Overview
- This book summarizes the current knowledge of radiation defects in semiconductors
- It will be a useful reference work for scientists involved in semiconductor processing.- This book is important for space applications of semiconductors and solar cells.- It provides information on the application of sensors in nuclear power plants.
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 57)
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About this book
In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments.
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Table of contents (9 chapters)
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Front Matter
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Back Matter
Authors and Affiliations
Accessibility Information
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Bibliographic Information
Book Title: Radiation Effects in Advanced Semiconductor Materials and Devices
Authors: Cor Claeys, Eddy Simoen
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-3-662-04974-7
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2002
Hardcover ISBN: 978-3-540-43393-4Published: 21 August 2002
Softcover ISBN: 978-3-642-07778-4Published: 01 December 2010
eBook ISBN: 978-3-662-04974-7Published: 11 November 2013
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XXII, 404
Topics: Crystallography and Scattering Methods, Energy Policy, Economics and Management, Classical Electrodynamics, Characterization and Evaluation of Materials, Optical and Electronic Materials, Surfaces and Interfaces, Thin Films