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Ultimate Limits of Fabrication and Measurement

  • Book
  • © 1995

Overview

Part of the book series: NATO Science Series E: (NSSE, volume 292)

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About this book

An extensive body of research is involved in pushing miniaturisation to its physical limit, encompassing the miniaturisation of electronic devices, the manipulation of single atoms by scanning tunnelling microscopy, bio-engineering, the chemical synthesis of complex molecules, microsensor technology, and information storage and retrieval. In parallel to these practical aspects of miniaturisation there is also the necessity to understand the physics of small structures.
Ultimate Limits of Fabrication and Measurement brings together a number of leading articles from a variety of fields with the common aim of ultimate miniaturisation and measurement.

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Table of contents (35 chapters)

  1. Towards Molecular and Supramolecular Devices

  2. Nanoscale Fabrication

  3. Microminiaturization in Laser Surgery and in vivo Intradiscal Pressure Measurement in Intervertebral Discs

  4. Self Replicating Systems and Low Cost Manufacturing

  5. The Use of Actuation Principles for Micro Robots

  6. Biophysical Approach to Nano-Mental Engineering’s Limits

  7. IDEAS -Intelligent Design Environment for Algorithms and Systems

  8. Electron-Nucleus Interaction in a Finite Atomic Line Modulated by a Focussed Electric Field

  9. Electromagnetic Radiation in Nanostructures

  10. Using Atom Optics to Fabricate Nanostructures

  11. Limits to Squeezing of Quantum Fluctuations

  12. Micromechanical Calorimeter with Picojoule-Sensitivity

  13. The Point-Contact Thermometer and Its Application in the Study of Hydrodynamic Electron Flow

  14. Noise in Scanning Tunneling Microscopy

  15. A Nanosensor for Admittance Spectroscopy

  16. Nanodeformation -Solid or Liquid?

  17. Theory of Conduction through Quantum Necks

  18. A Scanning Force and Friction Microscope

  19. Electrical Properties of Nanometer-Size Metal-Semiconductor Point Contacts

Editors and Affiliations

  • Department of Engineering, The University of Cambridge, Cambridge, UK

    M. E. Welland

  • IBM Research Division, Zurich Research Laboratory, Rüschlikon, Switzerland

    J. K. Gimzewski

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