Overview
- 17th International Symposium on VLSI Design and Test, VDAT 2013
Part of the book series: Communications in Computer and Information Science (CCIS, volume 382)
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About this book
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
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Table of contents (44 papers)
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Front Matter
Editors and Affiliations
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Bibliographic Information
Book Title: VLSI Design and Test
Book Subtitle: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Editors: Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Sing, Adit D. Sing
Series Title: Communications in Computer and Information Science
DOI: https://doi.org/10.1007/978-3-642-42024-5
Publisher: Springer Berlin, Heidelberg
eBook Packages: Computer Science, Computer Science (R0), Springer Nature Proceedings Computer Science
Copyright Information: Springer-Verlag Berlin Heidelberg 2013
Softcover ISBN: 978-3-642-42023-8Published: 10 December 2013
eBook ISBN: 978-3-642-42024-5Published: 13 December 2013
Series ISSN: 1865-0929
Series E-ISSN: 1865-0937
Edition Number: 1
Number of Pages: XVI, 388
Number of Illustrations: 246 b/w illustrations
Topics: Computer Hardware, Processor Architectures, Computer Communication Networks