[go: up one dir, main page]

US5378341A - Conical magnetron sputter source - Google Patents

Conical magnetron sputter source Download PDF

Info

Publication number
US5378341A
US5378341A US08/135,827 US13582793A US5378341A US 5378341 A US5378341 A US 5378341A US 13582793 A US13582793 A US 13582793A US 5378341 A US5378341 A US 5378341A
Authority
US
United States
Prior art keywords
conical
target electrode
electrode
conical target
magnetron sputter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
US08/135,827
Inventor
Alvin J. Drehman
William M. Hale
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
United States Department of the Air Force
Original Assignee
United States Department of the Air Force
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United States Department of the Air Force filed Critical United States Department of the Air Force
Priority to US08/135,827 priority Critical patent/US5378341A/en
Assigned to UNITED STATES OF AMERICA, THE, AS REPRESENTED BY THE UNITED STATES AIR FORCE reassignment UNITED STATES OF AMERICA, THE, AS REPRESENTED BY THE UNITED STATES AIR FORCE ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: DREHMAN, ALVIN J.
Assigned to UNITED STATES AIR FORCE reassignment UNITED STATES AIR FORCE ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HALE, WILIAM M.
Application granted granted Critical
Publication of US5378341A publication Critical patent/US5378341A/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3438Electrodes other than cathode
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3414Targets
    • H01J37/342Hollow targets
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3441Dark space shields

Definitions

  • the present invention relates to devices for depositing thin films, and, in particular, relates to a sputtering source.
  • the sputtering apparatus may be an open-ended cathode and an anode structure in an evacuated chamber typically containing less than 1 Torr pressure of an ionizable gas.
  • a DC or RF source causes the target material to have a net negative charge (i.e., being the cathode) which pulls positively charged ions out of the plasma. These ions impact the target material causing atoms, ions and small (possibly ionized) atom clusters to be ejected from the target surface. This ejected material is free to move through the surrounding gas and deposit upon any surface that it encounters, in particular, a substrate material upon which this depositing material will form a film. This material deposits on a substrate located either within or outside of the sputtering source.
  • the cathode is a conical structure having a large opening toward the substrate so as to provide a relatively wide angle of emergence of the sputtered material.
  • the use of magnetic and electric fields provides additional control of the sputtering materials.
  • U.S. Pat. No. 4,842,703 uses magnetic and electric fields as well as a cathode structure having a flat bottom and conical sides for coating the substrate uniformly.
  • the angle of the conical sides from the vertical is very large.
  • the sputtering source of the present invention comprises a truncated conical target (cathode) with appropriate RF or DC feeds and cooling therein.
  • the application of an RF or DC potential therein creates a plasma which contains electrons and positive ions.
  • At the center of the sputtering source is a grounded anode.
  • a plurality of magnets are located about the conical electrode being made of the sputtering target material so that the magnetic field lines point to the anode. Because of the arrangement of the magnets and the target electrode material being only slightly inclined from the vertical, the magnetic field enhances the plasma within the cone of the target material which increases the number of ions which impact the target material per second.
  • one object of the present invention is to provide a conical magnetron sputter source which substantially eliminates the negative ion bombardment of the substrate to be coated.
  • Another object of the present invention is to provide a conical magnetron sputter source for use with materials that generate negative ions.
  • Another object of the present invention is to provide a conical magnetron sputter source for use in the deposition of thin films of high temperature superconducting oxide materials.
  • Another object of the present invention is to provide a conical sputter source having substantially known directional ability.
  • Another object of the present invention is to provide a conical electrode target for placement within the sputter source for reducing problems of machining and cooling.
  • FIG. 1 of the present invention illustrates by cross sectional view the conical magnetron sputter source.
  • FIG. 2 of the present invention illustrates the anode having a gas channel therethrough.
  • Sputter deposition of high-temperature superconducting oxide films is complicated by several problems such as providing adequate oxygen to the depositing film so that the desired crystalline phase can be formed, and avoiding bombardment of the depositing film by high energy ions and/or atoms, which changes the stoichiometry of the depositing film and further prevent the incorporation of adequate oxygen and formation of the desired phase.
  • providing adequate oxygen typically results in the creation of negative oxygen ions which are repelled from the negatively charged sputter target and bombard the film as it deposits on the substrate.
  • a conical magnetron sputter source 10 is shown.
  • the conical magnetron sputter source 10 is enclosed in a vacuum chamber, not shown, for the purpose of depositing a selected target material of a conical target electrode 12 onto a substrate 16 held over the sputter source 10 by holder 18.
  • the target material ejects both charged and neutral particles as a result of the bombardment of positive ions 22 which are accelerated toward it due to its net negative potential.
  • the negative potential is created by the DC or RF power source 24 which is applied to the target electrode 12 through the power and cooling feedthroughs 26 and a target electrode holder 42.
  • the applied DC or RF power also creates and maintains the plasma 23.
  • the negative ions or radicals 20, which are typically oxygen, are accelerated away from the target inner surface 54 towards the opposite surface 54 through the plasma and not toward the substrate 16.
  • Neutral atoms or clusters of atoms which are of low energy can diffuse out of the sputter source 10 toward the substrate 16.
  • No further illustration of the DC or RF power source 24, cooling source 28, or vacuum feedthroughs are shown.
  • the vacuum chamber maintains an operating pressure in the range from about 5 to 500 mTorr.
  • a grounded shield 32 is placed about the electrode 12 and has an opening 34 in a top 36 thereof. Mounted at a bottom 38 of the sputter source 10 is a grounded anode 40.
  • a plurality of magnets 43 are positioned above an insulator 46.
  • the fields from the magnets 43 are shown as 48 and 50. Since an inner surface 54 of the conical target electrode 12 is only slightly inclined from a vertical direction 52, in a preferred range of 1 to 20 degrees, the negative ions are not accelerated in the direction of the substrate 16.
  • the conical target electrode 12 is shown as a truncated cone with the inner surface 54 substantially parallel to an outer surface 56. This structure is mounted within the target holder 42 which further has the magnets 43 therein.
  • the target holder 42 has an inner surface 58 shaped to conform to the outer surface 56 of the conical electrode 12.
  • a clamp 60 pushes the conical target electrode 12 into the inner surface 59 of the target holder 42 for close contact thus insuring necessary cooling. This feature further minimizes machining requirements if the conical target electrode is made of a sintered material for use as a target material.
  • the anode 40 of FIG. 1 is shown having a gas channel 62 for inputting gas for the purposes of providing a net flux of gas out of the sputter source 10 to move the sputtered material toward the substrate 16 and providing a reactive gas such as oxygen in close proximity to the target electrode 12 and directed toward the substrate 16.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

