US20020021149A1 - Input buffer circuit for transforming pseudo differential signals into full differential signals - Google Patents
Input buffer circuit for transforming pseudo differential signals into full differential signals Download PDFInfo
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- US20020021149A1 US20020021149A1 US09/899,223 US89922301A US2002021149A1 US 20020021149 A1 US20020021149 A1 US 20020021149A1 US 89922301 A US89922301 A US 89922301A US 2002021149 A1 US2002021149 A1 US 2002021149A1
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- output node
- current source
- buffer circuit
- input buffer
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
- H03K3/356—Bistable circuits
- H03K3/356104—Bistable circuits using complementary field-effect transistors
- H03K3/356113—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit
- H03K3/35613—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit the input circuit having a differential configuration
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/01—Modifications for accelerating switching
- H03K19/017—Modifications for accelerating switching in field-effect transistor circuits
- H03K19/01707—Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits
- H03K19/01721—Modifications for accelerating switching in field-effect transistor circuits in asynchronous circuits by means of a pull-up or down element
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/0185—Coupling arrangements; Interface arrangements using field effect transistors only
- H03K19/018507—Interface arrangements
- H03K19/018521—Interface arrangements of complementary type, e.g. CMOS
- H03K19/018528—Interface arrangements of complementary type, e.g. CMOS with at least one differential stage
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
- H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
- H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage
Definitions
- the present invention relates to a semiconductor integrated circuit. More particularly, the present invention relates to an input buffer circuit employed for a memory or a data processing system.
- An input buffer circuit forms an input portion of a differential comparator, and the differential comparator has the functions of sampling a difference between two input signals during a specific clock period, and storing/transmitting the difference value. If the input buffer circuit of the differential comparator is used for a memory, the input signals are from a flash cell and a reference cell, and the output signals are fed to a differential input latch, which is a next stage. If the input buffer circuit is used in a data processing system where analog signals are transformed into digital signals, a difference between a signal which will be transformed, and a processed reference signal is read, and the result is available as an output.
- FIG. 1 illustrates a circuit diagram of a circuit for sampling and holding a conventional pseudo differential input.
- the conventional circuit includes an input buffer 110 for transmitting a pseudo differential input (Vin and Vref) to a flip-flop 120 which is a next stage; a flip-flop 120 for sampling and holding an output signal of the input buffer 110 ; and an output portion 130 that converts an output signal of the flip-flop 120 to a logic level.
- Vin and Vref pseudo differential input
- the input buffer 110 includes a pull-up current source; 2 PMOS transistors (M 1 and M 2 ); a pull-down current source, an NMOS transistor (M 5 ); and a differential input portion, NMOS transistors (M 3 and M 4 ).
- the flip-flop 120 includes NMOS transistors (M 10 and M 11 ) for receiving the two output signals from the input buffer, PMOS transistors (M 6 and M 7 ) and NMOS transistors (M 8 and M 9 ) for sampling and holding signals fed into the two NMOS transistors (M 10 and M 11 ), an NMOS transistor (M 12 ) for keeping sampling and holding in synchronization with a clock signal (Clk), and a switch (Sw) operated by an inverted clock signal (Clkb).
- NMOS transistors M 10 and M 11
- PMOS transistors M 6 and M 7
- NMOS transistors M 8 and M 9
- the output portion 130 includes two inverters (Inv 1 and Inv 2 ), PMOS transistors (M 13 , M 14 , M 15 and M 16 ) and NMOS transistors (M 17 , M 18 , M 19 and M 20 ) for enlarging a swing width of output signals (out and outb) as much as possible.
- the conventional input buffer circuit 110 described in FIG. 1 has at least one significant disadvantage. Specifically, the difference between an input signal (Vin) and a reference signal (Vref) is not large, or if there are frequent changes during one period of a clock signal (Clk), output node voltages 11 and 12 of the input buffer circuit 110 may vary.
- an input buffer circuit including a pull-up current source for sourcing an electric current, two pull-down current sources for sinking the sourcing electric current, a differential input portion for receiving differential input signals, and a positive feedback portion for enlarging the differential output voltage.
- the pull-up current source is formed of two PMOS transistors, the gates of which are connected to a low voltage power supply (Vss), so that an “on” state is always maintained and an electric current is provided to the differential input portion. It is preferable to make the size of the two transistors in the pull-up current source the same and provide the same amount of electric current to each of two output terminals.
- the first pull-down current source and the second pull-down current source are each formed of one NMOS transistor.
- the gates of the first and second pull down current sources are connected to an external applied power source, a bias voltage, in order to sink an electric current from the pull-up current source in a saturation region.
