is greatly reduced as the duty cycle is lower.
- the optical microphone of Figure 2 It is possible to manufacture the optical microphone of Figure 2 using silicon on insulator (SOI) techniques.
- SOI silicon on insulator
- a major advantage of the waveguide structure 13 is the possibility to integrate the reference path so that it has small physical dimensions; the reference Fabry-Perot etalon may have dimensions of typically 1 ⁇ to 1 mm (length) and 1 ⁇ (width).
- the measurement Fabry-Perot etalon 14 is acoustically coupled to the environment (e.g. air). This is done by making a hole in the measurement Fabry-Perot etalon 14, which provides fluid communication between an air-filled cavity in the measurement Fabry-Perot etalon 14 with the surrounding air.
- variations in air pressure (such as caused by an acoustic wave) are coupled to the air-filled cavity and influence the refractive index within the cavity, which is detected as a variation in light intensity at photodetector 19.
- a laser diode with double-sided emission 30 embedded in a substrate 31 is employed.
- This laser diode 30 can be a vertical cavity surface- emitting laser (VCSEL).
- VCSEL vertical cavity surface- emitting laser
- the VCSEL can either be modified by partial removal of the substrate to allow light to be emitted from both the front and the rear sides, or, a double-sided emission can be specially manufactured by omitting part of the substrate.
- Another device that can be used (again, either by modification or special manufacture) for double-sided emission is a distributed feedback (DFB) laser diode.
- DFB distributed feedback
- the layers of the stack can consist of glass, polymer, silicon or other dielectric layers, depending on the wavelength of light emitted by laser diode 30 and the desired mechanical processing properties. Also a combination of materials in the stack is possible. The layers may be combined using bonding, gluing or other technologies.
- the reference path consists of the following elements (in order of transition): an optical isolating layer 32, collimating lens 33 with anti-reflection coating 53, first mirror 34 of a reference Fabry-Perot etalon, a spacer element 35, second mirror 36 of reference Fabry-Perot etalon, and photodetector 37 embedded in substrate 38.
- the reference Fabry-Perot etalon is thus fabricated from first and second mirrors 34, 36 and the spacer element 35, which spaces the two mirror 34, 36 apart.
- Each of the mirrors 34, 36 is provided with anti- reflection coatings 39a, 39b, 40a, 40b.
- the measurement path is similar in construction. It consists of the following elements (in order of transition): an optical isolating layer 41 , collimating lens 42 with anti-reflection coating 43, first mirror 44 of a measurement Fabry-Perot etalon, a spacer element 45, second mirror 46 of measurement Fabry-Perot etalon, and photodetector 47 embedded in substrate 48.
- the measurement Fabry-Perot etalon is thus fabricated from first and second mirrors 44, 46 and the spacer element 45, which spaces the two mirror 44, 46 apart.
- Each of the mirrors 44, 46 is provided with anti-reflection coatings 49a, 49b, 50a, 50b.
- the spacer element 45 has an opening or aperture 51 by way of which the air in cavity 52 is coupled to the environment.
- the pressure of the air in cavity 52 is therefore influenced by pressure changes in the environment. This in turn effects the optical transmission characteristics of the measurement Fabry-Perot etalon, and variations in air pressure will be detected as variations in output signal from photodetector 47.
- the device responds to an acoustic wave and acts as a microphone.
- tuning electrodes 53a, 53b are used. The manner in which these work is the same as tuning electrodes 4 described with reference to the embodiment of Figure 1 .
- the resulting layer structure results in a very compact optical microphone and the two light beams lie on the same spatial axis. Both aspects are favorable for a cost-effective, mass producible miniature device. It is therefore very suitable for mobile communications applications.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Signal Processing (AREA)
- Optics & Photonics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
Description
Claims
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP12722142.2A EP2710335B8 (en) | 2011-05-16 | 2012-05-16 | Optical sensor |
| US14/117,445 US9417147B2 (en) | 2011-05-16 | 2012-05-16 | Optical sensor |
| CN201280022889.2A CN103562684B (en) | 2011-05-16 | 2012-05-16 | Optical pickocff |
| KR1020137030900A KR101926894B1 (en) | 2011-05-16 | 2012-05-16 | Optical sensor |
| JP2014510796A JP6120336B2 (en) | 2011-05-16 | 2012-05-16 | Light sensor |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP11166253.2 | 2011-05-16 | ||
| EP11166253A EP2525194A1 (en) | 2011-05-16 | 2011-05-16 | Optical sensor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2012163681A1 true WO2012163681A1 (en) | 2012-12-06 |
Family
ID=44588345
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2012/059122 Ceased WO2012163681A1 (en) | 2011-05-16 | 2012-05-16 | Optical sensor |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9417147B2 (en) |
| EP (2) | EP2525194A1 (en) |
| JP (1) | JP6120336B2 (en) |
| KR (1) | KR101926894B1 (en) |
| CN (1) | CN103562684B (en) |
| WO (1) | WO2012163681A1 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015163074A1 (en) * | 2014-04-22 | 2015-10-29 | シャープ株式会社 | Optical sensor system, optical-type gas sensor system, microparticle sensor system, light-emitting device, and image printing device |
| EP3173781A1 (en) | 2015-11-25 | 2017-05-31 | Xarion Laser Acoustics GmbH | Airborne ultrasound testing system for a test object |
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| US10352911B2 (en) * | 2008-09-12 | 2019-07-16 | Balthasar Fischer | Airborne ultrasound testing system for a test object |
| EP2525194A1 (en) * | 2011-05-16 | 2012-11-21 | Knowles Electronics Asia PTE. Ltd. | Optical sensor |
| CN103809281B (en) * | 2014-02-18 | 2016-05-11 | 苏州旭创科技有限公司 | Optical standard tool and assemble method thereof |
| US10281391B2 (en) * | 2015-06-05 | 2019-05-07 | Luminit Llc | Spectrally pure short-pulse laser |
| NO343314B1 (en) * | 2015-11-29 | 2019-01-28 | Tunable As | Optical pressure sensor |
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Also Published As
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| EP2710335A1 (en) | 2014-03-26 |
| CN103562684B (en) | 2016-10-12 |
| JP6120336B2 (en) | 2017-04-26 |
| JP2014515114A (en) | 2014-06-26 |
| EP2710335B1 (en) | 2016-07-13 |
| US9417147B2 (en) | 2016-08-16 |
| KR101926894B1 (en) | 2018-12-07 |
| CN103562684A (en) | 2014-02-05 |
| US20150139451A1 (en) | 2015-05-21 |
| EP2710335B8 (en) | 2016-09-14 |
| EP2525194A1 (en) | 2012-11-21 |
| KR20140040720A (en) | 2014-04-03 |
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