The sputtering source of the present invention comprises a means for providing DC or RF power and cooling to a conical target electrode with magnets thereabout and anode at the bottom. At the center of the sputtering source is a grounded anode. A plurality of magnets which form rings are located behind the conical target electrode so that the magnetic field lines point to the anode. The conical target electrode has an inner surface which is slightly inclined from a centerline. The conical target electrode is concentrically located about the vertical centerline. A ground shield is placed about and above the magnets and the conical electrode and further acts to eliminate high energy ions from reaching the substrate because of the shape thereof. An opening in the shield allows for the exit of low energy particles of the target material sputtered from the conical target electrode. The sputtering source provides a narrow beam of target material for deposition on a substrate located at a distance from the source.

Description

STATEMENT OF GOVERNMENT INTEREST
The invention described herein may be manufactured and used by or for the Government for governmental purposes without the payment of any royalty thereon.
BACKGROUND OF THE INVENTION
The present invention relates to devices for depositing thin films, and, in particular, relates to a sputtering source.
The sputtering apparatus may be an open-ended cathode and an anode structure in an evacuated chamber typically containing less than 1 Torr pressure of an ionizable gas. A DC or RF source causes the target material to have a net negative charge (i.e., being the cathode) which pulls positively charged ions out of the plasma. These ions impact the target material causing atoms, ions and small (possibly ionized) atom clusters to be ejected from the target surface. This ejected material is free to move through the surrounding gas and deposit upon any surface that it encounters, in particular, a substrate material upon which this depositing material will form a film. This material deposits on a substrate located either within or outside of the sputtering source.
In one prior sputtering device, U.S. Pat. No. 4,060,470, the cathode is a conical structure having a large opening toward the substrate so as to provide a relatively wide angle of emergence of the sputtered material. The use of magnetic and electric fields provides additional control of the sputtering materials.
Another prior sputtering device, U.S. Pat. No. 4,842,703, uses magnetic and electric fields as well as a cathode structure having a flat bottom and conical sides for coating the substrate uniformly. The angle of the conical sides from the vertical is very large.
Another prior sputtering device, U.S. Pat. No. 4,100,055, uses a cathode having an outer, middle and inner portions to control the ions.
The following U.S. Patents are incorporated by reference: U.S. Pat. Nos. 5,194,131; 5,024,747; 4,909,314; 4,842,703; 4,834,860; 4,657;654; 4,673,480; 4,179,351; 4,100,055; and 4,060,470.
SUMMARY OF THE INVENTION
The sputtering source of the present invention comprises a truncated conical target (cathode) with appropriate RF or DC feeds and cooling therein. The application of an RF or DC potential therein creates a plasma which contains electrons and positive ions. At the center of the sputtering source is a grounded anode. A plurality of magnets are located about the conical electrode being made of the sputtering target material so that the magnetic field lines point to the anode. Because of the arrangement of the magnets and the target electrode material being only slightly inclined from the vertical, the magnetic field enhances the plasma within the cone of the target material which increases the number of ions which impact the target material per second.
In normal sputtering geometries one has the situation that if the target material ejects negatively charged ions or clusters or if the sputter gas contains any gasses which readily form into negative ions or radicals (such as oxygen), then these negatively charged particles will be accelerated away from the negatively charged target surface. Although these charged particles may become electrically neutral upon encountering the plasma, their kinetic energy can remain quite high. If such particles then strike the substrate, then they can in turn cause material to be ejected from the growing film and/or damage the growing film. In the present geometry, these negative particles are accelerated away from the target surface and toward another target surface and not toward the substrate.
Therefore, one object of the present invention is to provide a conical magnetron sputter source which substantially eliminates the negative ion bombardment of the substrate to be coated.
Another object of the present invention is to provide a conical magnetron sputter source for use with materials that generate negative ions.