- the first pull-down current source and the second pull-down current source sink an electric current flowing from the two PMOS transistors which form the pull-up current source.
- the differential input portion is formed of two NMOS transistors, and receives an input signal (Vin) and a reference signal (Vref).
- An electric current corresponding to the voltage of the two received signals flows from the pull-up current source to the two output terminals of the input buffer circuit, and the amount of the electric current is indicated as a voltage of the respective output terminals.
- the positive feedback portion is formed of two NMOS transistors, and when there is a voltage drop across the two output terminals of the input buffer circuit in response to the two input signals (Vin and Vref) applied to the differential input portion, a voltage drop between the two output terminals is enlarged using positive feedback.
- FIG. 1 illustrates a circuit diagram of a differential comparator with a built-in conventional input buffer circuit according to the prior art
- FIG. 2 illustrates a circuit diagram of an input buffer circuit according to a preferred embodiment of the present invention.
- an input buffer circuit includes a pull-up current source 210 , two pull-down current sources 220 and 221 , a differential input portion 230 , and a positive feedback portion 240 .
- the pull-up current source 210 is formed of two PMOS transistors (M 21 and M 22 ), the gates of which are connected to a low voltage power supply (Vss), that is a ground voltage, so that an “on” state is always maintained for the pull-up current source.
- the pull-up current source 210 provides an electric current to the NMOS transistors (M 23 and M 24 ) of the differential input portion 230 , and the NMOS transistors (M 26 and M 27 ) of the positive feedback portion 240 . It is preferable to make the sizes of the two transistors (M 21 and M 22 ) the same, so as to provide the same amount of electric current to each of the two output terminals 21 and 22 .
- the first pull-down current source 220 and the second pull-down current source 221 are formed of NMOS transistors M 25 and M 28 , respectively. Gates of the NMOS transistors M 25 and M 28 are all connected to an external applied voltage, a bias voltage, so that an electric current is sunk from the pull-up current source 210 in a saturation region.
- the first pull-down current source 220 and the second pull-down current source 221 sink an electric current flowing from the two PMOS transistors M 21 and M 22 which form the pull-up current source 210 .
- the differential input portion 230 is formed of two NMOS transistors (M 23 and M 24 ), and an input signal (Vin) is received at the gate of the NMOS transistor (M 23 ), and a reference signal (Vref) is received at the gate of the NMOS transistor (M 24 ).
- An electric current corresponding to the received two signals flows from the pull-up current source 210 to the two output nodes 21 and 22 , and the amount of electric current is indicated as a voltage of the output nodes 21 and 22 , respectively.
- the positive feedback portion 240 is formed of two NMOS transistors (M 26 and M 27 ), and enlarges a voltage drop between the two output nodes 21 and 22 using positive feedback when there is a voltage drop across the two output nodes 21 and 22 in response to the two input signals (Vin and Vref) applied to the differential input portion 230 .
- an input signal (Vin) is applied to the NMOS transistor (M 23 ), and a reference signal (Vref) is applied to the other NMOS transistor (M 24 ), an electric current flows in each of the output nodes 21 and 22 , and voltage drop occurs in response to voltages of the two signals (Vin and Vref).
- the output node voltages 21 , 22 of FIG. 2 correspond to the output node voltages 11 and 12 of FIG. 1, respectively.
- the first output node voltage 21 provides positive feedback to the gate of the NMOS transistor (M 27 ), and the second output node voltage 22 provides positive feedback, so that a difference between the voltage of the first output node 21 and the voltage of the second output node 22 becomes larger.
- an electric current flowing in the first output node 21 must be more than a current flowing in the second output node 22 , so that the voltage at the first output node 21 is less than that at the second output node 22 . Since the first output node 21 is connected to a gate of the NMOS transistor (M 27 ), and the second output node 22 is connected to a gate of the NMOS transistor (M 26 ), the NMOS transistor (M 26 ) further lowers a voltage of the first output node 21 , and on the contrary, the NMOS transistor (M 27 ) still further raises the voltage of the second output node 22 . The voltage difference between the two output terminals becomes larger due to positive feedback.
- the input buffer circuit according to an embodiment of the present invention has an advantage in that it can stabilize output signals by internally transforming the input signals into full differential signals even though the difference between voltages of the two input signals is minute.
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Nonlinear Science (AREA)
- Logic Circuits (AREA)
- Amplifiers (AREA)
- Manipulation Of Pulses (AREA)
Abstract
Description
- 1. Field of the Invention
- The present invention relates to a semiconductor integrated circuit. More particularly, the present invention relates to an input buffer circuit employed for a memory or a data processing system.