Another object of the present invention is to provide a conical magnetron sputter source for use in the deposition of thin films of high temperature superconducting oxide materials.
Another object of the present invention is to provide a conical sputter source having substantially known directional ability.
Another object of the present invention is to provide a conical electrode target for placement within the sputter source for reducing problems of machining and cooling.
These and many other objects and advantages of the present invention will be readily apparent to one skilled in the pertinent art from the following detailed description of a preferred embodiment of the invention and the related drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 of the present invention illustrates by cross sectional view the conical magnetron sputter source.
FIG. 2 of the present invention illustrates the anode having a gas channel therethrough.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
Sputter deposition of high-temperature superconducting oxide films is complicated by several problems such as providing adequate oxygen to the depositing film so that the desired crystalline phase can be formed, and avoiding bombardment of the depositing film by high energy ions and/or atoms, which changes the stoichiometry of the depositing film and further prevent the incorporation of adequate oxygen and formation of the desired phase. Unfortunately, providing adequate oxygen typically results in the creation of negative oxygen ions which are repelled from the negatively charged sputter target and bombard the film as it deposits on the substrate.
Referring to FIG. 1, a conical magnetron sputter source 10 is shown. The conical magnetron sputter source 10 is enclosed in a vacuum chamber, not shown, for the purpose of depositing a selected target material of a conical target electrode 12 onto a substrate 16 held over the sputter source 10 by holder 18. In the present invention, the target material ejects both charged and neutral particles as a result of the bombardment of positive ions 22 which are accelerated toward it due to its net negative potential. The negative potential is created by the DC or RF power source 24 which is applied to the target electrode 12 through the power and cooling feedthroughs 26 and a target electrode holder 42. The applied DC or RF power also creates and maintains the plasma 23. The negative ions or radicals 20, which are typically oxygen, are accelerated away from the target inner surface 54 towards the opposite surface 54 through the plasma and not toward the substrate 16. Neutral atoms or clusters of atoms which are of low energy can diffuse out of the sputter source 10 toward the substrate 16. No further illustration of the DC or RF power source 24, cooling source 28, or vacuum feedthroughs are shown. In the present invention, the vacuum chamber maintains an operating pressure in the range from about 5 to 500 mTorr. A grounded shield 32 is placed about the electrode 12 and has an opening 34 in a top 36 thereof. Mounted at a bottom 38 of the sputter source 10 is a grounded anode 40. To enhance the plasma, reduce the target voltage and increase the deposition rate, a plurality of magnets 43 are positioned above an insulator 46. The fields from the magnets 43 are shown as 48 and 50. Since an inner surface 54 of the conical target electrode 12 is only slightly inclined from a vertical direction 52, in a preferred range of 1 to 20 degrees, the negative ions are not accelerated in the direction of the substrate 16.
The conical target electrode 12 is shown as a truncated cone with the inner surface 54 substantially parallel to an outer surface 56. This structure is mounted within the target holder 42 which further has the magnets 43 therein. The target holder 42 has an inner surface 58 shaped to conform to the outer surface 56 of the conical electrode 12. A clamp 60 pushes the conical target electrode 12 into the inner surface 59 of the target holder 42 for close contact thus insuring necessary cooling. This feature further minimizes machining requirements if the conical target electrode is made of a sintered material for use as a target material.
Referring to FIG. 2, the anode 40 of FIG. 1 is shown having a gas channel 62 for inputting gas for the purposes of providing a net flux of gas out of the sputter source 10 to move the sputtered material toward the substrate 16 and providing a reactive gas such as oxygen in close proximity to the target electrode 12 and directed toward the substrate 16.
Clearly, many modifications and variations of the present invention are possible in light of the above teachings and it is therefore understood, that within the inventive scope of the inventive concept, the invention may be practiced otherwise than specifically claimed.

Claims (6)

What is claimed is:
1. A magnetron sputter source, said magnetron sputter source for use in a thin film deposition apparatus, said source trapping substantially negative ions within said source, said magnetron sputter source comprising:
means for applying DC or RF power for creating a plasma and for applying a net negative potential;
means for applying cooling;
a conical target electrode, said conical target electrode being made of a selected target material, said target material to be deposited on a substrate outside of said magnetron sputter source, said conical target electrode having a shape of a truncated cone, said conical target electrode having a top opening and a bottom opening, said top opening being larger than said bottom opening, said conical target electrode having a centerline therethrough, said conical target electrode having an inner surface and an outer surface, said inner surface being inclined at an angle of about 1 to 20 degrees to said centerline, said means for applying a net negative potential connected to said conical electrode, said means for applying power creating a plasma in the proximity of said conical target electrode, said means for applying cooling maintaining said conical target electrode in a desired temperature range;
means for holding said conical target electrode, said means for holding having an inner surface therein, said inner surface being substantially conformal to said outer surface of said conical target electrode;
means for generating a magnetic field, said means for generating a magnetic field having a north pole located near said top opening of said conical target electrode and a south pole located near said bottom opening of said conical target electrode, said means for holding having said means for generating a magnetic field mounted therein whereby said field points to said bottom opening;
means for clamping said conical target electrode within said means for holding;
an anode, said anode being positioned on said centerline of said conical target electrode, said anode being located at said bottom opening of said conical target electrode, said anode adapted to have a ground voltage applied thereto; and
a shield, said shield being positioned about said means for holding, said means for clamping, and said target conical electrode, said shield having a center opening therein for the passage of target material, means for mounting a substrate for receiving said target material located substantially outside of said opening, said shield adapted to being biased to a ground voltage.
2. A magnetron sputter source as defined in claim 1 wherein said conical target electrode is a sintered material for use in the deposition of a thin film of superconducting material.
3. A magnetron sputter source as defined in claim 1 wherein said anode at said bottom of said bottom opening of said conical target electrode forms a ground plane.
4. A magnetron sputter source as defined in claim 3 wherein said anode further includes a gas channel therethrough for the purposes of moving the sputtering target material to said substrate and providing a reactive gas.
5. A magnetron sputter source as defined in claim 1 wherein said means for generating a magnetic field comprise a plurality of permanent magnets.
6. A magnetron sputter source as defined in claim 1 wherein said shield opening is congruent with said top opening in said conical target electrode.
US08/135,827 1993-10-13 1993-10-13 Conical magnetron sputter source Expired - Fee Related US5378341A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US08/135,827 US5378341A (en) 1993-10-13 1993-10-13 Conical magnetron sputter source