- 2. Description of the Related Art
- An input buffer circuit forms an input portion of a differential comparator, and the differential comparator has the functions of sampling a difference between two input signals during a specific clock period, and storing/transmitting the difference value. If the input buffer circuit of the differential comparator is used for a memory, the input signals are from a flash cell and a reference cell, and the output signals are fed to a differential input latch, which is a next stage. If the input buffer circuit is used in a data processing system where analog signals are transformed into digital signals, a difference between a signal which will be transformed, and a processed reference signal is read, and the result is available as an output.
- FIG. 1 illustrates a circuit diagram of a circuit for sampling and holding a conventional pseudo differential input. Referring to FIG. 1, the conventional circuit includes an
input buffer 110 for transmitting a pseudo differential input (Vin and Vref) to a flip-flop 120 which is a next stage; a flip-flop 120 for sampling and holding an output signal of theinput buffer 110; and anoutput portion 130 that converts an output signal of the flip-flop 120 to a logic level. - The
input buffer 110 includes a pull-up current source; 2 PMOS transistors (M1 and M2); a pull-down current source, an NMOS transistor (M5); and a differential input portion, NMOS transistors (M3 and M4). - The flip-
flop 120 includes NMOS transistors (M10 and M11) for receiving the two output signals from the input buffer, PMOS transistors (M6 and M7) and NMOS transistors (M8 and M9) for sampling and holding signals fed into the two NMOS transistors (M10 and M11), an NMOS transistor (M12) for keeping sampling and holding in synchronization with a clock signal (Clk), and a switch (Sw) operated by an inverted clock signal (Clkb). - The
output portion 130 includes two inverters (Inv1 and Inv2), PMOS transistors (M13, M14, M15 and M16) and NMOS transistors (M17, M18, M19 and M20) for enlarging a swing width of output signals (out and outb) as much as possible. - However, the conventional
input buffer circuit 110 described in FIG. 1 has at least one significant disadvantage. Specifically, the difference between an input signal (Vin) and a reference signal (Vref) is not large, or if there are frequent changes during one period of a clock signal (Clk), 11 and 12 of theoutput node voltages input buffer circuit 110 may vary. - To solve the above problems, it is a feature of an embodiment of the present invention to provide an input buffer circuit which transforms pseudo differential input signals into full differential output signals.
- Accordingly, to provide the above feature, there is provided an input buffer circuit including a pull-up current source for sourcing an electric current, two pull-down current sources for sinking the sourcing electric current, a differential input portion for receiving differential input signals, and a positive feedback portion for enlarging the differential output voltage.
- The pull-up current source is formed of two PMOS transistors, the gates of which are connected to a low voltage power supply (Vss), so that an “on” state is always maintained and an electric current is provided to the differential input portion. It is preferable to make the size of the two transistors in the pull-up current source the same and provide the same amount of electric current to each of two output terminals.
- The first pull-down current source and the second pull-down current source are each formed of one NMOS transistor. The gates of the first and second pull down current sources are connected to an external applied power source, a bias voltage, in order to sink an electric current from the pull-up current source in a saturation region. The first pull-down current source and the second pull-down current source sink an electric current flowing from the two PMOS transistors which form the pull-up current source.
- The differential input portion is formed of two NMOS transistors, and receives an input signal (Vin) and a reference signal (Vref). An electric current corresponding to the voltage of the two received signals flows from the pull-up current source to the two output terminals of the input buffer circuit, and the amount of the electric current is indicated as a voltage of the respective output terminals.
- The positive feedback portion is formed of two NMOS transistors, and when there is a voltage drop across the two output terminals of the input buffer circuit in response to the two input signals (Vin and Vref) applied to the differential input portion, a voltage drop between the two output terminals is enlarged using positive feedback.
- These and other features of the present invention will be readily apparent to those of ordinary skill in the art upon review of the detailed description that follows.
- The above features and advantages of the present invention will become more apparent by describing in detail a preferred embodiment thereof with reference to the attached drawings in which:
- FIG. 1 illustrates a circuit diagram of a differential comparator with a built-in conventional input buffer circuit according to the prior art; and
- FIG. 2 illustrates a circuit diagram of an input buffer circuit according to a preferred embodiment of the present invention.
- Korean Patent Application No. 00-47814, filed Aug. 18, 2000, and entitled: “Input Buffer Circuit for Transforming Pseudo Differential Signals into Full Differential Signals,” is incorporated by reference herein in its entirety.