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/135,827 US5378341A (en) 1993-10-13 1993-10-13 Conical magnetron sputter source

Publications (1)

Publication Number Publication Date
US5378341A true US5378341A (en) 1995-01-03

Family

ID=22469882

Family Applications (1)

Application Number Title Priority Date Filing Date
US08/135,827 Expired - Fee Related US5378341A (en) 1993-10-13 1993-10-13 Conical magnetron sputter source

Country Status (1)

Country Link
US (1) US5378341A (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5728280A (en) * 1996-02-23 1998-03-17 Balzers Prozess Systeme Gmbh Apparatus for coating substrates by cathode sputtering with a hollow target
EP0853330A3 (en) * 1997-01-14 2000-10-04 Applied Materials, Inc. Ionized PVD source to produce uniform low-particle deposition
US6342134B1 (en) 2000-02-11 2002-01-29 Agere Systems Guardian Corp. Method for producing piezoelectric films with rotating magnetron sputtering system
US20050115827A1 (en) * 2003-09-25 2005-06-02 Anelva Corporation Multi-cathode ionized physical vapor deposition system
US20050150457A1 (en) * 2004-01-13 2005-07-14 Anelva Corporation Plasma-Assisted Sputter Deposition System
GB2440256A (en) * 2004-01-13 2008-01-23 Anelva Corp Plasma assisted sputter deposition.
US20090078685A1 (en) * 2007-09-21 2009-03-26 Industrial Technology Research Institute Plasma head and plasma-discharging device using the same
US20140072721A1 (en) * 2011-03-14 2014-03-13 Southwall Europe Gmbh Method for Modifying a Surface of a Substrate using Ion Bombardment
US20150028002A1 (en) * 2013-07-25 2015-01-29 Hypertherm, Inc. Devices for Gas Cooling Plasma Arc Torches and Related Systems and Methods
CN109881166A (en) * 2016-03-30 2019-06-14 京浜乐梦金属科技株式会社 Sputtering cathode, sputtering apparatus, and method for producing film-forming body
US20230029343A1 (en) * 2021-07-20 2023-01-26 Canon Kabushiki Kaisha Sputtering apparatus, film formation method, and method for manufacturing product
US20240194464A1 (en) * 2022-12-09 2024-06-13 Intevac, Inc. Stable ground anode for thin film processing
US20240194462A1 (en) * 2021-04-30 2024-06-13 Soichi Ogawa Sputtering apparatus

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4060470A (en) * 1974-12-06 1977-11-29 Clarke Peter J Sputtering apparatus and method
US4100055A (en) * 1977-06-10 1978-07-11 Varian Associates, Inc. Target profile for sputtering apparatus
US4179351A (en) * 1976-09-09 1979-12-18 Hewlett-Packard Company Cylindrical magnetron sputtering source
US4472259A (en) * 1981-10-29 1984-09-18 Materials Research Corporation Focusing magnetron sputtering apparatus
JPS61183467A (en) * 1985-02-08 1986-08-16 Hitachi Ltd Sputtering electrode
US4622121A (en) * 1984-04-19 1986-11-11 Balzers Aktiengesellschaft Apparatus for coating materials by cathode sputtering
US4657654A (en) * 1984-05-17 1987-04-14 Varian Associates, Inc. Targets for magnetron sputter device having separate confining magnetic fields to separate targets subject to separate discharges
US4673480A (en) * 1980-05-16 1987-06-16 Varian Associates, Inc. Magnetically enhanced sputter source
US4810347A (en) * 1988-03-21 1989-03-07 Eaton Corporation Penning type cathode for sputter coating
US4834860A (en) * 1987-07-01 1989-05-30 The Boc Group, Inc. Magnetron sputtering targets
US4842703A (en) * 1988-02-23 1989-06-27 Eaton Corporation Magnetron cathode and method for sputter coating
US4909314A (en) * 1979-12-21 1990-03-20 Varian Associates, Inc. Apparatus for thermal treatment of a wafer in an evacuated environment
US5024747A (en) * 1979-12-21 1991-06-18 Varian Associates, Inc. Wafer coating system
US5135634A (en) * 1991-02-14 1992-08-04 Sputtered Films, Inc. Apparatus for depositing a thin layer of sputtered atoms on a member
US5194131A (en) * 1991-08-16 1993-03-16 Varian Associates, Inc. Apparatus and method for multiple ring sputtering from a single target