- The present invention now will be described more fully with reference to the accompanying drawings, in which preferred embodiments of the present invention are shown. The same reference numerals in different drawings represent the same element, and thus their description will be omitted.
- Referring to FIG. 2, an input buffer circuit according to an embodiment of the present invention includes a pull-up
current source 210, two pull-down 220 and 221, acurrent sources differential input portion 230, and apositive feedback portion 240. - The pull-up
current source 210 is formed of two PMOS transistors (M21 and M22), the gates of which are connected to a low voltage power supply (Vss), that is a ground voltage, so that an “on” state is always maintained for the pull-up current source. The pull-upcurrent source 210 provides an electric current to the NMOS transistors (M23 and M24) of thedifferential input portion 230, and the NMOS transistors (M26 and M27) of thepositive feedback portion 240. It is preferable to make the sizes of the two transistors (M21 and M22) the same, so as to provide the same amount of electric current to each of the two 21 and 22.output terminals - The first pull-down
current source 220 and the second pull-downcurrent source 221 are formed of NMOS transistors M25 and M28, respectively. Gates of the NMOS transistors M25 and M28 are all connected to an external applied voltage, a bias voltage, so that an electric current is sunk from the pull-upcurrent source 210 in a saturation region. The first pull-downcurrent source 220 and the second pull-downcurrent source 221 sink an electric current flowing from the two PMOS transistors M21 and M22 which form the pull-upcurrent source 210. - The
differential input portion 230 is formed of two NMOS transistors (M23 and M24), and an input signal (Vin) is received at the gate of the NMOS transistor (M23), and a reference signal (Vref) is received at the gate of the NMOS transistor (M24). An electric current corresponding to the received two signals flows from the pull-upcurrent source 210 to the two 21 and 22, and the amount of electric current is indicated as a voltage of theoutput nodes 21 and 22, respectively.output nodes - The
positive feedback portion 240 is formed of two NMOS transistors (M26 and M27), and enlarges a voltage drop between the two 21 and 22 using positive feedback when there is a voltage drop across the twooutput nodes 21 and 22 in response to the two input signals (Vin and Vref) applied to theoutput nodes differential input portion 230. - Hereinafter, an input buffer circuit according to a preferred embodiment of the present invention will be described more fully with reference to FIG. 2. Here, it is assumed that the PMOS transistor (M 21) and the PMOS transistor (M22) have the same size, the NMOS transistor (M25) and the NMOS transistor (M28) have the same size, the NMOS transistor (M23) and the NMOS transistor (M24) have the same size, and the NMOS transistor (M26) and the NMOS transistor (M27) have the same size.
- If an input signal (Vin) is applied to the NMOS transistor (M 23), and a reference signal (Vref) is applied to the other NMOS transistor (M24), an electric current flows in each of the
21 and 22, and voltage drop occurs in response to voltages of the two signals (Vin and Vref). Here, theoutput nodes 21, 22 of FIG. 2 correspond to theoutput node voltages 11 and 12 of FIG. 1, respectively. The firstoutput node voltages output node voltage 21 provides positive feedback to the gate of the NMOS transistor (M27), and the secondoutput node voltage 22 provides positive feedback, so that a difference between the voltage of thefirst output node 21 and the voltage of thesecond output node 22 becomes larger. - For example, if an input signal (Vin) which is relatively larger than a reference signal (Vref) is applied, an electric current flowing in the
first output node 21 must be more than a current flowing in thesecond output node 22, so that the voltage at thefirst output node 21 is less than that at thesecond output node 22. Since thefirst output node 21 is connected to a gate of the NMOS transistor (M27), and thesecond output node 22 is connected to a gate of the NMOS transistor (M26), the NMOS transistor (M26) further lowers a voltage of thefirst output node 21, and on the contrary, the NMOS transistor (M27) still further raises the voltage of thesecond output node 22. The voltage difference between the two output terminals becomes larger due to positive feedback. - As described above, in the input buffer circuit according to an embodiment of the present invention, even though the voltage difference of two input signals is minute, the corresponding voltage difference between the two
21 and 22 of the input buffer circuit is large, so that a recognition error of the signals in the next step can be prevented.output nodes - As described above, the input buffer circuit according to an embodiment of the present invention has an advantage in that it can stabilize output signals by internally transforming the input signals into full differential signals even though the difference between voltages of the two input signals is minute.
- While the present invention has been particularly described with reference to preferred embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (8)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2000-47814 | 2000-08-18 | ||
| KR10-2000-0047814A KR100389915B1 (en) | 2000-08-18 | 2000-08-18 | Input buffer circuit for transforming pseudo differential signals into full differential signals |
| KR00-47814 | 2000-08-18 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20020021149A1 true US20020021149A1 (en) | 2002-02-21 |
| US6456122B1 US6456122B1 (en) | 2002-09-24 |
Family
ID=19683777
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US09/899,223 Expired - Lifetime US6456122B1 (en) | 2000-08-18 | 2001-07-06 | Input buffer circuit for transforming pseudo differential signals into full differential signals |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6456122B1 (en) |
| KR (1) | KR100389915B1 (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040042270A1 (en) * | 2002-08-29 | 2004-03-04 | Macronix International Co., Ltd. | Programming a flash memory cell |
| US20070097752A1 (en) * | 2005-11-02 | 2007-05-03 | Micron Technology, Inc. | High speed digital signal input buffer and method using pulsed positive feedback |
| US20150293156A1 (en) * | 2014-04-11 | 2015-10-15 | Himax Technologies Limited | Voltage sensing circuit |
| US9882565B2 (en) | 2015-08-13 | 2018-01-30 | Samsung Electronics Co., Ltd. | Buffer circuit and electric system including the same |
| CN114400039A (en) * | 2022-01-14 | 2022-04-26 | 成都博尔微晶科技有限公司 | A voltage monitoring circuit with hysteresis characteristics |
| CN117220680A (en) * | 2023-08-24 | 2023-12-12 | 贵州振华风光半导体股份有限公司 | Sample hold circuit and analog-to-digital converter |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10340437B3 (en) * | 2003-09-02 | 2005-05-04 | Infineon Technologies Ag | Signal comparison circuit device for testing read-only memory cells with comparator circuit and output circuit using 4 controlled current paths |
| US7598788B2 (en) * | 2005-09-06 | 2009-10-06 | Broadcom Corporation | Current-controlled CMOS (C3MOS) fully differential integrated delay cell with variable delay and high bandwidth |
| KR100979384B1 (en) * | 2008-03-31 | 2010-08-31 | 한양대학교 산학협력단 | Analog buffer circuit |
| WO2010129873A2 (en) * | 2009-05-07 | 2010-11-11 | Rambus Inc. | Drive supporting multiple signaling modes |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5526314A (en) * | 1994-12-09 | 1996-06-11 | International Business Machines Corporation | Two mode sense amplifier with latch |
| JPH08335860A (en) * | 1995-06-08 | 1996-12-17 | Mitsubishi Electric Corp | Differential latch circuit |
| KR100200079B1 (en) * | 1996-11-13 | 1999-06-15 | 윤종용 | Sensing Amplifier Circuit of Semiconductor Memory Device |
| JP3488612B2 (en) * | 1997-12-11 | 2004-01-19 | 株式会社東芝 | Sense amplifier circuit |
-
2000
- 2000-08-18 KR KR10-2000-0047814A patent/KR100389915B1/en not_active Expired - Fee Related
-
2001
- 2001-07-06 US US09/899,223 patent/US6456122B1/en not_active Expired - Lifetime
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040042270A1 (en) * | 2002-08-29 | 2004-03-04 | Macronix International Co., Ltd. | Programming a flash memory cell |
| US6760257B2 (en) * | 2002-08-29 | 2004-07-06 | Macronix International Co., Ltd. | Programming a flash memory cell |
| US20070097752A1 (en) * | 2005-11-02 | 2007-05-03 | Micron Technology, Inc. | High speed digital signal input buffer and method using pulsed positive feedback |
| US7512019B2 (en) | 2005-11-02 | 2009-03-31 | Micron Technology, Inc. | High speed digital signal input buffer and method using pulsed positive feedback |
| US20150293156A1 (en) * | 2014-04-11 | 2015-10-15 | Himax Technologies Limited | Voltage sensing circuit |
| US9383391B2 (en) * | 2014-04-11 | 2016-07-05 | Himax Technologies Limited | Voltage sensing circuit |
| US9882565B2 (en) | 2015-08-13 | 2018-01-30 | Samsung Electronics Co., Ltd. | Buffer circuit and electric system including the same |
| CN114400039A (en) * | 2022-01-14 | 2022-04-26 | 成都博尔微晶科技有限公司 | A voltage monitoring circuit with hysteresis characteristics |
| CN117220680A (en) * | 2023-08-24 | 2023-12-12 | 贵州振华风光半导体股份有限公司 | Sample hold circuit and analog-to-digital converter |
Also Published As
| Publication number | Publication date |
|---|---|
| US6456122B1 (en) | 2002-09-24 |
| KR20020014491A (en) | 2002-02-25 |
| KR100389915B1 (en) | 2003-07-04 |
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