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4060470A (en) * 1974-12-06 1977-11-29 Clarke Peter J Sputtering apparatus and method
US4179351A (en) * 1976-09-09 1979-12-18 Hewlett-Packard Company Cylindrical magnetron sputtering source
US4100055A (en) * 1977-06-10 1978-07-11 Varian Associates, Inc. Target profile for sputtering apparatus
US4909314A (en) * 1979-12-21 1990-03-20 Varian Associates, Inc. Apparatus for thermal treatment of a wafer in an evacuated environment
US5024747A (en) * 1979-12-21 1991-06-18 Varian Associates, Inc. Wafer coating system
US4673480A (en) * 1980-05-16 1987-06-16 Varian Associates, Inc. Magnetically enhanced sputter source
US4472259A (en) * 1981-10-29 1984-09-18 Materials Research Corporation Focusing magnetron sputtering apparatus
US4622121A (en) * 1984-04-19 1986-11-11 Balzers Aktiengesellschaft Apparatus for coating materials by cathode sputtering
US4657654A (en) * 1984-05-17 1987-04-14 Varian Associates, Inc. Targets for magnetron sputter device having separate confining magnetic fields to separate targets subject to separate discharges
JPS61183467A (en) * 1985-02-08 1986-08-16 Hitachi Ltd Sputtering electrode
US4834860A (en) * 1987-07-01 1989-05-30 The Boc Group, Inc. Magnetron sputtering targets
US4842703A (en) * 1988-02-23 1989-06-27 Eaton Corporation Magnetron cathode and method for sputter coating
US4810347A (en) * 1988-03-21 1989-03-07 Eaton Corporation Penning type cathode for sputter coating
US5135634A (en) * 1991-02-14 1992-08-04 Sputtered Films, Inc. Apparatus for depositing a thin layer of sputtered atoms on a member
US5194131A (en) * 1991-08-16 1993-03-16 Varian Associates, Inc. Apparatus and method for multiple ring sputtering from a single target

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5728280A (en) * 1996-02-23 1998-03-17 Balzers Prozess Systeme Gmbh Apparatus for coating substrates by cathode sputtering with a hollow target
EP0853330A3 (en) * 1997-01-14 2000-10-04 Applied Materials, Inc. Ionized PVD source to produce uniform low-particle deposition
US6342134B1 (en) 2000-02-11 2002-01-29 Agere Systems Guardian Corp. Method for producing piezoelectric films with rotating magnetron sputtering system
US20050115827A1 (en) * 2003-09-25 2005-06-02 Anelva Corporation Multi-cathode ionized physical vapor deposition system
US20050150457A1 (en) * 2004-01-13 2005-07-14 Anelva Corporation Plasma-Assisted Sputter Deposition System
FR2880632A1 (en) * 2004-01-13 2006-07-14 Anelva Corp PLASMA-BASED CATHODIC SPRAY DEPOSITION SYSTEM
GB2440256A (en) * 2004-01-13 2008-01-23 Anelva Corp Plasma assisted sputter deposition.
US7625472B2 (en) 2004-01-13 2009-12-01 Canon Anelva Corporation Plasma-assisted sputter deposition system
US20090078685A1 (en) * 2007-09-21 2009-03-26 Industrial Technology Research Institute Plasma head and plasma-discharging device using the same
US20140072721A1 (en) * 2011-03-14 2014-03-13 Southwall Europe Gmbh Method for Modifying a Surface of a Substrate using Ion Bombardment
US20150028002A1 (en) * 2013-07-25 2015-01-29 Hypertherm, Inc. Devices for Gas Cooling Plasma Arc Torches and Related Systems and Methods
US9144148B2 (en) 2013-07-25 2015-09-22 Hypertherm, Inc. Devices for gas cooling plasma arc torches and related systems and methods
US10716199B2 (en) * 2013-07-25 2020-07-14 Hypertherm, Inc. Devices for gas cooling plasma arc torches and related systems and methods
CN109881166A (en) * 2016-03-30 2019-06-14 京浜乐梦金属科技株式会社 Sputtering cathode, sputtering apparatus, and method for producing film-forming body
US10692708B2 (en) * 2016-03-30 2020-06-23 Keihin Ramtech Co., Ltd. Sputtering cathode, sputtering device, and method for producing film-formed body
EP3438322B1 (en) * 2016-03-30 2022-05-25 Keihin Ramtech Co., Ltd. Sputtering device, and method for producing film-formed body
US20240194462A1 (en) * 2021-04-30 2024-06-13 Soichi Ogawa Sputtering apparatus
US20230029343A1 (en) * 2021-07-20 2023-01-26 Canon Kabushiki Kaisha Sputtering apparatus, film formation method, and method for manufacturing product
US12205805B2 (en) * 2021-07-20 2025-01-21 Canon Kabushiki Kaisha Sputtering apparatus, film formation method, and method for manufacturing product
US20240194464A1 (en) * 2022-12-09 2024-06-13 Intevac, Inc. Stable ground anode for thin film processing

Similar Documents

Publication Publication Date Title
KR100572573B1 (en) Ionization sputtering apparatus
JP3603024B2 (en) Ionization physical vapor deposition method and apparatus therefor
JP3397786B2 (en) Magnetron sputter ion plating
CA2326202C (en) Method and apparatus for deposition of biaxially textured coatings
US6197165B1 (en) Method and apparatus for ionized physical vapor deposition
US4381453A (en) System and method for deflecting and focusing a broad ion beam
US6238537B1 (en) Ion assisted deposition source
JPH07268622A (en) Microwave plasma sticking source
US5378341A (en) Conical magnetron sputter source
US4662977A (en) Neutral particle surface alteration
US6042706A (en) Ionized PVD source to produce uniform low-particle deposition
KR100532805B1 (en) Apparatus and method for depositing a film on a substrate
US6103070A (en) Powered shield source for high density plasma
US4716340A (en) Pre-ionization aided sputter gun
JP3094050B2 (en) Magnetron sputtering device and sputtering gun
JPS6330986B2 (en)
KR100326503B1 (en) Apparatus and method for DC reactive plasma vapor deposition of electrically insulating material using shielded auxiliary anode
US20090020415A1 (en) "Iontron" ion beam deposition source and a method for sputter deposition of different layers using this source
EP0047456B1 (en) Ion plating without the introduction of gas
US6682634B1 (en) Apparatus for sputter deposition
KR20000038224A (en) High frequency sputtering device and thin film formation method using same
JP3562595B2 (en) Sputtering equipment
US6432286B1 (en) Conical sputtering target
JP2001164360A (en) Dc sputtering system
Takeuchi et al. A compact ion source using a hollow cathode discharge and its application to thin film formation

Legal Events

Date Code Title Description
AS Assignment

Owner name: UNITED STATES OF AMERICA, THE, AS REPRESENTED BY T

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:DREHMAN, ALVIN J.;REEL/FRAME:006924/0740

Effective date: 19930927

AS Assignment

Owner name: UNITED STATES AIR FORCE, VIRGINIA

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:HALE, WILIAM M.;REEL/FRAME:007088/0485

Effective date: 19940209

FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

FPAY Fee payment

Year of fee payment: 4

REMI Maintenance fee reminder mailed
LAPS Lapse for failure to pay maintenance fees
STCH Information on status: patent discontinuation

Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362

FP Lapsed due to failure to pay maintenance fee

Effective date: 20030103